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1. 发明授权

US07187186B2 Methods and systems for determining one or more properties of a specimen 有权
标题翻译：用于确定样品的一个或多个性质的方法和系统
公开(公告)号：US07187186B2
公开(公告)日：2007-03-06
申请号：US11078669
申请日：2005-03-10
申请人： Jianou Shi , Jeffrey Rzepiela , Shiyou Pei , Zhiwei Xu , John Alexander
发明人： Jianou Shi , Jeffrey Rzepiela , Shiyou Pei , Zhiwei Xu , John Alexander
IPC分类号： G01R31/302
CPC分类号： G01R31/311 , G01R31/2648
摘要： Various methods and systems for determining one or more properties of a specimen are provided. One system for determining a property of a specimen is configured to illuminate a specimen with different wavelengths of light substantially simultaneously. The different wavelengths of light are modulated at substantially the same frequency. The system is also configured to perform at least two measurements on the specimen. A minority carrier diffusion length of the specimen may be determined from the measurements and absorption coefficients of the specimen at the different wavelengths. Another system for detecting defects on a specimen is configured to deposit a charge at multiple locations on an upper surface of the specimen. This system is also configured to measure a vibration of a probe at the multiple locations. Defects may be detected on the specimen using a two-dimensional map of the specimen generated from the measured surface voltages.
摘要翻译：提供了用于确定样本的一个或多个属性的各种方法和系统。用于确定样本特性的一个系统被配置为基本上同时照射具有不同波长的光的样本。不同波长的光以基本上相同的频率被调制。该系统还被配置为对样本进行至少两次测量。样品的少数载流子扩散长度可以根据不同波长的样品的测量和吸收系数来确定。用于检测样本上的缺陷的另一系统被配置为在样本的上表面上的多个位置沉积电荷。该系统还被配置为测量在多个位置处的探针的振动。可以使用从测量的表面电压产生的样本的二维图来在样本上检测缺陷。

2. 发明授权

US07002287B1 Protected substrate structure for a field emission display device 失效
标题翻译：用于场发射显示装置的受保护的衬底结构
公开(公告)号：US07002287B1
公开(公告)日：2006-02-21
申请号：US09627355
申请日：2000-07-28
申请人： Bob L. Mackey , Duan A. Haven , Arthur J. Learn , John D. Porter , Theodore S. Fahlen , Shiyou Pei , William J. Cummings
发明人： Bob L. Mackey , Duan A. Haven , Arthur J. Learn , John D. Porter , Theodore S. Fahlen , Shiyou Pei , William J. Cummings
IPC分类号： H01J1/30 , H01J1/304 , H01J9/00
CPC分类号： H01J29/94 , H01J1/304 , H01J29/06 , H01J29/085 , H01J2201/02 , H01J2329/00 , H01J2329/863 , H01J2329/8645 , H01J2329/8665
摘要： A protected faceplate structure of a field emission display device is disclosed in one embodiment. Specifically, in one embodiment, the present invention recites a faceplate of a field emission display device wherein the faceplate of the field emission display device is adapted to have phosphor containing wells disposed above one side thereof. The present embodiment is further comprised of a barrier layer which is disposed over the one side of said faceplate which is adapted to have phosphor containing wells disposed thereabove. The barrier layer of the present embodiment is adapted to prevent degradation of the faceplate. Specifically, the barrier layer of the present embodiment is adapted to prevent degradation of the faceplate due to electron bombardment by electrons directed towards the phosphor containing wells.
摘要翻译：在一个实施例中公开了场致发射显示装置的受保护的面板结构。具体地说，在一个实施例中，本发明叙述了场致发射显示装置的面板，其中场致发射显示装置的面板适于在其一侧上设置含荧光体的孔。本实施例还包括设置在所述面板的一侧上的阻挡层，其适于具有设置在其上的荧光体含有孔。本实施例的阻挡层适于防止面板的劣化。具体地说，本实施例的阻挡层适于防止由于电子被引向含荧光体孔的电子轰击导致面板的劣化。

