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1. 发明授权

US11454499B2 Measurement method for a surface-measuring measuring machine 有权
公开(公告)号：US11454499B2
公开(公告)日：2022-09-27
申请号：US13636628
申请日：2011-03-21
申请人： Heinz Lippuner , Urs Vokinger , Knut Siercks
发明人： Heinz Lippuner , Urs Vokinger , Knut Siercks
IPC分类号： G01C1/00 , G01B21/04 , G01D5/347
摘要： Measurement method where a code projection which is dependent on a three-dimensional position of a code carrier relative to a sensor arrangement is generated on a sensor arrangement, and at least part of the code projection is captured. An angular position of the code carrier with reference to the defined axis of rotation is ascertained and a current measurement position of the measurement component relative to a base is determined, wherein, a position value for at least one further degree of freedom of the code carrier relative to the sensor arrangement is ascertained on the basis of the code projection and is taken into account to determine the current measurement position, and a relative position of the connecting element with respect to the holder and/or the deformation thereof is determined from the position value in the form of a change in shape or size.

2. 发明申请

US20140198207A1 TILT SENSOR FOR A DEVICE AND METHOD FOR DETERMINING THE TILT OF A DEVICE 有权
标题翻译：用于装置的倾斜传感器和用于确定装置倾斜的方法
公开(公告)号：US20140198207A1
公开(公告)日：2014-07-17
申请号：US13810645
申请日：2011-08-22
申请人： Heinz Lippuner , Bernhard Metzler , Werner Amann
发明人： Heinz Lippuner , Bernhard Metzler , Werner Amann
IPC分类号： G01C9/20 , G01C9/06
CPC分类号： G01C9/20 , G01C9/06
摘要： The invention relates to a tilt sensor for a device, comprising a tank receiving a flowable medium, wherein the position of the medium relative to the tank depends on the tilt, and the tank comprises a polygonal, in particular triangular, or an elliptical, in particular circular base, a source of electromagnetic radiation for generating projections of at least one part of a boundary of the medium, at least two detectors for detecting one of the projections, respectively, and for converting same into signals, wherein the detectors each comprise a detecting direction and the detecting directions of the detectors are disposed at angles to each other, and further comprising an analysis unit for determining the tilt in two axes from the signals of the at least two detectors, wherein the tilt is determined jointly for the two axes from a combination of the signals.
摘要翻译：本发明涉及一种用于装置的倾斜传感器，包括容纳可流动介质的罐，其中介质相对于罐的位置取决于倾斜，并且罐包括多边形，特别是三角形或椭圆形，特定圆形基座，用于产生介质边界的至少一部分的投影的电磁辐射源，分别用于检测所述突起之一并将其转换为信号的至少两个检测器，其中所述检测器包括：检测器的检测方向和检测方向彼此成角度地设置，并且还包括分析单元，用于根据至少两个检测器的信号来确定两个轴的倾斜，其中对于两个轴共同确定倾斜从信号的组合。

3. 发明授权

US08546745B2 Optoelectronic position measurement device having a guided beam path in the interior of a code carrier and optoelectronic position measurement method 有权
标题翻译：光电位置测量装置在码载体的内部具有引导光束路径，并且具有光电位置测量方法
公开(公告)号：US08546745B2
公开(公告)日：2013-10-01
申请号：US13143721
申请日：2010-02-01
申请人： Heinz Lippuner
发明人： Heinz Lippuner
IPC分类号： G01D5/34
CPC分类号： G01D5/34723
摘要： An optoelectronic position measurement device having a code carrier that carries at least one optically registered position code and that is illuminated with optical radiation from a radiation source. At least one portion of the optical radiation is registered by at least one registration element, by means of which a signal dependent on the position code can be created and a position of the code carrier relative to the registration element can thus be registered. the code carrier is movable relative to the registration element with a degree of freedom. the optical radiation couples into the code carrier and is guided at least partially in a beam path in the interior of the code carrier lying in the extension level of the code carrier. The decoupling of the optical radiation occurs in a decoupling zone such that the registration element is illuminated by a substantially homogenous intensity distribution.
摘要翻译：一种光电位置测量装置，其具有承载至少一个光学注册位置代码并由来自辐射源的光辐射照射的代码载体。光辐射的至少一部分由至少一个注册元件注册，通过该注册元件可以创建取决于位置代码的信号，并且因此可以登记代码载体相对于注册元件的位置。代码载体相对于注册元件具有自由度可移动。光辐射耦合到码载体中，并且至少部分地在位于码载体的扩展级的码载体的内部的波束路径中被引导。光辐射的解耦发生在去耦区域中，使得配准元件被基本均匀的强度分布照射。

