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    • 1. 发明申请
    • COHERENT ANALYSIS OF ASYMMETRIC AGING AND STATISTICAL PROCESS VARIATION IN ELECTRONIC CIRCUITS
    • 电子电路不对称老化与统计过程变化的相关分析
    • US20120266123A1
    • 2012-10-18
    • US13084582
    • 2011-04-12
    • Palkesh JAINVinod MenezesFrancisco Cano
    • Palkesh JAINVinod MenezesFrancisco Cano
    • G06F9/455
    • G06F17/5009G06F17/5036
    • Coherent analysis of asymmetric aging and statistical process variation. A method of designing a circuit includes preparing an initial netlist of components in the circuit. A plurality of components is selected from the initial netlist by a first statistical process. Further, a process variation netlist is prepared by replacing a plurality of initial operating parameters of the plurality of components with a plurality of process variation operating parameters. A plurality of high stress components is then identified in the process variation netlist and an aged netlist is prepared by replacing a set of operating parameters of the plurality of high stress components with a set of degraded operating parameters. The circuit is simulated using the aged netlist. The method also includes modifying the initial netlist according to a result of simulation and repeating the foregoing steps until a desired circuit performance is obtained.
    • 不对称老化和统计过程变化的相干分析。 一种设计电路的方法包括准备电路中的元件的初始网表。 通过第一统计过程从初始网表中选择多个组件。 此外,通过用多个处理变化操作参数替换多个分量的多个初始操作参数来准备过程变化网表。 然后在过程变化网表中识别多个高应力分量,并且通过用一组降级的操作参数替换多个高应力分量的一组操作参数来制备老化的网表。 使用老化的网表模拟电路。 该方法还包括根据仿真结果修改初始网表,并重复前述步骤,直到获得所需的电路性能。
    • 2. 发明授权
    • Combined write assist and retain-till-accessed memory array bias
    • 组合写入辅助和保留直到存取存储器阵列偏置
    • US08379465B2
    • 2013-02-19
    • US12764399
    • 2010-04-21
    • Michael Patrick ClintonLakshmikantha V. HollaVinod Menezes
    • Michael Patrick ClintonLakshmikantha V. HollaVinod Menezes
    • G11C7/00G11C11/00G11C5/14
    • G11C11/413
    • Bias circuitry for a static random-access memory (SRAM) with a retain-till-accessed (RTA) mode and with write assist bias in a normal operating mode. The memory is constructed of multiple memory array blocks of SRAM cells. Bias devices are associated with each memory array block, and associated with one or more columns. Each bias device includes a diode-connected transistor in parallel with a shorting transistor, between a power supply voltage and a power supply bias node for cells in its column or columns. The shorting transistor receives control signals from control logic so that the diode-connected transistor for each column is shorted during read cycles, and in write cycles in which its columns are not selected; in write cycles in which its columns are selected, the shorting transistor in the bias device is turned off, so that a reduced power supply voltage is applied to the selected column. The shorting transistors for all columns in the block are turned off in the RTA mode. An additional transistor in series with the diode-connected transistor may be included, to enable a floating power supply bias mode.
