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    • 91. 发明授权
    • Projection exposure method and projection exposure system therefor
    • 投影曝光方法和投影曝光系统
    • US09110383B2
    • 2015-08-18
    • US13299062
    • 2011-11-17
    • Aksel Goehnermeier
    • Aksel Goehnermeier
    • G03B27/54G03B27/72G03F7/20
    • G03F7/70566G03F7/701G03F7/70141G03F7/70425G03F7/70433
    • The disclosure provides a projection exposure method for exposing a radiation-sensitive substrate with at least one image of a pattern of a mask. The mask has a first pattern area with a first subpattern, and at least one second pattern area, arranged laterally offset from the first pattern area, with a second subpattern. The first subpattern is irradiated during a first illumination time interval with a first angular distribution, adapted to the first subpattern, of the illumination radiation. Thereafter, the second subpattern is irradiated during the second illumination time interval with a second angular distribution, adapted to the second subpattern, of the illumination radiation, said second angular distribution differing from the first angular distribution.
    • 本公开提供了一种投影曝光方法,用于用掩模图案的至少一个图像曝光辐射敏感基板。 掩模具有带有第一子图案的第一图案区域和与第一图案区域横向错开布置的至少一个第二图案区域,具有第二子图案。 在第一照明时间间隔内照射第一子图案,其具有适于第一子图案的照明辐射的第一角度分布。 此后,第二子图案在第二照明时间间隔期间以适合于第二子图案的照明辐射的第二角度分布被照射,所述第二角度分布与第一角度分布不同。
    • 92. 发明授权
    • Solution to optical constraint on microtruss processing
    • 微桁架加工光学约束的解决方案
    • US09104111B2
    • 2015-08-11
    • US13669791
    • 2012-11-06
    • GM GLOBAL TECHNOLOGY OPERATIONS, INC.
    • Jeffrey A. Rock
    • G03B27/54G03F1/50G03F7/20G02B6/12
    • G03F1/50G02B2006/1219G03F7/201G03F7/2041
    • A system for fabricating a radiation-cured structure is provided. The system includes a radiation-sensitive material having a first refractive index; a mask formed from a mask material having a second refractive index; and a radiation source. The mask is disposed between the radiation source and the radiation-sensitive material, and has a plurality of substantially radiation transparent apertures. The radiation source is configured to generate radiation beams for at least one of initiating, polymerizing, and crosslinking the radiation-sensitive material. The system includes at least one of a) an at least one normalizing surface disposed between the radiation source and the mask, b) a refractive fluid having a third refractive index disposed between the radiation source and the mask, and c) the refractive fluid having the third refractive index disposed between the mask and the radiation-sensitive material. A method for fabricating the radiation-cured structure is also provided.
    • 提供了一种用于制造辐射固化结构的系统。 该系统包括具有第一折射率的辐射敏感材料; 由具有第二折射率的掩模材料形成的掩模; 和辐射源。 掩模设置在辐射源和辐射敏感材料之间,并且具有多个基本上辐射的透明孔。 辐射源被配置为产生用于使辐射敏感材料起始,聚合和交联中的至少一个的辐射束。 所述系统包括以下至少一个:a)设置在所述辐射源和所述掩模之间的至少一个归一化表面,b)具有设置在所述辐射源和所述掩模之间的具有第三折射率的折射流体,以及c)所述折射流体具有 设置在掩模和辐射敏感材料之间的第三折射率。 还提供了一种制造辐射固化结构的方法。
    • 93. 发明授权
    • Scanned-spot-array EUV lithography system
    • 扫描点阵EUV光刻系统
    • US09097983B2
    • 2015-08-04
    • US13801919
    • 2013-03-13
    • Kenneth C. Johnson
    • Kenneth C. Johnson
    • G03B27/54G03B27/42G03F7/20
    • G03F7/702G03F7/70208
    • In an EUV scanned-spot-array lithography system, a modulated array of radiation beams diverging from object spots on an object surface and is projected onto a printing surface via a two-mirror projection system similar to a flat-image, Schwarzschild system. Each beam converges to a diffraction-limited image point on the surface, and the surface is scanned in synchronization with the beam modulation to print a synthesized, high-resolution raster image. The spot-generation optics can be configured to compensate for object field curvature, distortion, and geometric point-imaging aberrations in the projection system, enabling diffraction-limited printing without coherent proximity effects over the full image field. The spot-generation optics can use either micromirrors or transmitting microlenses, and can be diffractive (e.g., phase-Fresnel lenses) or non-diffractive. Chromatic dispersion in either refractive or diffractive elements can be substantially eliminated by configuring the micro-optics as Schupmann achromatic doublets.
    • 在EUV扫描点阵阵列光刻系统中,辐射束的调制阵列从物体表面上的物体点发散,并通过类似于平面图像Schwarzschild系统的双镜像投影系统投影到打印表面上。 每个光束会聚到表面上的衍射受限图像点,并且与光束调制同步扫描表面以打印合成的高分辨率光栅图像。 斑点发生光学器件可以被配置为补偿投影系统中的物场曲率,失真和几何点成像像差,使得能够在全图像场上没有相干邻近效应的衍射极限打印。 斑点发生光学器件可以使用微镜或透射微透镜,并且可以是衍射的(例如,相位菲涅尔透镜)或非衍射。 折射或衍射元件中的色散可以基本上通过将微光学器件配置为舒普曼消色差双峰来消除。
    • 95. 发明授权
    • Metrology method and apparatus, and device manufacturing method
    • 计量方法和装置以及装置制造方法
    • US09069264B2
    • 2015-06-30
    • US13542319
    • 2012-07-05
    • Patrick WarnaarMark Van SchijndelMichael Kubis
    • Patrick WarnaarMark Van SchijndelMichael Kubis
    • G06K9/46G03F1/44G03F7/20G03B27/54
    • G03F7/70633G03F1/44G03F7/70683
    • A target structure including a periodic structure is formed on a substrate. An image of the target structure is detected while illuminating the target structure with a beam of radiation, the image being formed using a first part of non-zero order diffracted radiation while excluding zero order diffracted radiation. Intensity values extracted from a region of interest within the image are used to determine a property of the periodic structure. A processing unit recognizes locations of a plurality of boundary features in the image of the target structure to identify regions of interest. The number of boundary features in each direction is at least twice a number of boundaries of periodic structures within the target structure. The accuracy of locating the region is greater than by recognizing only the boundaries of the periodic structure(s).
    • 包括周期性结构的靶结构形成在基板上。 在用辐射束照射目标结构的同时检测目标结构的图像,该图像使用非零次衍射辐射的第一部分形成,同时排除零级衍射辐射。 使用从图像内的感兴趣区域提取的强度值来确定周期性结构的性质。 处理单元识别目标结构的图像中的多个边界特征的位置以识别感兴趣的区域。 每个方向上边界特征的数量至少是目标结构内周期性结构边界数量的两倍。 定位区域的精度大于仅识别周期性结构的边界。