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    • 11. 发明申请
    • Semiconductor electrical characteristics evaluation apparatus and semiconductor electrical characteristics evaluation method
    • 半导体电气特性评估装置及半导体电气特性评估方法
    • US20010029436A1
    • 2001-10-11
    • US09816085
    • 2001-03-26
    • TOCHIGI NIKON CORPORATION, NIKON CORPORATION
    • Ryoichi Fukasawa
    • G06F019/00G01R027/28G01R031/00G01R031/14
    • G01N21/3581G01N21/3563G01R31/2831G01R31/311
    • An electrical characteristics evaluation apparatus comprises a terahertz pulse light source that irradiates terahertz pulse light onto a semiconductor material, a light detector that detects pulse light having been transmitted through or having been reflected by the semiconductor material, a measurement device that obtains a spectral transmittance or a spectral reflectance by using a time-series waveform of the electric field intensity of the transmitted pulse light or the reflected pulse light and an arithmetic operation unit that calculates an electrical characteristics parameter of the semiconductor material based upon the spectral transmittance or the spectral reflectance. By adopting this electrical characteristics evaluation apparatus and the corresponding electrical characteristics evaluation method, the electrical material quantities (such as the carrier density, the mobility, the resistivity and the electrical conductivity) of the measurement target, i.e.,the semiconductor material, can be measured and inspected without contaminating or damaging the semiconductor material.
    • 电特性评估装置包括将太赫兹脉冲光照射到半导体材料上的太赫兹脉冲光源,检测已被透过或被半导体材料反射的脉冲光的光检测器,获得光谱透射率的测量装置或 通过使用发射脉冲光或反射脉冲光的电场强度的时间序列波形的光谱反射率和基于光谱透射率或光谱反射率计算半导体材料的电特性参数的算术运算单元。 通过采用该电特性评价装置和相应的电特性评价方法,可以测量测量对象(即,半导体材料)的电气材料量(诸如载流子密度,迁移率,电阻率和电导率) 并且在不污染或损坏半导体材料的情况下检查。
    • 12. 发明授权
    • Measuring equipment
    • 测量设备
    • US07847931B2
    • 2010-12-07
    • US11666078
    • 2005-11-01
    • Naoki TsumuraKazushiro Fukushima
    • Naoki TsumuraKazushiro Fukushima
    • G01J3/00
    • G01N21/3581
    • A measuring equipment utilizing terahertz pulse light, includes: a terahertz light generator that generates terahertz pulse light; a terahertz light detector that detects terahertz pulse light; a first condensing optical system that condenses the terahertz pulse light generated by the terahertz light generator; and a second condensing optical system that condenses the terahertz pulse light diverging after being condensed by the first condensing optical system, onto the terahertz light detector. A sample is arranged in a vicinity of a position of condensing the terahertz pulse light by the first condensing optical system; and at least one of the first and the second condensing optical systems includes at least one optical device having a positive or negative refractive power. The measuring equipment further includes: a position adjusting mechanism that adjusts a position of the at least one optical device on an optical axis when the terahertz light detector detects the terahertz pulse light having transmitted through the sample; and a controlling unit that controls the position adjusting mechanism.
    • 利用太赫兹脉冲光的测量设备包括:产生太赫兹脉冲光的太赫兹光发生器; 检测太赫兹脉冲光的太赫兹光检测器; 第一聚光光学系统,其冷凝由太赫兹光发生器产生的太赫脉冲光; 以及第二聚光光学系统,其将由第一聚光光学系统聚集后的太赫兹脉冲光发散到太赫兹光检测器上。 将样品配置在通过第一聚光光学系统凝结太赫兹脉冲光的位置附近; 并且第一和第二聚光光学系统中的至少一个包括具有正或负折射光焦度的至少一个光学器件。 测量设备还包括:位置调节机构,当太赫兹光检测器检测到穿过样本的太赫兹脉冲光时,调节至少一个光学器件在光轴上的位置; 以及控制单元,其控制位置调整机构。
    • 13. 发明授权
    • Photoelectric encoder
    • 光电编码器
    • US07332709B2
    • 2008-02-19
    • US11598733
    • 2006-11-14
    • Toru Imai
    • Toru Imai
    • G01D5/34
    • G01D5/34715G01D5/38
    • A photoelectric encoder includes a light source of an illumination light beam. The encoder also includes a movable grating which has grating lines and which is displaceable in a direction intersecting the grating lines. An index grating serves as a reference for displacement of the movable grating. A light-receiver receives the illumination light beam via the movable grating and the index grating. A modulator periodically changes a light beam outgoing from the index grating. A displacement detector detects the displacement of the movable grating based on the illumination light beam received by the light-receiver. Accordingly, a signal representing the displacement of a movable body can be accurately generated even when fluctuation of the attitude of the grating occurs.