3. 发明授权

US06853129B1 Protected substrate structure for a field emission display device 失效
标题翻译：用于场发射显示装置的受保护的衬底结构
公开(公告)号：US06853129B1
公开(公告)日：2005-02-08
申请号：US10412196
申请日：2003-04-11
申请人： William J. Cummings , Kris E. Sahlstrom , Shiyou Pei , Bob L. Mackey , Arthur J. Learn , John D. Porter , Theodore S. Fahlen
发明人： William J. Cummings , Kris E. Sahlstrom , Shiyou Pei , Bob L. Mackey , Arthur J. Learn , John D. Porter , Theodore S. Fahlen
IPC分类号： H01J1/304 , H01J29/06 , H01J29/08 , H01J1/62
CPC分类号： H01J1/304 , H01J29/06 , H01J29/085 , H01J2201/02 , H01J2211/36 , H01J2329/00
摘要： A protected faceplate structure of a field emission display device is disclosed in one embodiment. Specifically, in one embodiment, the present invention recites a faceplate of a field emission display device wherein the faceplate of the field emission display device is adapted to have phosphor containing areas disposed above one side thereof. The present embodiment is further comprised of a barrier layer which is disposed over the one side of said faceplate which is adapted to have phosphor containing areas disposed thereabove. The barrier layer of the present embodiment is adapted to prevent degradation of the faceplate. Specifically, the barrier layer of the present embodiment is adapted to prevent degradation of the faceplate due to electron bombardment by electrons directed towards the phosphor containing areas.
摘要翻译：在一个实施例中公开了场致发射显示装置的受保护的面板结构。具体地说，在一个实施例中，本发明叙述场致发射显示装置的面板，其中场致发射显示装置的面板适于具有设置在其一侧上方的荧光体容纳区域。本实施例还包括阻挡层，该阻挡层设置在所述面板的一侧上，其适于具有设置在其上的荧光体容纳区域。本实施例的阻挡层适于防止面板的劣化。具体而言，本实施方式的阻挡层适于防止由于朝向含荧光体区域的电子的电子轰击引起的面板的劣化。

4. 发明申请

US20070109003A1 Test Pads, Methods and Systems for Measuring Properties of a Wafer 审中-公开
标题翻译：测试垫，测量硅片性能的方法和系统
公开(公告)号：US20070109003A1
公开(公告)日：2007-05-17
申请号：US11465888
申请日：2006-08-21
申请人： Jianou Shi , Xiafang Zhang , Shiyou Pei , Shu Huang , Dennis Yeh , Jeffrey Rzepiela , Yiping Feng , Ahmad Khan
发明人： Jianou Shi , Xiafang Zhang , Shiyou Pei , Shu Huang , Dennis Yeh , Jeffrey Rzepiela , Yiping Feng , Ahmad Khan
IPC分类号： G01R31/02
CPC分类号： G01R31/2831 , G01R31/2856 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Test pads, methods, and systems for measuring properties of a wafer are provided. One test pad formed on a wafer includes a test structure configured such that one or more electrical properties of the test structure can be measured. The test pad also includes a conductive layer formed between the test structure and the wafer. The conductive layer prevents structures located under the test structure between the conductive layer and the wafer from affecting the one or more electrical properties of the test structure during measurement. One method for assessing plasma damage of a wafer includes measuring one or more electrical properties of a test structure formed on the wafer and determining an index characterizing the plasma damage of the test structure using the one or more electrical properties.
摘要翻译：提供了用于测量晶片性能的测试垫，方法和系统。形成在晶片上的一个测试焊盘包括测试结构，其被配置为使得可以测量测试结构的一个或多个电特性。测试垫还包括在测试结构和晶片之间形成的导电层。导电层防止在测量期间位于导电层和晶片之间的测试结构下方的结构影响测试结构的一个或多个电性能。用于评估晶片的等离子体损伤的一种方法包括测量形成在晶片上的测试结构的一个或多个电特性，并使用一个或多个电性质确定表征测试结构的等离子体损伤的指标。

5. 发明申请

US20060108912A1 Protected substrate structure for a field emission dispaly device 审中-公开
标题翻译：用于场发射观测装置的受保护的衬底结构
公开(公告)号：US20060108912A1
公开(公告)日：2006-05-25
申请号：US11326266
申请日：2005-12-30
申请人： Bob Mackey , Duane Haven , Arthur Learn , John Porter , Theodore Fahlen , Shiyou Pei , William Cummings
发明人： Bob Mackey , Duane Haven , Arthur Learn , John Porter , Theodore Fahlen , Shiyou Pei , William Cummings
IPC分类号： H01J1/62
CPC分类号： H01J29/94 , H01J1/304 , H01J29/06 , H01J29/085 , H01J2201/02 , H01J2329/00 , H01J2329/863 , H01J2329/8645 , H01J2329/8665
摘要： A protected faceplate structure of a field emission display device is disclosed in one embodiment. Specifically, in one embodiment, the present invention recites a faceplate of a field emission display device wherein the faceplate of the field emission display device is adapted to have phosphor containing wells disposed above one side thereof. The present embodiment is further comprised of a barrier layer which is disposed over the one side of said faceplate which is adapted to have phosphor containing wells disposed thereabove. The barrier layer of the present embodiment is adapted to prevent degradation of the faceplate. Specifically, the barrier layer of the present embodiment is adapted to prevent degradation of the faceplate due to electron bombardment by electrons directed towards the phosphor containing wells.
摘要翻译：在一个实施例中公开了场致发射显示装置的受保护的面板结构。具体地说，在一个实施例中，本发明叙述了场致发射显示装置的面板，其中场致发射显示装置的面板适于在其一侧上设置含荧光体的孔。本实施例还包括设置在所述面板的一侧上的阻挡层，其适于具有设置在其上的荧光体含有孔。本实施例的阻挡层适于防止面板的劣化。具体地说，本实施例的阻挡层适于防止由于电子被引向含荧光体孔的电子轰击导致面板的劣化。

