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    • 2. 发明申请
    • SYSTEMS FOR PROVIDING PERFORMANCE MONITORING IN A MEMORY SYSTEM
    • 用于在存储系统中提供性能监控的系统
    • US20090119466A1
    • 2009-05-07
    • US12352990
    • 2009-01-13
    • Kevin C. GowerCarl E. LoveDustin J. VanStee
    • Kevin C. GowerCarl E. LoveDustin J. VanStee
    • G06F12/00
    • G06F13/1668G06F11/3419G06F11/3476G06F11/349G06F2201/86G06F2201/88Y02D10/14Y02D10/34
    • Systems for providing performance monitoring in a memory system. The memory system includes a memory controller, a plurality of memory devices, a memory bus and a memory hub device. The memory controller receives and responds to memory access requests. The memory bus is in communication with the memory controller. The memory hub device is in communication with the memory bus. The memory hub device includes a memory interface for transferring one or more of address, control and data information between the memory hub device and the memory controller via the memory bus. The memory hub device also includes a memory device interface for communicating with the memory devices. The memory hub device further includes a performance monitor for monitoring and reporting one or more of memory bus utilization, memory device utilization, and performance characteristics over defined intervals during system operation.
    • 用于在存储器系统中提供性能监视的系统。 存储器系统包括存储器控制器,多个存储器件,存储器总线和存储器集线器设备。 存储器控制器接收和响应存储器访问请求。 存储器总线与存储器控制器通信。 存储器集线器设备与存储器总线通信。 存储器集线器设备包括用于经由存储器总线在存储器集线器设备和存储器控制器之间传送地址,控制和数据信息中的一个或多个的存储器接口。 存储器集线器设备还包括用于与存储器件通信的存储器设备接口。 存储器集线器设备还包括性能监视器,用于在系统操作期间在定义的间隔上监视和报告存储器总线利用率,存储器件利用率和性能特性中的一个或多个。
    • 3. 发明授权
    • Systems and methods for providing performance monitoring in a memory system
    • 在存储系统中提供性能监控的系统和方法
    • US07493439B2
    • 2009-02-17
    • US11461567
    • 2006-08-01
    • Kevin C. GowerCarl E. LoveDustin J. VanStee
    • Kevin C. GowerCarl E. LoveDustin J. VanStee
    • G06F13/14G06F13/24G06F12/00
    • G06F13/1668G06F11/3419G06F11/3476G06F11/349G06F2201/86G06F2201/88Y02D10/14Y02D10/34
    • Systems and methods for providing performance monitoring in a memory system. Embodiments include a memory system for storing and retrieving data for a processing system. The memory system includes a memory controller, a plurality of memory devices, a memory bus and a memory hub device. The memory controller receives and responds to memory access requests. The memory bus is in communication with the memory controller. The memory hub device is in communication with the memory bus. The memory hub device includes a memory interface for transferring one or more of address, control and data information between the memory hub device and the memory controller via the memory bus. The memory hub device also includes a memory device interface for communicating with the memory devices. The memory hub device further includes a performance monitor for monitoring and reporting one or more of memory bus utilization, memory device utilization, and performance characteristics over defined intervals during system operation.
    • 在存储系统中提供性能监控的系统和方法。 实施例包括用于存储和检索用于处理系统的数据的存储器系统。 存储器系统包括存储器控制器,多个存储器件,存储器总线和存储器集线器设备。 存储器控制器接收和响应存储器访问请求。 存储器总线与存储器控制器通信。 存储器集线器设备与存储器总线通信。 存储器集线器设备包括用于经由存储器总线在存储器集线器设备和存储器控制器之间传送地址,控制和数据信息中的一个或多个的存储器接口。 存储器集线器设备还包括用于与存储器件通信的存储器设备接口。 存储器集线器设备还包括性能监视器,用于在系统操作期间在定义的间隔上监视和报告存储器总线利用率,存储器件利用率和性能特性中的一个或多个。
    • 6. 发明授权
    • System and method for providing voltage power gating
    • 提供电压门控的系统和方法
    • US08015426B2
    • 2011-09-06
    • US12056566
    • 2008-03-27
    • Dustin J. VanSteeThomas J. GriffinLeonard M. Greenberg
    • Dustin J. VanSteeThomas J. GriffinLeonard M. Greenberg
    • G06F1/32
    • G11C5/14G11C5/04
    • A system and method for providing voltage power gating. The system includes a device for providing voltage power gating. The device includes logic circuitry, a mechanism for receiving a control signal associated with the logic circuitry and a selector. The control signal indicates an active state or an idle state of the logic circuitry. The selector enables a power source to the logic circuitry in response to the control signal indicating the active state. The selector also disables the power source to the logic circuitry in response to the control signal indicating the idle state. Thus, the power source is dynamically eliminated from the logic circuitry on the device when it is in the idle state.
    • 一种提供电压门控的系统和方法。 该系统包括用于提供电压电源门控的装置。 该装置包括逻辑电路,用于接收与逻辑电路相关联的控制信号和选择器的机构。 控制信号指示逻辑电路的活动状态或空闲状态。 响应于指示活动状态的控制信号,该选择器使能逻辑电路的电源。 响应于指示空闲状态的控制信号,选择器还禁用逻辑电路的电源。 因此,当电源处于空闲状态时,电源在设备上的逻辑电路中被动态地消除。
    • 10. 发明授权
    • Memory built-in self test engine apparatus and method with trigger on failure and multiple patterns per load capability
    • 内存自检引擎装置和方法,具有故障触发和每种负载能力的多种模式
    • US07181659B2
    • 2007-02-20
    • US11055195
    • 2005-02-10
    • Elianne A. BravoKenneth Y. ChanKevin C. GowerDustin J. VanStee
    • Elianne A. BravoKenneth Y. ChanKevin C. GowerDustin J. VanStee
    • G11C29/00
    • G11C29/16G11C11/401
    • A memory built-in self test (MBIST) apparatus and method for testing dynamic random access memory (DRAM) arrays, the DRAM arrays in communication with a memory interface device that includes interface logic and mainline chip logic. The MBIST apparatus includes a finite state machine including a command generator and logic for incrementing data and addresses under test and a command scheduler in communication with the finite state machine. The command scheduler includes resource allocation logic for spacing commands to memory dynamically utilizing DRAM timing parameters. The MBIST apparatus also includes a test memory storing subtests of an MBIST test. Each of the subtests provides a full pass through a configured address range. The MBIST apparatus further includes a subtest pointer in communication with the test memory and the finite state machine. The finite state machine implements subtest sequencing of each of the subtests via the subtest pointer.
    • 用于测试动态随机存取存储器(DRAM)阵列的存储器内置自检(MBIST)装置和方法,所述DRAM阵列与包括接口逻辑和主线芯片逻辑的存储器接口装置通信。 MBIST装置包括有限状态机,其包括用于递增待测数据和地址的命令发生器和逻辑,以及与有限状态机通信的命令调度器。 命令调度器包括用于动态地利用DRAM时序参数将命令间隔到存储器的资源分配逻辑。 MBIST设备还包括存储MBIST测试的分测验的测试存储器。 每个分测验提供完整的配置地址范围。 MBIST装置还包括与测试存储器和有限状态机通信的子测试指针。 有限状态机通过子测验指针实现每个子测验的子测序。