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91. 发明申请

US20140347084A1 LOW OVERDRIVE PROBES WITH HIGH OVERDRIVE SUBSTRATE 有权
标题翻译：具有高过渡基板的低过载探头
公开(公告)号：US20140347084A1
公开(公告)日：2014-11-27
申请号：US13899458
申请日：2013-05-21
申请人： Advantest Corporation
发明人： Ting HU , Lakshmikanth NAMBURI
IPC分类号： G01R1/073 , G01R31/26
CPC分类号： G01R31/2891
摘要： A method for testing a semiconductor device is disclosed. The method comprises positioning a probe card comprising a plurality of probes above the semiconductor device and moving the probe card in a vertical direction towards the semiconductor device. The plurality of probes are moving in a vertical direction towards a plurality of electrical structures of the semiconductor device until each probe of the plurality of probes has made mechanical contact with a corresponding electrical structure of the plurality of electrical structures with a minimum quantity of force. The each probe of the plurality of probes absorbs a portion of vertical overdrive after contacting their corresponding electrical structures. The probe card absorbs any remaining vertical overdrive. The vertical overdrive is a continuing vertical movement of the plurality of probes after a first probe of the plurality of probes mechanically contacts a first corresponding electrical structure.
摘要翻译：公开了一种用于测试半导体器件的方法。该方法包括将包括多个探针的探针卡定位在半导体器件上方并将探针卡沿垂直方向移向半导体器件。多个探针在垂直方向上朝向半导体器件的多个电结构移动，直到多个探针的每个探针以最小的力量与多个电气结构的对应的电气结构机械接触。多个探针的每个探针在接触其相应的电气结构之后吸收垂直过驱动的一部分。探针卡吸收任何剩余的垂直过载。在多个探针的第一探针机械地接触第一对应的电结构之后，垂直过驱动是多个探针的持续垂直运动。

92. 发明授权

US08890559B2 Connector and interface apparatus comprising connector 有权
标题翻译：连接器和接口装置包括连接器
公开(公告)号：US08890559B2
公开(公告)日：2014-11-18
申请号：US13272554
申请日：2011-10-13
申请人： Yuichiro Iwamoto , Takayuki Nakamura
发明人： Yuichiro Iwamoto , Takayuki Nakamura
IPC分类号： H01R13/66 , H04B3/30 , G01R1/04
CPC分类号： G01R1/0416 , H01R13/6633 , H04B3/30
摘要： [Problems] In a connector to which unbalanced-type lines are connected, providing a connector which prevents crosstalk in the connector and an interface apparatus including the connector.[Solutions] Comprising terminals to be connected with connectors, a plurality of boards having a plurality of transmission lines, one ends of the transmission lines being connected with the terminals, a housing for fixing the plurality of boards, and common mode choke coils provided on the boards and connected with balanced-type lines.
摘要翻译： [问题]在连接不平衡型线路的连接器中，提供防止连接器串扰的连接器和包括连接器的接口装置。 [解决方案]包括与连接器连接的端子，具有多条传输线的多个板，传输线的一端与端子连接，用于固定多个板的壳体和设置在其上的共模扼流线圈电路板与平衡线连接。