4. 发明授权

US07299557B2 Tilt sensor 有权
标题翻译：倾斜传感器
公开(公告)号：US07299557B2
公开(公告)日：2007-11-27
申请号：US11179231
申请日：2005-07-12
申请人： Heinz Lippuner
发明人： Heinz Lippuner
IPC分类号： G01C9/06
CPC分类号： G01C9/20 , G01C9/06 , G01C2009/066
摘要： A tilt sensor has a source for optical radiation, a pattern support having an optically effective pattern for the passage of the optical radiation generated by the source, a tilt-sensitive unit downstream of the pattern support in the direction of propagation of the radiation, and a projection area for the incidence of the radiation generated by the source and passing through the pattern support and the tilt-sensitive unit, wherein the source is in the form of a pattern support.
摘要翻译：倾斜传感器具有用于光辐射的源，具有光学有效图案的图案支撑件，用于使由源产生的光辐射通过，沿着辐射方向的图案支撑下游的倾斜敏感单元，以及用于由源产生并通过图案支撑件和倾斜敏感单元的辐射入射的投影区域，其中源是图案支撑件的形式。

5. 发明授权

US09506753B2 Tilt sensor for a device and method for determining the tilt of a device 有权
标题翻译：用于装置的倾斜传感器和用于确定装置倾斜的方法
公开(公告)号：US09506753B2
公开(公告)日：2016-11-29
申请号：US13810645
申请日：2011-08-22
申请人： Heinz Lippuner , Bernhard Metzler , Werner Amann
发明人： Heinz Lippuner , Bernhard Metzler , Werner Amann
IPC分类号： G01N15/06 , G01C9/20 , G01C9/06
CPC分类号： G01C9/20 , G01C9/06
摘要： The invention relates to a tilt sensor for a device, comprising a tank receiving a flowable medium, wherein the position of the medium relative to the tank depends on the tilt, and the tank comprises a polygonal, in particular triangular, or an elliptical, in particular circular base, a source of electromagnetic radiation for generating projections of at least one part of a boundary of the medium, at least two detectors for detecting one of the projections, respectively, and for converting same into signals, wherein the detectors each comprise a detecting direction and the detecting directions of the detectors are disposed at angles to each other, and further comprising an analysis unit for determining the tilt in two axes from the signals of the at least two detectors, wherein the tilt is determined jointly for the two axes from a combination of the signals.
摘要翻译：本发明涉及一种用于装置的倾斜传感器，包括容纳可流动介质的罐，其中介质相对于罐的位置取决于倾斜，并且罐包括多边形，特别是三角形或椭圆形，特定圆形基座，用于产生介质边界的至少一部分的投影的电磁辐射源，分别用于检测所述突起之一并将其转换为信号的至少两个检测器，其中所述检测器包括：检测器的检测方向和检测方向彼此成角度地设置，并且还包括分析单元，用于根据至少两个检测器的信号来确定两个轴的倾斜，其中对于两个轴共同确定倾斜从信号的组合。

