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    • 1. 发明授权
    • Compilable address magnitude comparator for memory array self-testing
    • 可编程地址幅度比较器用于存储器阵列自检
    • US06658610B1
    • 2003-12-02
    • US09669117
    • 2000-09-25
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • G11C2900
    • G01R31/3187G01R31/3193G11C29/26G11C2029/1802
    • The present invention provides a method and apparatus that improves Built-In-Self-Test (BIST) flexibility without requiring the complexity of a compilable BIST circuit. Additionally, the present invention provides the ability to use a single BIST to test multiple memory arrays of different sizes. The preferred embodiment of the present invention provides a compilable address magnitude comparator to facilitate BIST testing of different size memory arrays without requiring customization of the BIST controller. The preferred embodiment compilable address magnitude comparator is compiled within the compilable memory arrays of the ASIC to allow a single BIST controller to test multiple sizes of memory arrays without requiring that the BIST controller itself be compilable. In the preferred embodiment, the compilable magnitude address comparator overrides the self-test signal from the BIST when the BIST attempts to test addresses that do not exist in the memory. As such, the BIST is prevented from writing to addresses that do not exist, and does not receive error signals from those addresses. Thus, the BIST controller is able to test memory arrays without regard for their particular size. Furthermore, a single BIST controller can then be used to test multiple memory arrays of different sizes in the ASIC, again reducing device complexity.
    • 本发明提供了一种改进内置自测(BIST)灵活性的方法和装置,而不需要可编译BIST电路的复杂性。 此外,本发明提供了使用单个BIST来测试不同大小的多个存储器阵列的能力。 本发明的优选实施例提供可编译的地址幅度比较器,以便于不需要定制BIST控制器的不同大小的存储器阵列的BIST测试。 优选实施例可编译地址幅度比较器被编译在ASIC的可编译存储器阵列内,以允许单个BIST控制器测试存储器阵列的多个大小,而不需要BIST控制器本身可编译。 在优选实施例中,当BIST尝试测试存储器中不存在的地址时,可编译幅度地址比较器覆盖来自BIST的自检信号。 因此,BIST被阻止写入不存在的地址,并且不从这些地址接收到错误信号。 因此,BIST控制器能够测试存储器阵列,而不考虑其特定大小。 此外,可以使用单个BIST控制器来测试ASIC中不同大小的多个存储器阵列,从而降低器件的复杂性。
    • 3. 发明授权
    • Combination oil scrapper ring/gas seal assembly
    • 组合刮油环/气密封组件
    • US06959930B2
    • 2005-11-01
    • US10438474
    • 2003-05-15
    • Michael H. WoodErnest B. McCurdy
    • Michael H. WoodErnest B. McCurdy
    • F16J15/26F16J9/12
    • F16J15/26
    • A ring assembly, including a first oil scraper ring, a center oil scraper ring and a gas seal ring, adapted for disposition in a single groove of a packing cup which can be stationarily mounted over and around a reciprocally movable piston rod of a gas compressor. The function of the assembly is to both scrape lubricating oil from the piston rod for return to one side of the cup and to provide a seal against gas leakage from an opposite side of the cup, both along the piston rod under the seal ring and between the seal ring and opposing sides of the center ring and groove to prevent mixing of gas with the oil and escape of gas from the compressor. The center ring features a tapered outer peripheral surface portion. An annular side loading element, which can be a garter spring, is mounted in compression around the center ring so as to bear against the tapered surface portion and against an adjacent side of the first ring. The element thus side loads the first ring, by urging it against one side of the groove and oppositely side loads the center ring and seal ring to force one against the other and to urge the seal ring tightly against an opposite side wall of the groove to effect a satisfactory gas seal. The first ring and center ring, together, provide three separate and axially spaced apart oil scraper edges.