93. 发明授权

US08866492B2 Manufacturing method, switching apparatus, transmission line switching apparatus, and test apparatus 有权
标题翻译：制造方法，开关装置，传输线开关装置和试验装置
公开(公告)号：US08866492B2
公开(公告)日：2014-10-21
申请号：US13277235
申请日：2011-10-20
申请人： Hisao Hori , Yoshikazu Abe , Yoshihiro Sato
发明人： Hisao Hori , Yoshikazu Abe , Yoshihiro Sato
IPC分类号： G01R27/28 , H01L41/318 , H01L41/335 , H01H57/00 , G01R31/28 , H01L41/08 , H01L41/187 , H01L41/319 , H01L41/29
CPC分类号： H01L41/318 , G01R31/2889 , H01H57/00 , H01H2057/006 , H01L41/0805 , H01L41/1876 , H01L41/29 , H01L41/319 , H01L41/335 , Y10T307/747
摘要： An actuator is manufactured that includes piezoelectric film that does not suffer physical damage. Provided is a manufacturing method comprising first insulating layer deposition of depositing a first insulating layer on a substrate using an insulating material; first annealing of annealing the first insulating layer; first electrode layer deposition of depositing a first electrode layer on the first insulating layer using a conductive material; first piezoelectric film deposition of depositing a first piezoelectric film on the first electrode layer by applying a sol-gel material on the first electrode layer and annealing the sol-gel material; second electrode layer deposition of depositing a second electrode layer on the first piezoelectric film using a conductive material; second insulating layer deposition of depositing a second insulating layer on the second electrode layer using an insulating material; and second annealing of annealing the second insulating layer.
摘要翻译：制造的致动器包括不遭受物理损坏的压电膜。提供一种制造方法，包括：使用绝缘材料在基板上沉积第一绝缘层的第一绝缘层沉积; 第一绝缘层退火的第一退火; 使用导电材料在第一绝缘层上沉积第一电极层的第一电极层沉积; 第一压电膜沉积，通过在第一电极层上施加溶胶凝胶材料并使溶胶 - 凝胶材料退火，在第一电极层上沉积第一压电膜; 使用导电材料在第一压电膜上沉积第二电极层的第二电极层沉积; 使用绝缘材料在所述第二电极层上沉积第二绝缘层的第二绝缘层沉积; 以及对所述第二绝缘层退火的第二退火。

94. 发明授权

US08860454B2 Connector and semiconductor testing device including the connector 有权
标题翻译：连接器和半导体测试装置包括连接器
公开(公告)号：US08860454B2
公开(公告)日：2014-10-14
申请号：US13378009
申请日：2010-06-30
申请人： Kyoko Oniyama , Akinori Mizumura , Shin Sakiyama , Hiroyuki Hama , Hiromitsu Takasu
发明人： Kyoko Oniyama , Akinori Mizumura , Shin Sakiyama , Hiroyuki Hama , Hiromitsu Takasu
IPC分类号： G01R31/26 , H01R13/20 , H01R107/00 , G01R1/04 , H01R24/60 , H01R31/06
CPC分类号： H01R13/20 , G01R1/0416 , H01R24/60 , H01R31/06 , H01R2107/00 , H01R2201/20
摘要： A connector includes a first terminal. The first terminal includes a movable portion, and the movable portion has, on its tip side, a contact portion located on a course C of a case assembly. Further, the first terminal includes a fixed portion restricted from moving and located on a base side of the movable portion. The movable portion is elastically deformable to incline toward a side surface of an insertion hole while using the fixed portion as a fixed point. Further, the movable portion includes a hit portion between the contact portion and the fixed portion. The hit portion is located apart from the side surface of the insertion hole, and the hit portion is provided capable of hitting, midway during inclining of the movable portion toward the side surface of the insertion hole, against the side surface of the insertion hole.
摘要翻译：连接器包括第一端子。第一端子包括可移动部分，并且可动部分在其尖端侧具有位于壳体组件的线圈C上的接触部分。此外，第一端子包括限制移动并定位在可动部分的基部侧上的固定部分。可移动部分在使用固定部分作为固定点时可弹性变形以向插入孔的侧表面倾斜。此外，可动部分包括在接触部分和固定部分之间的击打部分。撞击部分与插入孔的侧表面分开，并且在可移动部分朝向插入孔的侧表面倾斜的同时，打击部分设置成能够抵抗插入孔的侧表面。