6. 发明授权

US09080867B2 Measuring method for an articulated-arm coordinate measuring machine 有权
标题翻译：铰臂式坐标测量机的测量方法
公开(公告)号：US09080867B2
公开(公告)日：2015-07-14
申请号：US12937423
申请日：2009-04-17
申请人： Heinz Lippuner , Knut Siercks
发明人： Heinz Lippuner , Knut Siercks
IPC分类号： B25J9/06 , G01B5/004 , G06F17/18 , G01B21/04 , G01B5/008 , B25J9/16 , B25J13/02
CPC分类号： G01B21/045 , B25J9/06 , B25J9/1612 , B25J13/02 , G01B5/004 , G01B5/008 , G01B21/04
摘要： A measuring method for determining a measurement position of a probe element 6 can include using a coordinate measuring machine 1 having a base and members that can be moved relative to the base and relative to each other, wherein one of the members, as the probe member TG, comprises a probe element 6, so that the probe element 6 can move freely within a prescribed volume of space, wherein the measurement position is captured by the probe element 6, a measurement variable set is taken by measuring measurement variables linked to a measurement position of the members, wherein the measurement position is determined by a relative location of the members to each other and of at least one of the members to the base, and the measurement position is determined relative to the base.
摘要翻译：用于确定探针元件6的测量位置的测量方法可以包括使用具有基座的坐标测量机1和能够相对于基座相对于彼此移动的构件，其中，构件之一作为探针构件 TG包括探针元件6，使得探针元件6能够在规定空间内自由移动，其中测量位置由探针元件6捕获，通过测量与测量相关联的测量变量来获取测量变量集所述构件的位置，其中所述测量位置由所述构件彼此的相对位置和所述构件中的至少一个到所述基座的相对位置确定，并且所述测量位置相对于所述基座确定。

7. 发明授权

US08462979B2 Optoelectronic angle sensor and method for determining a rotational angle about an axis 有权
标题翻译：光电角度传感器和用于确定围绕轴线的旋转角度的方法
公开(公告)号：US08462979B2
公开(公告)日：2013-06-11
申请号：US12377445
申请日：2007-08-16
申请人： Bernhard Braunecker , Peter Kipfer , Heinz Lippuner
发明人： Bernhard Braunecker , Peter Kipfer , Heinz Lippuner
IPC分类号： G06K9/00
CPC分类号： G01D5/34776 , G01D5/3473
摘要： The invention relates to an optoelectronic angle sensor (1a) for determining a rotational angle about an axis (6), comprising a circular disk (2a) that can be rotated about the axis. Said circular disk comprises a coding, essentially over the entire surface, a flat photosensitive detector (3a), a device for producing an evaluable image of the coding on the detector and a memory and evaluation component (4a) for determining the rotational angle. A largely complete, or in particular an entire image of the coding is produced on the detector. The rotational angle is determined using a parameter-varying stochastic comparison method, from the image and a parameterised electronic reference pattern that is provided by means of the memory and evaluation component.
摘要翻译：本发明涉及一种用于确定围绕轴线（6）的旋转角度的光电子角度传感器（1a），包括可围绕轴线旋转的圆盘（2a）。所述圆盘包括基本上在整个表面上的编码平板光敏检测器（3a），用于产生检测器上的编码的可评估图像的装置和用于确定旋转角度的存储器和评估部件（4a）。在检测器上产生了一个很完整的，特别是整个编码的图像。使用参数变化随机比较方法从图像和通过存储器和评估部件提供的参数化电子参考图案确定旋转角度。

8. 发明申请

US20110112786A1 CMM WITH IMPROVED SENSORS 审中-公开
标题翻译：具有改进传感器的CMM
公开(公告)号：US20110112786A1
公开(公告)日：2011-05-12
申请号：US12748278
申请日：2010-03-26
申请人： Laurent Desforges , Heinz Lippuner , Knut Siercks , Thibault Duportal , Denny Roux , Jean-Luc Famechon
发明人： Laurent Desforges , Heinz Lippuner , Knut Siercks , Thibault Duportal , Denny Roux , Jean-Luc Famechon
IPC分类号： G06F19/00 , G01B5/008
摘要： A method of operating an articulated arm CMM is provided. One or more coordinates on an object can be measured with the articulated arm CMM. At least one of the encoders can then be at least partially powered-off. The encoder can then be powered on and one or more coordinates on the same object can be measured without recalibrating the encoder.
摘要翻译：提供了一种操作铰接臂CMM的方法。可以用铰接臂CMM测量物体上的一个或多个坐标。至少一个编码器可以至少部分断电。然后可以对编码器通电，并且可以在不重新校准编码器的情况下测量同一物体上的一个或多个坐标。