6. 发明授权

US07002289B1 Light-emitting device having light-emissive particles partially coated with intensity-enhancement material 失效
标题翻译：具有部分地涂有强度增强材料的发光颗粒的发光装置
公开(公告)号：US07002289B1
公开(公告)日：2006-02-21
申请号：US10952074
申请日：2004-09-27
申请人： John D. Porter , Roger A. Pearson , Kazuo Kajiwara , Haruo Kato , Lawrence S. Pan , Shiyou Pei , Theodore S. Fahlen
发明人： John D. Porter , Roger A. Pearson , Kazuo Kajiwara , Haruo Kato , Lawrence S. Pan , Shiyou Pei , Theodore S. Fahlen
IPC分类号： H01J1/62
CPC分类号： H01J1/74 , H01J1/70 , H01J29/185 , H01J29/28 , H01J29/325 , H01J29/58
摘要： A light-emitting device (52) suitable for a flat-panel cathode-ray tube display contains a light-emissive region (66) formed over a plate (64). The light-emissive region contains a plurality of light-emissive particles (72). Part of the outer surface of each of a group of the light-emissive particles is conformally covered with a group of intensity-enhancement coatings (82 and 84).
摘要翻译：适合于平板阴极射线管显示器的发光装置（52）包含形成在板（64）上的发光区域（66）。发光区域包含多个发光颗粒（72）。一组发光颗粒中的每一个的外表面的一部分由一组强度增强涂层（82和84）保形地覆盖。

7. 发明授权

US06812636B2 Light-emitting device having light-emissive particles partially coated with light-reflective or/and getter material 失效
标题翻译：具有部分被光反射或/和吸气材料涂覆的发光颗粒的发光装置
公开(公告)号：US06812636B2
公开(公告)日：2004-11-02
申请号：US09823815
申请日：2001-03-30
申请人： John D. Porter , Roger A. Pearson , Kazuo Kajiwara , Haruo Kato , Lawrence S. Pan , Shiyou Pei , Theodore S. Fahlen
发明人： John D. Porter , Roger A. Pearson , Kazuo Kajiwara , Haruo Kato , Lawrence S. Pan , Shiyou Pei , Theodore S. Fahlen
IPC分类号： H01J162
CPC分类号： H01J1/74 , H01J1/70 , H01J29/185 , H01J29/28 , H01J29/325 , H01J29/58
摘要： A light-emitting device (52) suitable for a flat-panel cathode-ray tube display contains a light-emissive region (66) formed over a plate (64). The light-emissive region contains a plurality of light-emissive particles (72). Part of the outer surface of each light-emissive particle is conformally covered with a coating (74) that provides light reflection or/and gettering.
摘要翻译：适合于平板阴极射线管显示器的发光装置（52）包含形成在板（64）上的发光区域（66）。发光区域包含多个发光颗粒（72）。每个发光颗粒的外表面的一部分共形地覆盖有提供光反射和/或吸气的涂层（74）。

8. 发明授权

US07893703B2 Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer 有权
标题翻译：用于控制在晶片上沉积电荷以测量晶片的一个或多个电性能的系统和方法
公开(公告)号：US07893703B2
公开(公告)日：2011-02-22
申请号：US11465893
申请日：2006-08-21
申请人： Jeffrey A. Rzepiela , Yiping Feng , Shiyou Pei , Alexander Kagan , Jianou Shi , Sergio Edelstein
发明人： Jeffrey A. Rzepiela , Yiping Feng , Shiyou Pei , Alexander Kagan , Jianou Shi , Sergio Edelstein
IPC分类号： G01R31/308
CPC分类号： G01R31/2831 , G01R31/2856 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer are provided. One system includes a corona source configured to deposit the charge on the wafer and a sensor configured to measure one or more conditions within the corona source. This system also includes a control subsystem configured to alter one or more parameters of the corona source based on the one or more conditions. Another system includes a corona source configured to deposit the charge on the wafer and a mixture of gases disposed within a discharge chamber of the corona source during the deposition of the charge. The mixture of gases alters one or more parameters of the charge deposited on the wafer.
摘要翻译：提供了用于控制晶片上的电荷沉积以测量晶片的一个或多个电性能的系统和方法。一个系统包括配置成将电荷沉积在晶片上的电晕源和配置成测量电晕源内的一个或多个条件的传感器。该系统还包括配置为基于一个或多个条件来改变电晕源的一个或多个参数的控制子系统。另一种系统包括电晕源，其被配置为在电荷沉积期间将电荷沉积在晶片上以及布置在电晕源的放电室内的气体混合物。气体混合物改变沉积在晶片上的电荷的一个或多个参数。

