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    • 21. 发明申请
    • Non-volatile semiconductor memory device
    • 非易失性半导体存储器件
    • US20070030731A1
    • 2007-02-08
    • US11496458
    • 2006-08-01
    • Yasuhiko Honda
    • Yasuhiko Honda
    • G11C16/06
    • G11C16/28G11C11/5642
    • A sense amplifier has first and second input nodes. A reference memory cell is connected to the first input node. To the second input node, a constant current source circuit and a main memory cell are connected via a first transistor and a second transistor, respectively. A current mirror type load circuit is provided as a load circuit of the reference memory cell and the main memory cell. When a threshold voltage of the reference memory cell is adjusted, the first transistor is turned on and the second transistor is turned off. When the threshold voltage of the memory cell is adjusted at verification of writing to/erasing from the memory cell, the first transistor is turned off and the second transistor is turned on.
    • 读出放大器具有第一和第二输入节点。 参考存储单元连接到第一输入节点。 对于第二输入节点,恒流源电路和主存储单元分别经由第一晶体管和第二晶体管连接。 提供电流镜式负载电路作为参考存储单元和主存储单元的负载电路。 当调整参考存储单元的阈值电压时,第一晶体管导通,第二晶体管截止。 当在从存储单元写入/擦除的验证中调整存储单元的阈值电压时,第一晶体管截止,第二晶体管导通。
    • 23. 发明申请
    • Nonvolatile semiconductor memory device which stores multivalue data
    • 存储多值数据的非易失性半导体存储器件
    • US20060227645A1
    • 2006-10-12
    • US11401421
    • 2006-04-11
    • Yasuhiko Honda
    • Yasuhiko Honda
    • G11C5/14
    • G11C11/5628G11C16/0416G11C16/12G11C16/3454G11C16/3459G11C2211/5621
    • A voltage generating circuit supplies first gate voltage to the control gate of a memory cell for a first control time period and supplies write voltage to the drain for a first write time period which is shorter than the first control time period when an operation of writing data into the memory cell is started. As the verify result, if it is detected that a data amount written into the memory cell is insufficient, the voltage generating circuit supplies second control voltage obtained by raising the first control gate voltage by constant voltage to the control gate for a time period which is shorter than the first control time period and supplies write voltage to the drain for a second write time period which is shorter than the first write time period.
    • 电压产生电路将第一栅极电压提供给存储单元的控制栅极用于第一控制时间段,并且在写入数据的操作时将写入电压提供给漏极,用于比第一控制时间段短的第一写入时间段 进入内存单元开始。 作为验证结果,如果检测到写入存储单元的数据量不足,则电压产生电路将通过将第一控制栅极电压提高到恒定电压而获得的第二控制电压提供给控制栅极,时间段为 比第一控制时间段短,并将写入电压提供给漏极,持续比第一写入时间段短的第二写入时间段。
    • 25. 发明申请
    • Semiconductor storage apparatus
    • 半导体存储装置
    • US20050169081A1
    • 2005-08-04
    • US11019271
    • 2004-12-23
    • Yasuhiko Honda
    • Yasuhiko Honda
    • G11C16/06G11C7/02G11C7/06G11C7/12G11C16/04G11C16/24G11C11/34
    • G11C7/062G11C7/02G11C7/12G11C16/24
    • A semiconductor storage apparatus comprises a cell array including memory cells and reference cells, normal column selection transistors connected to columns of the memory cells, a normal data line array including normal data lines connected to columns of the memory cells, first dummy data lines formed of a same wiring layer of which the normal data lines are formed, a normal data line charging circuit, reference column selection transistors connected to reference columns of the reference cells, a reference data line array including reference data lines formed of a same wiring layer of which the normal data lines are formed, second dummy data lines formed of a same wiring layer of which the reference data lines are formed, a reference data line charging circuit, a first dummy data line charging circuit, a second dummy data line charging circuit, and a sense amplifier which senses data stored in the memory cells.
    • 半导体存储装置包括具有存储单元和参考单元的单元阵列,连接到存储单元的列的正常列选择晶体管,包括连接到存储单元的列的普通数据线的正常数据线阵列,第一虚拟数据线由 形成正常数据线的相同布线层,正常数据线充电电路,连接到参考单元的参考列的参考列选择晶体管,包括由相同布线层形成的参考数据线的参考数据线阵列 形成正常的数据线,由形成基准数据线的相同布线层形成的第二虚拟数据线,参考数据线充电电路,第一虚拟数据线充电电路,第二虚拟数据线充电电路和 感测放大器,其感测存储在存储单元中的数据。