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1. 发明申请

US20090160473A1 CONTACTOR FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING THE SAME, AND METHOD FOR MANUFACTURING CONTACTOR 有权
标题翻译：用于电气测试的接触器，使用该电气测试的电气连接装置以及制造接触器的方法
公开(公告)号：US20090160473A1
公开(公告)日：2009-06-25
申请号：US12339883
申请日：2008-12-19
申请人： Yoshiyuki FUKAMI , Kazuya Numajiri , Osamu Arai , Hideki Hirakawa
发明人： Yoshiyuki FUKAMI , Kazuya Numajiri , Osamu Arai , Hideki Hirakawa
IPC分类号： G01R1/067 , G01R3/00
CPC分类号： G01R1/06727 , Y10T29/49204
摘要： An electrical test contactor comprises a contactor main body including a plate-shaped attachment portion extending in the up-down direction, a plate-shaped arm portion extending from the lower end portion of the attachment portion at least to one side in the right-left direction, and a plate-shaped pedestal portion projecting downward from the tip end portion of the arm portion, a contact portion projecting downward from the lower end of the pedestal portion and having the lower end of the contact portion acting as a probe tip, and a resistor having a higher resistance value than the contactor main body and the contact portion and arranged at the contactor main body so as to heighten the resistance value of the contactor.
摘要翻译：电测试接触器包括接触器主体，该接触器主体包括沿上下方向延伸的板状安装部分，从连接部分的下端部至少向左右一侧延伸的板状臂部方向，以及从臂部的前端部向下方突出的板状的台座部，从基座部的下端向下方突出并具有作为探针头的接触部的下端的接触部，以及电阻器具有比接触器主体和接触部分高的电阻值，并且布置在接触器主体上，以便提高接触器的电阻值。

2. 发明申请

US20090128175A1 PROBE UNIT SUBSTRATE 有权
标题翻译：探测单元基板
公开(公告)号：US20090128175A1
公开(公告)日：2009-05-21
申请号：US12353813
申请日：2009-01-14
申请人： Yoshiyuki FUKAMI
发明人： Yoshiyuki FUKAMI
IPC分类号： G01R1/067
CPC分类号： G01R1/0735 , G01R1/06727
摘要： A ceramic substrate has, on its surface, a multilayer wiring division, on which micro cantilever type probes are fixed. The multilayer wiring division has the first conductor layer, which includes through-hole junction pads, flatness improvement rings surrounding the through-hole junction pads and a grounding region further surrounding the flatness improvement rings. Since the flatness improvement rings are located around the through-hole junction pads, the surface of the first insulating layer, which is located above the first conductor layer, is free from severe undulation even near the through-hole junction pads. Accordingly, the multilayer wiring division has less irregularity in shape as a whole, and thus the probe mounting pads on the surface of the second insulating layer do not slope but keep almost horizontal. The probe unit substrate according to the invention has an advantage of less surface undulation and having non-sloping probe mounting pads without using a complicated manufacturing process.
摘要翻译：陶瓷基板在其表面上具有固定有微悬臂型探针的多层布线部。多层布线部分具有第一导体层，其包括通孔连接垫，围绕通孔结垫的平坦度改善环和进一步围绕平坦度改进环的接地区。由于平坦度改善环位于通孔结垫周围，所以位于第一导体层之上的第一绝缘层的表面即使在通孔结垫附近也没有严重的起伏。因此，多层布线部的整体形状不均匀性较差，因此第二绝缘层表面上的探针安装焊盘不倾斜但保持几乎水平。根据本发明的探针单元基板具有表面波动较小的优点，并且不使用复杂的制造工艺而具有非倾斜的探针安装垫。

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