95. 发明授权

US08850907B2 Test carrier 有权
标题翻译：测试载体
公开(公告)号：US08850907B2
公开(公告)日：2014-10-07
申请号：US13103142
申请日：2011-05-09
申请人： Kiyoto Nakamura , Yoshinari Kogure
发明人： Kiyoto Nakamura , Yoshinari Kogure
IPC分类号： G01D21/00 , G01R1/04 , G01R31/00 , G01R31/20
CPC分类号： G01R1/0408
摘要： [Problem] A test carrier able to secure a high air-tightness is provided.[Solution] A test carrier 10 comprises a cover member 50A and a base member 20A which are bonded together while sandwiching a die 90 between them. ultraviolet rays can pass through the cover member 50A.
摘要翻译： [问题]提供了能够确保高气密性的测试载体。 [解决方案]测试托架10包括盖构件50A和基座构件20A，它们在它们之间夹住模具90时结合在一起。紫外线可以通过盖构件50A。

96. 发明授权

US08831903B2 Test apparatus, test method and system 有权
标题翻译：测试仪器，测试方法和系统
公开(公告)号：US08831903B2
公开(公告)日：2014-09-09
申请号：US12943815
申请日：2010-11-10
申请人： Hironaga Yamashita
发明人： Hironaga Yamashita
IPC分类号： G01R31/319 , G01R31/28 , G06F11/30 , G06F17/40 , G06F19/00
CPC分类号： G01R31/31907 , G01R31/2806 , G01R31/31903 , G06F11/3051 , G06F17/40 , G06F19/00
摘要： A test apparatus for testing a device under test includes a control apparatus, a plurality of test modules, and a plurality of relay apparatuses that connect the control apparatus and the plurality of test modules, each relay apparatus including (1) an upper port section connected either to the control apparatus or to a relay apparatus nearer the control apparatus; and (2) at least one lower port section connected either to a relay apparatus nearer the plurality of test modules or to a corresponding test module, where each relay apparatus receives, at one of the at least one lower port section, a packet transmitted from the corresponding test module to the control apparatus, and transmits, from the upper port section, the received packet after adding thereto port identification information of the one of the at least one lower port section.
摘要翻译：一种用于测试被测设备的测试装置，包括控制装置，多个测试模块和连接该控制装置与多个测试模块的多个中继装置，每个中继装置包括：（1）连接上端口部分或者到控制装置或靠近控制装置的中继装置; 以及（2）至少一个下端口部分，其连接到靠近所述多个测试模块的中继设备或相应的测试模块，其中每个中继设备在所述至少一个下端口部分中的一个接收从将对应的测试模块传送到控制装置，并且从上端口部分向所述至少一个下端口部分中的一个端口部分的端口标识信息添加之后发送所接收的分组。

97. 发明申请

US20140225450A1 WIRELESS POWER RECEIVER 有权
标题翻译：无线接收机
公开(公告)号：US20140225450A1
公开(公告)日：2014-08-14
申请号：US14255234
申请日：2014-04-17
申请人： ADVANTEST CORPORATION
发明人： Yuki ENDO , Yasuo Furukawa
IPC分类号： H02J5/00 , H01F38/14
CPC分类号： H02J50/12 , H01F38/14 , H02J5/005 , H02J7/025
摘要： An automatic tuning assist circuit is coupled in series with a transmission antenna. A first switch and a second switch are arranged in series between a first terminal and a second terminal of the automatic tuning assist circuit. Furthermore, a third switch and a fourth switch are arranged in series between the first terminal and the second terminal. A first auxiliary capacitor is arranged between a connection node that connects the first switch and the second switch and a connection node that connects the third switch and the fourth switch. A control unit switches the first switch through the fourth switch with the same frequency as that of the driving voltage, and with a predetermined phase difference with respect to the driving voltage.
摘要翻译：自动调谐辅助电路与发送天线串联耦合。第一开关和第二开关串联布置在自动调谐辅助电路的第一端子和第二端子之间。此外，在第一端子和第二端子之间串联布置第三开关和第四开关。在连接第一开关和第二开关的连接节点和连接第三开关和第四开关的连接节点之间布置有第一辅助电容器。控制单元以与驱动电压相同的频率和相对于驱动电压的预定相位差将第一开关切换到第四开关。