9. 发明授权

US07359047B2 Device for checking or calibrating the angle-dependent alignment of a high-precision test piece 有权
标题翻译：用于检查或校准高精度测试片的角度相关对准的装置
公开(公告)号：US07359047B2
公开(公告)日：2008-04-15
申请号：US10565971
申请日：2004-07-23
申请人： Heinz Lippuner
发明人： Heinz Lippuner
IPC分类号： G01J1/10
CPC分类号： G01C1/02 , G01C25/00
摘要： The invention relates to checking or calibrating the angle-dependent alignment of a reference structure on a high-precision test-piece. A device comprises a plinth, and a retainer piece, rotatably mounted about a retainer piece axis, for retaining the test-piece and a measuring piece with a measuring piece bearing unit, to rotationally mount the measuring piece, about a measuring piece axis. An optical unit is mounted on the measuring piece, for receiving at least one test-piece beam, interacting with the reference structure on the test piece, running essentially in a measuring plane. The measuring piece bearing unit is arranged on the measuring plane or to one side thereof. The measuring piece includes a base that is, for example, axially symmetrical with the measuring piece axis encompassing or surrounding the intersection of the measuring piece axis with the retainer piece axis and hence also encompasses or surrounds the test-piece.
摘要翻译：本发明涉及检查或校准参考结构在高精度测试件上的与角度相关的对准。一种装置包括一个底座和一个可围绕保持件轴线可旋转地安装的用于保持试件的保持件和一个具有测量件轴承单元的测量件，围绕测量件轴线旋转地安装测量件。光学单元安装在测量件上，用于接收至少一个测试片，与测试片上的参考结构相互作用，基本上在测量平面中运行。测量轴承单元布置在测量平面上或其一侧。测量件包括例如与测量件轴线轴对称的基座，其包围或围绕测量件轴线与保持件轴线的交点，并且因此也包围或围绕测试件。

10. 发明申请

US20060236746A1 Device for checking or calibrating the angle-dependent alignment of a high-precision test piece 有权
标题翻译：用于检查或校准高精度测试片的角度相关对准的装置
公开(公告)号：US20060236746A1
公开(公告)日：2006-10-26
申请号：US10565971
申请日：2004-07-23
申请人： Heinz Lippuner
发明人： Heinz Lippuner
IPC分类号： G01C25/00
CPC分类号： G01C1/02 , G01C25/00
摘要： The invention relates to a device for checking or calibrating the angle-dependent alignment of a reference structure on a high-precision test-piece. The device comprises a plinth, a retainer piece, mounted such as to rotate about a retainer piece axis, for retaining the test-piece and a measuring piece with a measuring piece bearing unit, for the rotational mounting of the measuring piece, about a measuring piece axis. An optical unit is mounted on the measuring piece, for receiving at least one test-piece beam, interacting with the reference structure on the test piece, running essentially in a measuring plane. The measuring piece bearing unit is arranged to one side of the measuring plane or on the measuring plane. The measuring piece includes a base form which is for a large part axially symmetrical with the measuring piece axis and encompasses or surrounds the intersection of the measuring piece axis with the retainer piece axis on the measuring plane and hence also encompasses or surrounds the test-piece.
摘要翻译：本发明涉及一种用于检查或校准参考结构在高精度测试件上的与角度相关的对准的装置。该装置包括底座，保持件，安装成围绕保持件轴线旋转，用于保持试件和具有测量件轴承单元的测量件，用于测量件的旋转安装，围绕测量件零件轴。光学单元安装在测量件上，用于接收至少一个测试片，与测试片上的参考结构相互作用，基本上在测量平面中运行。测量轴承单元布置在测量平面的一侧或测量平面上。测量件包括基座形式，其大部分与测量件轴线轴对称并且包围或围绕测量件轴线与测量平面上的保持器轴线的交点，因此也包围或围绕测试件。

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