    • 光电编码器包括照明光束的光源。 编码器还包括具有光栅线的可移动光栅,其可沿与光栅线交叉的方向移位。 索引光栅用作可移动光栅的位移的参考。 光接收器通过可移动光栅和索引光栅接收照明光束。 调制器周期性地改变从折射光栅出射的光束。 位移检测器基于由光接收器接收的照明光束检测可移动光栅的位移。 因此,即使发生光栅的姿态的波动,也能够精确地生成表示可动体的位移的信号。
    • 14. 发明申请
    • Photoelectric encoder
    • 光电编码器
    • US20070057168A1
    • 2007-03-15
    • US11598733
    • 2006-11-14
    • Toru Imai
    • Toru Imai
    • G01D5/34
    • G01D5/34715G01D5/38
    • A photoelectric encoder includes a light source of an illumination light beam; a movable grating which has grating lines and which is displaceable in a direction intersecting the grating lines; an index grating which serves as a reference for displacement of the movable grating; a light-receiver which receives the illumination light beam via the movable grating and the index grating; a modulator which periodically changes a light beam outgoing from the index grating; and a displacement detector which detects the displacement of the movable grating based on the illumination light beam received by the light-receiver. Accordingly, a signal representing the displacement of a movable body can be accurately generated even when the attitude of the grating occurs.
    • 光电编码器包括照明光束的光源; 可移动光栅,其具有光栅线,并且可沿与光栅线相交的方向移位; 用作可移动光栅位移参考的索引光栅; 接收经由可移动光栅和折射光栅的照明光束的光接收器; 周期性地改变从折射光栅出射的光束的调制器; 以及位移检测器,其基于由光接收器接收的照明光束来检测可移动光栅的位移。 因此,即使当光栅的姿态出现时,也能够精确地生成表示可动体的位移的信号。
    • 15. 发明申请
    • Mask exchanging method and exposure apparatus
    • 面膜交换方法和曝光装置
    • US20040223132A1
    • 2004-11-11
    • US10781661
    • 2004-02-20
    • Nikon CorporationSendai Nikon Corporation
    • Kenji NishiKatsunobu OguraHidekazu Kikuchi
    • G03B027/00
    • G03F7/70733G03F7/70741
    • When a reticle stage capable of moving while holding a reticle is at a predetermined unloading position, an unloading arm performs unloading of a reticle. Also, the instant or immediately after the reticle is separated from the reticle stage by the unloading arm, the reticle stage is moved to a predetermined loading position where a reticle is loaded onto the reticle stage by a loading arm. This allows the reticle to be loaded onto the reticle stage before the unloading arm completely withdraws from the unloading position, which reduces the downtime between the retile unloading and the reticle loading. Accordingly, the throughput of the exposure apparatus can be improved, since the time required for reticle exchange is reduced.
    • 当保持掩模版时能够移动的标线片台处于预定的卸载位置时,卸载臂执行掩模版的卸载。 此外,在通过卸载臂将掩模版与刻划台分隔开之后或之后,通过装载臂将标线片载物台移动到预定的装载位置,在该装载位置将掩模版装载到标线片台上。 这样就可以在卸载臂从卸载位置完全退出之前,将掩模版加载到标线片台上,从而减少了沉淀物卸载与掩模版加载之间的停机时间。 因此,由于减少了掩模版交换所需的时间,因此能够提高曝光装置的生产量。