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    • 2. 发明申请
    • Magnetron sputtering utilizing halbach magnet arrays
    • 使用Halbach磁体阵列的磁控管溅射
    • US20080121515A1
    • 2008-05-29
    • US11604326
    • 2006-11-27
    • Paul S. McLeod
    • Paul S. McLeod
    • C23C14/35
    • C23C14/35H01J37/3405H01J37/3452
    • A magnetron sputtering target assembly, comprises a target adapted to comprise of at least one material to be sputtered, the target including a pair of oppositely facing surfaces; and a magnet assembly comprising a plurality of Halbach magnet arrays adjacent one of the surfaces for providing magnetic field lines which emerge from and re-enter the other of the surfaces to form an arched, closed-loop magnetic field path over the other surface. The enhanced magnetic flux intensity provided by the Halbach magnet assemblies, relative to conventional magnetron magnet assemblies, facilitates sputtering of thick targets comprised of magnetic materials in the manufacture of recording media, as well as low pressure sputtering of high quality carbon-containing protective overcoat materials for such media.
    • 磁控溅射靶组件包括适于包括至少一种待溅射材料的靶,所述靶包括一对相对面的表面; 以及磁体组件,其包括邻近所述表面中的一个的多个Halbach磁体阵列,用于提供从另一个表面出来并重新进入另一个表面的磁场线,以在另一个表面上形成拱形的闭环磁场路径。 相对于传统的磁控管磁体组件,由Halbach磁体组件提供的增强的磁通强度有助于在制造记录介质时溅射由磁性材料构成的厚靶,以及高质量含碳保护外套材料的低压溅射 为这样的媒体。
    • 3. 发明授权
    • Process for vacuum chemical epitaxy
    • 真空化学外延工艺
    • US4829021A
    • 1989-05-09
    • US130582
    • 1987-12-09
    • Lewis M. FraasPaul S. McLeodJohn A. Cape
    • Lewis M. FraasPaul S. McLeodJohn A. Cape
    • C30B25/02C30B25/14H01L21/205
    • C30B25/02C30B25/14C30B29/40H01L21/02395H01L21/02463H01L21/02546H01L21/02576H01L21/0262Y10S148/057Y10S148/065Y10S148/11Y10S148/169
    • An injection block having a plurality of geometrically arranged injection sources for gaseous Group III metal organic compounds is oriented substantially perpendicular to the placement of at least one semiconductor wafer substrate within a vacuum reaction chamber. The injector sources are sized to provide disbursing flow of the compounds capable of depositing a layer of about 5% uniform thickness or less over substantially the entire semiconductor wafer. An injection source of Group V compounds is located centrally within the geometrically arranged injection sources for the Group III compounds. The Group V injection source is sized to supply an excess of the Group V compounds required to react with the Group III compounds in order to form Group III-V semiconductor layers on the substrate and partition the Group III sources into groups having substantially equal numbers of injection sources. An excess of Group V comounds is injected. The vacuum within the reaction chamber is adjusted at predetermined flow rates of the Group III compounds such that a mean-free path of the Group III compounds is greater than the distance from the injection source of the Group III compounds to the substrate. The substrate is heated to a temperature to which a reaction proceeds. The unreacted Group III compounds are exhausted from the vacuum chamber adjacent the edges of a substrate holder facing the top of the chamber opposite to the injection sources. In this manner, the disbursing flow of Group III compounds from the geometric arrangement of sources uniformly overlaps substantially the entire substrate and the algebraic sum of the fluxes from the Group III compound sources remains constant across the area of the substrate upon which the layer is to be deposited.