9. 发明申请

US20070126458A1 METHODS AND SYSTEMS FOR DETERMINING ONE OR MORE PROPERTIES OF A SPECIMEN 审中-公开
标题翻译：用于确定样本的一个或多个属性的方法和系统
公开(公告)号：US20070126458A1
公开(公告)日：2007-06-07
申请号：US11669209
申请日：2007-01-31
申请人： Jianou Shi , Jeffrey Rzepiela , Shiyou Pei , Zhiwei Xu , John Alexander
发明人： Jianou Shi , Jeffrey Rzepiela , Shiyou Pei , Zhiwei Xu , John Alexander
IPC分类号： G01R31/26
CPC分类号： G01R31/311 , G01R31/2648
摘要： Various methods and systems for determining one or more properties of a specimen are provided. One system for determining a property of a specimen is configured to illuminate a specimen with different wavelengths of light substantially simultaneously. The different wavelengths of light are modulated at substantially the same frequency. The system is also configured to perform at least two measurements on the specimen. A minority carrier diffusion length of the specimen may be determined from the measurements and absorption coefficients of the specimen at the different wavelengths. Another system for detecting defects on a specimen is configured to deposit a charge at multiple locations on an upper surface of the specimen. This system is also configured to measure a vibration of a probe at the multiple locations. Defects may be detected on the specimen using a two-dimensional map of the specimen generated from the measured surface voltages.
摘要翻译：提供了用于确定样本的一个或多个属性的各种方法和系统。用于确定样本特性的一个系统被配置为基本上同时照射具有不同波长的光的样本。不同波长的光以基本上相同的频率被调制。该系统还被配置为对样本进行至少两次测量。样品的少数载流子扩散长度可以根据不同波长的样品的测量和吸收系数来确定。用于检测样本上的缺陷的另一系统被配置为在样本的上表面上的多个位置沉积电荷。该系统还被配置为测量在多个位置处的探针的振动。可以使用从测量的表面电压产生的样本的二维图来在样本上检测缺陷。

10. 发明授权

US07090554B1 Fabrication of flat-panel display having spacer with rough face for inhibiting secondary electron escape 有权
标题翻译：具有用于抑制二次电子逸出的具有粗糙面的间隔物的平板显示器的制造
公开(公告)号：US07090554B1
公开(公告)日：2006-08-15
申请号：US10603415
申请日：2003-06-24
申请人： Roger W. Barton , Kollengode S. Narayanan , Bob L. Mackey , John M. Macaulay , George B. Hopple , Donald R. Schropp, Jr. , Michael J. Nystrom , Sudhakar Gopalakrishnan , Shiyou Pei , Xueping Xu
发明人： Roger W. Barton , Kollengode S. Narayanan , Bob L. Mackey , John M. Macaulay , George B. Hopple , Donald R. Schropp, Jr. , Michael J. Nystrom , Sudhakar Gopalakrishnan , Shiyou Pei , Xueping Xu
IPC分类号： H01J9/00
CPC分类号： H01J9/242 , H01J29/028 , H01J29/864 , H01J31/127 , H01J2329/863 , H01J2329/8635 , H01J2329/864 , H01J2329/8645 , H01J2329/866
摘要： A flat-panel display is fabricated by a process in which a spacer (24) having a rough face (54 or 56) is positioned between a pair of plate structure (20 and 22). When electrons strike the spacer, the roughness in the spacer's face causes the number of secondary electrons that escape the spacer to be reduced, thereby alleviating positive charge buildup on the spacer. As a result, the image produced by the display is improved. The spacer facial roughness can be achieved in various ways such as providing suitable depressions (60, 62, 64, 66, 70, 74, or 80) or/and protuberances (82, 84, 88, and 92) along the spacer's face.
摘要翻译：平板显示器是通过一种方法制造的，其中具有粗糙面（54或56）的间隔物（24）位于一对板结构（20和22）之间。当电子撞击间隔物时，间隔物表面的粗糙度导致逸出间隔物的二次电子数量减少，从而减轻间隔物上的正电荷积累。结果，改善了由显示器产生的图像。间隔件面部粗糙度可以以各种方式实现，例如沿着间隔件的表面提供合适的凹陷（60,62,64,66,70,74或80）或/和突起（82,84,88和92）。

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