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    • 1. 发明申请
    • SEMICONDUCTOR STORAGE DEVICE
    • 半导体存储设备
    • US20120069683A1
    • 2012-03-22
    • US13235391
    • 2011-09-18
    • Yoshihiko KAMATAFumitaka TaniwakiHirotaka KariyaYuki ShimizuShirou Fujita
    • Yoshihiko KAMATAFumitaka TaniwakiHirotaka KariyaYuki ShimizuShirou Fujita
    • G11C16/10G11C16/06
    • G11C11/5642G11C16/10G11C16/26
    • According to one embodiment, a semiconductor storage device includes a cell array, an even line, an odd line, and sense amplifiers. The cell array includes memory cells holding data. The even line connects to the memory cells. The odd line connects to the memory cells. The memory cells connect to an odd column or the even column. Each the sense amplifiers selectively connect to the odd line or the even line. Each the sense amplifiers includes a latch circuit, a first transistor, a second transistor, and a third transistor. The latch circuit includes a first node and a second node, and holds the data supplied to the first node. The first transistor supplies read data to the latch circuit. The second transistor transfers the data held by the latch circuit to the wiring. The third transistor transfers the data held by the latch circuit to the wiring.
    • 根据一个实施例,半导体存储装置包括单元阵列,偶数行,奇数行和读出放大器。 单元阵列包括保存数据的存储单元。 偶数行连接到存储单元。 奇数行连接到存储单元。 存储单元连接到奇数列或偶数列。 每个读出放大器选择性地连接到奇数行或偶数行。 每个读出放大器包括锁存电路,第一晶体管,第二晶体管和第三晶体管。 锁存电路包括第一节点和第二节点,并且保存提供给第一节点的数据。 第一晶体管将读取数据提供给锁存电路。 第二晶体管将由锁存电路保持的数据传送到布线。 第三晶体管将由锁存电路保持的数据传送到布线。
    • 3. 发明申请
    • VOLTAGE GENERATING CIRCUIT
    • 电压发生电路
    • US20090115500A1
    • 2009-05-07
    • US12260366
    • 2008-10-29
    • Masaaki KuwagataYasuhiko HondaYoshihiko Kamata
    • Masaaki KuwagataYasuhiko HondaYoshihiko Kamata
    • G05F1/10
    • G11C16/30G11C5/143G11C5/145H02M3/073H02M2001/0025H02M2001/0032Y02B70/16
    • A voltage generating circuit for outputting a voltage from an output terminal, has a first voltage dividing circuit which is connected between the output terminal and ground; a switch circuit connected between the output terminal and the first voltage dividing circuit; a first voltage detecting circuit which outputs a first pumping signal corresponding to a comparison result; a second voltage dividing circuit which is connected between the output terminal and the ground; a second voltage detecting circuit which outputs a second pumping signal corresponding to a comparison result; a pump circuit that outputs a voltage boosted from a power supply voltage; and a boost circuit which has a capacitive element having one end connected to the voltage dividing resistor of the first voltage dividing circuit.
    • 用于从输出端子输出电压的电压产生电路具有连接在输出端子与地之间的第一分压电路; 连接在输出端和第一分压电路之间的开关电路; 第一电压检测电路,输出与比较结果对应的第一泵浦信号; 连接在输出端子和地之间的第二分压电路; 第二电压检测电路,其输出与比较结果相对应的第二泵浦信号; 输出从电源电压提升的电压的泵电路; 以及升压电路,其具有一端与第一分压电路的分压电阻连接的电容元件。
    • 8. 发明申请
    • SEMICONDUCTOR MEMORY
    • 半导体存储器
    • US20120113724A1
    • 2012-05-10
    • US13235416
    • 2011-09-18
    • Mario SAKOYoshihiko Kamata
    • Mario SAKOYoshihiko Kamata
    • G11C16/06
    • G11C16/0483G11C16/06G11C16/26G11C29/789G11C29/82
    • According to one embodiment, a semiconductor memory includes a memory cell array including a plurality of memory cells, a sense amplifier circuit holding a verification result for the memory cells and including sense units, the sense units of each column block being connected in common to a first signal line, and a detecting circuit including a detecting unit. The detecting unit includes a first latch circuit which holds failure information in the memory cell arrays, and a second latch circuit which includes a first input terminal connected to the first signal line, a second input terminal connected to the first latch circuit, and a first output terminal connected to a second signal line.
    • 根据一个实施例,半导体存储器包括包括多个存储单元的存储单元阵列,保持存储单元的验证结果并包括感测单元的读出放大器电路,每个列块的感测单元共同连接到 第一信号线和包括检测单元的检测电路。 检测单元包括保存存储单元阵列中的故障信息的第一锁存电路和包括连接到第一信号线的第一输入端,连接到第一锁存电路的第二输入端和第一锁存电路的第二锁存电路, 输出端子连接到第二信号线。
    • 9. 发明申请
    • Semiconductor storage device
    • 半导体存储设备
    • US20100238736A1
    • 2010-09-23
    • US12659092
    • 2010-02-25
    • Yoshihiko KamataJin KashiwagiHikaru Mochizuki
    • Yoshihiko KamataJin KashiwagiHikaru Mochizuki
    • G11C16/06G11C5/14G11C7/06
    • G11C11/5628G11C16/3436
    • 1. A semiconductor storage device has a first MOS transistor connected at a first end thereof to a power supply and diode-connected; a second MOS transistor connected in parallel with the first MOS transistor; a memory cell connected between the second end of the first MOS transistor and ground, the memory cell capable of adjusting a current flowing through the memory cell; a third MOS transistor connected at a first end thereof to the power supply, and diode-connected; a fourth MOS transistor connected in parallel with the third MOS transistor; a fifth MOS transistor connected between the second end of the fourth MOS transistor and the ground and supplied at a gate thereof with the first reference voltage; and an amplifier circuit which compares the sense voltage with the comparison voltage, and which outputs a comparison result signal depending upon a result of the comparison.
    • 半导体存储装置的第一MOS晶体管的第一端与电源连接,二极管连接; 与第一MOS晶体管并联连接的第二MOS晶体管; 连接在第一MOS晶体管的第二端和地之间的存储单元,所述存储单元能够调节流过所述存储单元的电流; 第三MOS晶体管,其第一端连接到电源,二极管连接; 与第三MOS晶体管并联连接的第四MOS晶体管; 连接在第四MOS晶体管的第二端和地之间并在其栅极处提供第一参考电压的第五MOS晶体管; 以及放大器电路,其将感测电压与比较电压进行比较,并且根据比较结果输出比较结果信号。