98. 发明授权

US08805634B2 Test apparatus and test method 有权
标题翻译：试验装置及试验方法
公开(公告)号：US08805634B2
公开(公告)日：2014-08-12
申请号：US12945731
申请日：2010-11-12
申请人： Kazumoto Tamura
发明人： Kazumoto Tamura
IPC分类号： G06F19/00 , G01R31/02 , G01R31/319 , G06F11/273
CPC分类号： G01R31/31907 , G01R31/2834 , G01R31/2851 , G01R31/319 , G01R31/31919 , G01R31/31926 , G06F11/273 , G06F11/2733 , G06F11/277 , H04L43/50
摘要： A test apparatus that tests a device under test, including a control apparatus that controls testing of the device under test, a test unit that sends and receives signals to and from the device under test, and a buffer section that buffers access requests transmitted from the control apparatus to the test unit and, prior to completion of a write request to a predetermined buffer control address from the control apparatus, issues previously buffered access requests to the test unit side.
摘要翻译：一种测试被测设备的测试设备，包括控制被测设备的测试的控制设备，向被测设备发送和接收信号的测试单元以及缓冲区段，其缓冲从被测设备发送的接入请求控制装置到测试单元，并且在完成对来自控制装置的预定缓冲器控制地址的写入请求之前向检测单元侧发出先前缓冲的访问请求。

99. 发明授权

US08779631B2 Switching circuit and test apparatus 有权
标题翻译：开关电路和测试装置
公开(公告)号：US08779631B2
公开(公告)日：2014-07-15
申请号：US13153466
申请日：2011-06-05
申请人： Hidenori Sakai
发明人： Hidenori Sakai
IPC分类号： H03K17/78 , G01R31/28 , G01R15/08
CPC分类号： G01R15/08 , G01R31/28 , H03K17/78 , Y10T307/76
摘要： Provided is a switching circuit with high withstand voltage. The switching circuit switches whether two terminals are electrically connected to each other, according to a switching signal input thereto. The switching circuit comprises a first switching section that switches whether the two terminals are electrically connected to each other; a first control section that is electrically insulated from the first switching section and controls the first switching section according to an input current; a second switching section that switches whether the input current is input to the first control section; and a second control section that is electrically insulated from the second switching section and controls the second switching section according to the switching signal.
摘要翻译：提供具有高耐压的开关电路。开关电路根据输入的开关信号，切换两端子是否电连接。开关电路包括：第一开关部分，用于切换两个端子是否彼此电连接; 第一控制部，其与所述第一开关部电绝缘，并根据输入电流控制所述第一开关部; 第二切换部，切换输入电流是否输入到第一控制部; 以及第二控制部，其与所述第二开关部电绝缘，并根据所述开关信号控制所述第二开关部。

100. 发明授权

US08773144B2 Avalanche breakdown test apparatus 有权
标题翻译：雪崩击穿试验装置
公开(公告)号：US08773144B2
公开(公告)日：2014-07-08
申请号：US13253971
申请日：2011-10-06
申请人： Kenji Hashimoto
发明人： Kenji Hashimoto
IPC分类号： G01R31/26 , G01R31/00
CPC分类号： G01R31/2637 , G01R31/261
摘要： To detect whether energy accumulated in an inductive load section has been discharged. Provided is a test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path between the power supply section and the device under test; a housing section that houses a substrate that includes at least the inductive load section; and a lock maintaining section that keeps an opening/closing section, which allows an operator to access the substrate within the housing section, in a locked state when a voltage at a predetermined position on the substrate is greater than a set voltage.
摘要翻译：检测在感性负载部分中累积的能量是否已经放电。提供了一种测试被测设备的测试设备，包括：电源部分，其产生要供应到被测设备的电源电压; 电感负载部分，设置在电源部分和被测器件之间的路径中; 容纳部分，其容纳至少包括感性负载部分的衬底; 以及锁定保持部，其在基板上的预定位置处的电压大于设定电压时，在锁定状态下保持开闭部，其允许操作者在壳体部内进入基板。

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