    • 具有用于气态III族金属有机化合物的多个几何排列的注入源的注入块基本上垂直于至少一个半导体晶片衬底在真空反应室内的放置。 喷射器源的尺寸设置成提供能够在基本上整个半导体晶片上沉积约5%均匀厚度或更小厚度的层的化合物的散发流。 第V族化合物的注入源位于第III族化合物的几何排列的注入源的中心。 V族注入源的大小适于提供与III族化合物反应所需的过量的V族化合物,以便在基材上形成III-V族半导体层,并将III族源分成具有基本相同数目的 注射源。 注入超过V组。 在III族化合物的预定流速下调节反应室内的真空度,使得III族化合物的平均自由程大于从III族化合物的注入源到底物的距离。 将基底加热到反应进行的温度。 未反应的III族化合物从邻近位于与注入源相对的腔室顶部的衬底保持器的边缘的真空室中排出。 以这种方式,来自源的几何排列的III族化合物的释放流动基本上与整个基底重叠,并且来自III族化合物源的通量的代数和在层之间的基底区域保持恒定 存放
    • 8. 发明授权
    • Gas injection for uniform composition reactively sputter-deposited thin films
    • 用于均匀组成的气体注入反应溅射沉积的薄膜
    • US07141145B2
    • 2006-11-28
    • US10676105
    • 2003-10-02
    • Charles Frederick BruckerPaul S. McLeodChang Yi
    • Charles Frederick BruckerPaul S. McLeodChang Yi
    • C23C14/34
    • H01J37/3244C23C14/0063C23C14/3464
    • A method of forming a thin film on a substrate/workpiece by sputtering, comprising steps of: (a) providing an apparatus comprising a vacuum chamber including at least one sputtering source and a gas supply means for injecting a gas containing at least one reactive component into said chamber, the gas supply means comprising a plurality of differently-sized outlet orifices adapted for providing substantially the same flow rate of gas from each orifice; (b) providing a substrate/workpiece having at least one surface for formation of a thin film thereon; (c) generating a sputtered particle flux from the at least one sputtering source; (d) injecting the gas containing the at least one reactive component into the chamber via the gas supply means, such that the same gas flow rate is provided at each orifice; and (e) forming a reactively sputtered thin film on the at least one surface of the substrate/workpiece, the reactively sputtered thin film having a substantially uniform content of the at least one reactive component.
    • 一种通过溅射在衬底/工件上形成薄膜的方法,包括以下步骤:(a)提供一种包括真空室的设备,该真空室包括至少一个溅射源和气体供应装置,用于将含有至少一个反应组分 所述气体供应装置包括多个不同尺寸的出口孔口,其适于提供与每个孔口基本相同的气体流量; (b)提供具有至少一个用于在其上形成薄膜的表面的基底/工件; (c)从所述至少一个溅射源产生溅射的粒子通量; (d)经由气体供给装置将含有至少一个反应性组分的气体注入室中,使得在每个孔口处设置相同的气体流量; 和(e)在所述衬底/工件的所述至少一个表面上形成反应溅射的薄膜,所述反应溅射的薄膜具有至少一个反应组分的基本上均匀的含量。
    • 9. 发明授权
    • Method and apparatus for sputter deposition of multilayer films
    • 用于溅射沉积多层膜的方法和装置
    • US06497799B1
    • 2002-12-24
    • US09832115
    • 2001-04-11
    • Paul S. McLeod
    • Paul S. McLeod
    • C23C1434
    • C23C14/568C23C14/165
    • Apparatus for forming a multilayer film on at least one surface of a substrate comprises a vacuum chamber including: (a) a pair of parallel top and bottom walls connected by a side wall; (b) at least one entry/exit means in the side wall for insertion and withdrawal of a substrate from the chamber; (c) a plurality of spaced-apart, radially extending, linearly elongated sputtering sources arranged in a co-planar array adjacent one of the top or bottom walls of the chamber, each of the linearly elongated sputtering sources having a length and a width; and (d) a gripper/transporter for gripping and moving a substrate in a generally circular, planar path past each of the plurality of radially extending sputtering sources, such that the at least one deposition surface of the substrate faces each of the sputtering sources during movement along the circular path, for deposition of the multilayer film thereon.
    • 用于在基板的至少一个表面上形成多层膜的设备包括真空室,其包括:(a)一对由侧壁连接的平行顶壁和底壁;(b)在侧面中的至少一个入口/出口装置 壁,用于从腔室插入和取出基底;(c)多个间隔开的径向延伸的线性伸长的溅射源,其布置在邻近腔室的顶壁或底壁之一的共平面阵列中,每个 线性伸长的溅射源具有长度和宽度; 以及(d)夹持器/运送器,其用于夹持并移动通过所述多个径向延伸的溅射源中的每一个的大致圆形的平面路径中的衬底,使得所述衬底的所述至少一个沉积表面面对每个所述溅射源 沿着圆形路径的移动,用于在其上沉积多层膜。