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    • 1. 发明授权
    • Method for generating a control output for a position control loop
    • 用于产生位置控制回路的控制输出的方法
    • US07487069B2
    • 2009-02-03
    • US11862808
    • 2007-09-27
    • Sven VoglerRoland KaplanRobert WeikertRoelof Wijnaendts-Van-Resandt
    • Sven VoglerRoland KaplanRobert WeikertRoelof Wijnaendts-Van-Resandt
    • G05B19/18
    • G01D5/285G01D5/26G01D5/30
    • A method for optically detecting the position of a moveable test object (10), especially a mirror or reflector, in which a measuring beam (6) produced by a light source (2) is reflected by the test object (10 and reaches a position-sensitive light detector (12) which carrier out a conversion into information corresponding to the position of the test object (10). The invention enables the position of mirrors, especially rotating mirrors, to be quickly measured optically using a simple optical construction. The measuring beam (6) is focused onto the light detector (12) by an optical system (8). A signal corresponding to the geometric center or the maximum (I0) of the intensity distribution of the focused measuring spot is determined based on the measured values obtained by the light detector (12).
    • 一种用于光学检测可移动测试对象(10)的位置的方法,特别是其中由光源(2)产生的测量光束(6)被测试对象(10)反射到其中的位置 敏感光检测器(12),其将转换载体转换成与测试对象(10)的位置相对应的信息。本发明使得能够使用简单的光学构造来快速测量反射镜,特别是旋转镜的位置。 测量光束(6)通过光学系统(8)聚焦到光检测器(12)上,对应于聚焦测量点的强度分布的几何中心或最大值(I0)的信号基于测量 由光检测器(12)获得的值。
    • 3. 发明申请
    • METHOD AND ARRANGEMENT FOR DISPLACEMENT
    • 偏移的方法和布置
    • US20110007322A1
    • 2011-01-13
    • US12922040
    • 2009-03-10
    • Michael FangerauAlexander MangoldRoland Kaplan
    • Michael FangerauAlexander MangoldRoland Kaplan
    • G01B11/02G01B11/26
    • G03F7/70258G02B26/0875
    • A method and apparatus operable for displacing an image, which is transmitted by electromagnetic radiation, perpendicular to the direction of radiation by use of a rotatably disposed radiation-refracting body, located in the path of an imaging beam, having a refractive index that differs from the surrounding medium with regard to the radiation used. The method allows for precise image displacement. The rotation of the radiation-refracting body causing the displacement is measured, and the change of the optical path length caused by the angular change in a further electromagnetic beam utilized for the measurement is determined by evaluating the superimposition of the radiation reflected by a planar reflecting surface with the incident electromagnetic radiation. Part of the electromagnetic measurement beam, which is reflected on the surface of the radiation-refracting body, strikes a measurement unit, which supplies an electrical signal as a function of the incident position of the electromagnetic radiation.
    • 一种方法和装置,其可操作用于通过使用位于成像光束的路径中的可旋转设置的辐射折射体来移动通过电磁辐射垂直于辐射方向的图像,折射率不同于 关于所使用的辐射的周围介质。 该方法允许精确的图像位移。 测量引起位移的辐射折射体的旋转,并且通过用于测量的另外的电磁束中由角度变化引起的光程长度的变化通过评估由平面反射反射的辐射的叠加来确定 表面与入射电磁辐射。 在辐射折射体的表面上反射的电磁测量光束的一部分撞击测量单元,该测量单元提供作为电磁辐射的入射位置的函数的电信号。
    • 7. 发明申请
    • Method and device for imaging a mask onto a substrate
    • 用于将掩模成像到基底上的方法和装置
    • US20050122495A1
    • 2005-06-09
    • US10511226
    • 2003-04-11
    • Roland KaplanJuergen Sollner
    • Roland KaplanJuergen Sollner
    • G03F9/00G03F7/20G03B27/52
    • G03F7/70275G03F7/70258G03F7/70358G03F7/70791G03F7/70991
    • The invention relates to a method for imaging a mask (1) onto a substrate (2) by means of an illuminating unit (8) and an optical unit (9). The invention also relates to a device for carrying out the method. The aim of the invention is to create a method and a device which enable the mask (1) and the smaller structures thereof to be imaged onto the substrate (2) in a precise manner, with high functional reliability, and which enable the distortions of the substrate (2) to be corrected. To this end, the illuminating unit (8) and the optical unit (9) are displaced in relation to the mask (1) and the substrate (2), distortions of the substrate (2) are detected, and the imaging of the mask (1) is distorted according to the detected distortions by means of the optical unit (9) and is adapted to the distortions of the substrate (2).
    • 本发明涉及通过照明单元(8)和光学单元(9)将掩模(1)成像到基板(2)上的方法。 本发明还涉及一种用于执行该方法的装置。 本发明的目的是创造一种使掩模(1)及其较小结构以精确的方式精确地成像到基板(2)上的方法和装置,具有高功能可靠性,并且能够使 要校正的基板(2)。 为此,照明单元(8)和光学单元(9)相对于掩模(1)和基板(2)移位,检测基板(2)的失真,并且掩模的成像 (1)通过光学单元(9)根据检测到的失真而变形,并适应于基板(2)的变形。
    • 8. 发明授权
    • Apparatus for producing microbore holes
    • 用于生产微孔的装置
    • US06639179B2
    • 2003-10-28
    • US10052912
    • 2002-01-23
    • Sven VoglerRoland Kaplan
    • Sven VoglerRoland Kaplan
    • B23K2638
    • B23K26/042B23K26/03B23K26/06B23K26/0853B23K26/382B23K26/705B23K2103/50H05K1/0269H05K3/0008H05K3/0026
    • A method of producing microbore holes in a multi-layer substrate (5), preferably a printed circuit board substrate, that is displaced below writing optics (4) by an XY stage (6), using the optics to generate a spot from a light source (1), preferably a laser. The method reduces the treatment time and preferably compensates for distortions in the substrate material. To this end, the position of the spot within a working field is changed simultaneously with the treatment positions by electronically controlled, movable mirrors. The position of the substrate is determined by an interferometer (9, 11), and the signals corresponding to the substrate position are processed by a suitable computer system (16) to obtain an actual position of the table system. The computer system (16) is preferably provided with all bore hole coordinates and additional information such as bore hole diameter, especially in tabular form.
    • 一种在多层基板(5)中产生微孔的方法,优选印刷电路板基板,其通过XY平台(6)在写入光学器件(4)之下移位,使用光学器件从光产生光点 源(1),优选为激光。 该方法减少了处理时间并且优选地补偿了基板材料中的变形。 为此,通过电子控制的可移动反射镜,在工作区域内的位置与治疗位置同时改变。 衬底的位置由干涉仪(9,11)确定,并且与衬底位置相对应的信号由合适的计算机系统(16)处理以获得桌子系统的实际位置。 计算机系统(16)优选地具有所有钻孔坐标和附加信息,例如钻孔直径,特别是以表格形式。