    • 一种环组件,包括第一刮油环,中心刮油环和气密封环,其适于配置在填料杯的单个槽中,其可以固定地安装在气体压缩机的往复运动的活塞杆上 。 该组件的功能是既要从活塞杆上刮去润滑油,以便返回到杯的一侧,并且提供密封件,以防止来自杯的相对侧的气体泄漏,两者沿密封圈下方的活塞杆和第二 密封环和中心环和槽的相对侧,以防止气体与油的混合和气体从压缩机逸出。 中心环具有锥形外周面部分。 环形侧装载元件可以是一个拉杆弹簧,围绕中心环压缩安装,以抵靠锥形表面部分并抵靠第一环的相邻侧。 因此,元件通过将其推向槽的一侧来加载第一环,并且相反侧装载中心环和密封环以迫使一个抵靠另一个并且将密封环紧紧地推靠在槽的相对侧壁上 实现令人满意的气密封。 第一环和中心环一起提供三个独立且轴向隔开的刮油边。
    • 4. 发明授权
    • Dual channel d.c. low noise measurement system and test methodology
    • 双通道直流 低噪声测量系统和测试方法
    • US5563517A
    • 1996-10-08
    • US442556
    • 1995-05-16
    • Glenn A. BieryDaniel M. BoyneKenneth P. RodbellRichard G. SmithMichael H. Wood
    • Glenn A. BieryDaniel M. BoyneKenneth P. RodbellRichard G. SmithMichael H. Wood
    • G01R31/26G01R29/26H01L21/66
    • G01R29/26
    • A test system having an improved physical layout and electrical design allows the 1/f noise of metal interconnects to be measured at levels close to that of Johnson or thermal noise. A detailed description of examples of operation of the test system provides evidence of the effectiveness of the test system in minimizing system noise to a level significantly lower than Johnson noise. This permits quantitative measurment of the noise contribution attributable to variations in cross-sectional area of connections for various applications and for qualitative prediction of electromigration lifetimes of metal films, particularly aluminum, having different microstructures. The test system includes an enclosure which includes several nested groups of housings including a sample oven within a device under test box which is, in turn, contained within the system enclosure. Wire wound resistors powered by a DC power supply are used to provide heating without interfering with measurement of 1/f noise of a device under test (D.U.T.). A biasing circuit and a bank of batteries are also provided with separate enclosures within the system enclosure.
    • 具有改进的物理布局和电气设计的测试系统允许以接近Johnson或热噪声的水平测量金属互连的1 / f噪声。 测试系统操作示例的详细描述提供了测试系统在将系统噪声降至明显低于约翰逊噪声水平的有效性的证据。 这允许由于各种应用的连接的横截面积的变化以及用于定性预测具有不同微结构的金属膜,特别是铝的电迁移寿命的噪声贡献的定量测量。 该测试系统包括一个外壳,该外壳包括若干嵌套的外壳组,其中包括在被测箱的设备内的样品烘箱,该烘箱也被包含在系统外壳内。 由直流电源供电的绕线电阻器用于提供加热,而不会干扰被测器件(D.U.T.)的1 / f噪声的测量。 偏置电路和电池组还在系统外壳内设置有单独的外壳。
    • 10. 发明授权
    • Compilable address magnitude comparator for memory array self-testing
    • 可编程地址幅度比较器用于存储器阵列自检
    • US07073112B2
    • 2006-07-04
    • US10681856
    • 2003-10-08
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • Chiaming ChaiJeffrey H. FischerMichael R. OuelletteMichael H. Wood
    • G01R31/28
    • G01R31/3187G01R31/3193G11C29/26G11C2029/1802
    • An apparatus that improves Built-In-Self-Test (BIST) flexibility. A compilable address magnitude comparator facilitates BIST testing of different size memory arrays without requiring customization of the BIST controller. The compilable address magnitude comparator is compiled within the compilable memory arrays of the ASIC to allow a single BIST controller to test multiple sizes of memory arrays without requiring that the BIST controller be compilable. The compilable magnitude address comparator overrides the self-test signal from the BIST when the BIST attempts to test addresses not existing in the memory. The BIST is prevented from writing to addresses that do not exist, and does not receive error signals from those addresses. The BIST controller is able to test memory arrays without regard for their particular size. A single BIST controller can be used to test multiple memory arrays of different sizes in the ASIC, reducing device complexity.
    • 一种改进内置自检(BIST)灵活性的设备。 可编译的地址幅度比较器便于对不同大小的存储器阵列进行BIST测试,而无需定制BIST控制器。 可编译地址幅度比较器在ASIC的可编译存储器阵列中编译,以允许单个BIST控制器测试多个大小的存储器阵列,而不需要BIST控制器可编译。 当BIST尝试测试存储器中不存在的地址时,可编译幅度地址比较器会覆盖BIST的自检信号。 BIST被阻止写入不存在的地址,并且不会从这些地址接收到错误信号。 BIST控制器能够测试存储器阵列,而不考虑其特定大小。 单个BIST控制器可用于在ASIC中测试不同大小的多个存储器阵列,从而降低器件的复杂性。