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    • 10. 发明授权
    • Semiconductor memory device having redundant circuitry for replacing defective memory cell
    • 具有用于替换有缺陷的存储单元的冗余电路的半导体存储器件
    • US06532181B2
    • 2003-03-11
    • US09963404
    • 2001-09-27
    • Hidetoshi SaitoMasao KuriyamaYasuhiko HondaHideo Kato
    • Hidetoshi SaitoMasao KuriyamaYasuhiko HondaHideo Kato
    • G11C700
    • G11C29/78G11C8/06G11C16/26G11C2216/22
    • A nonvolatile semiconductor memory includes a memory cell array and a redundant cell array, and while a data write operation or a data erase operation is carried out in one of banks in the memory cell array, a data read operation can be carried out in the other banks. The redundant cell array has one or more spare blocks and is provided independently of the banks to relieve a defective memory cell of the memory cell array by substituting the spare block for a defective memory block in any of the blocks. The memory block is active when an access block address to be accessed in the memory cell array in the data write or erase operation or the data read operation does not coincide with the defective block address in the defective address storing circuit, whereas the spare block is active when the access block address coincides with the defective block address in the defective address storing circuit.
    • 非易失性半导体存储器包括存储单元阵列和冗余单元阵列,并且在存储单元阵列中的一个存储体中进行数据写入操作或数据擦除操作时,可以在另一个存储单元阵列中执行数据读取操作 银行。 冗余单元阵列具有一个或多个备用块,并且独立于存储体提供,以通过将备用块替换为任何块中的有缺陷的存储块来解除存储单元阵列的有缺陷的存储单元。 当在数据写入或擦除操作或数据读取操作中要存储在存储单元阵列中的访问块地址与缺陷地址存储电路中的有缺陷块地址不一致时,存储块有效,而备用块是 当访问块地址与缺陷地址存储电路中的有缺陷的块地址一致时有效。