    • 具有保持直读访问(RTA)模式的静态随机存取存储器(SRAM)的偏置电路,以及正常工作模式下的写入辅助偏置。 存储器由SRAM单元的多个存储器阵列块构成。 偏置设备与每个存储器阵列块相关联,并且与一个或多个列相关联。 每个偏置装置包括与短路晶体管并联的二极管连接的晶体管,在电源电压和用于其列或列中的单元的电源偏置节点之间。 短路晶体管接收来自控制逻辑的控制信号,使得每个列的二极管连接的晶体管在读周期期间以及在不选择其列的写周期中短路; 在选择其列的写周期中,偏置装置中的短路晶体管截止,使得降低的电源电压被施加到所选择的列。 块中所有列的短路晶体管在RTA模式下关闭。 可以包括与二极管连接的晶体管串联的附加晶体管,以实现浮置电源偏置模式。
    • 3. 发明申请
    • Combined Write Assist and Retain-Till-Accessed Memory Array Bias
    • 组合写入辅助和保留直接存取存储器阵列偏置
    • US20110261632A1
    • 2011-10-27
    • US12764399
    • 2010-04-21
    • Michael Patrick ClintonLakshmikantha V. HollaVinod Menezes
    • Michael Patrick ClintonLakshmikantha V. HollaVinod Menezes
    • G11C7/00
    • G11C11/413
    • Bias circuitry for a static random-access memory (SRAM) with a retain-till-accessed (RTA) mode and with write assist bias in a normal operating mode. The memory is constructed of multiple memory array blocks of SRAM cells. Bias devices are associated with each memory array block, and associated with one or more columns. Each bias device includes a diode-connected transistor in parallel with a shorting transistor, between a power supply voltage and a power supply bias node for cells in its column or columns. The shorting transistor receives control signals from control logic so that the diode-connected transistor for each column is shorted during read cycles, and in write cycles in which its columns are not selected; in write cycles in which its columns are selected, the shorting transistor in the bias device is turned off, so that a reduced power supply voltage is applied to the selected column. The shorting transistors for all columns in the block are turned off in the RTA mode. An additional transistor in series with the diode-connected transistor may be included, to enable a floating power supply bias mode.
    • 具有保持直读访问(RTA)模式的静态随机存取存储器(SRAM)的偏置电路,以及正常工作模式下的写入辅助偏置。 存储器由SRAM单元的多个存储器阵列块构成。 偏置设备与每个存储器阵列块相关联,并且与一个或多个列相关联。 每个偏置装置包括与短路晶体管并联的二极管连接的晶体管,在电源电压和用于其列或列中的单元的电源偏置节点之间。 短路晶体管接收来自控制逻辑的控制信号,使得每个列的二极管连接的晶体管在读周期期间以及在不选择其列的写周期中短路; 在选择其列的写周期中,偏置装置中的短路晶体管截止,使得降低的电源电压被施加到所选择的列。 块中所有列的短路晶体管在RTA模式下关闭。 可以包括与二极管连接的晶体管串联的附加晶体管,以实现浮置电源偏置模式。
    • 7. 发明申请
    • ON-DIE THEVENIN TERMINATION FOR HIGH SPEED I/O INTERFACE
    • 用于高速I / O接口的ON-DIE THEVENIN终端
    • US20100007374A1
    • 2010-01-14
    • US12172282
    • 2008-07-14
    • Rajat ChauhanKarthik RajagopalVinod Menezes
    • Rajat ChauhanKarthik RajagopalVinod Menezes
    • H03K17/16
    • H03K19/0005H04L25/0278
    • The method, system, and apparatus of on-die Thevenin termination for high speed I/O interface are disclosed. In one embodiment, a system of terminating a transmission line of a chip includes a pull-up circuit located within the chip comprising a voltage source and a positive switch device coupled with the transmission line of the chip, a pull-down circuit located within the chip comprising a ground and a negative switch device coupled with the transmission line of the chip, a resistor located within the chip coupled with the voltage source, the positive switch device, the ground, the negative switch device, and a pad coupled with the resistor to terminate the transmission line of the chip. The system may include resistors coupled in parallel with each other. The system may include an impedance module to determine a load impedance value as seen from the pad that matches a source impedance value.
    • 公开了用于高速I / O接口的片上戴维宁终端的方法,系统和装置。 在一个实施例中,终止芯片的传输线的系统包括位于芯片内的上拉电路,该上拉电路包括与芯片的传输线耦合的电压源和正开关装置,位于该芯片内的下拉电路 芯片包括与芯片的传输线耦合的接地和负开关器件,位于与电压源耦合的芯片内的电阻器,正开关器件,地,负开关器件以及与电阻器耦合的焊盘 终止芯片的传输线。 该系统可以包括彼此并联耦合的电阻。 系统可以包括阻抗模块,用于确定从焊盘看到的与源阻抗值匹配的负载阻抗值。
    • 8. 发明授权
    • Multiplexor generating a glitch free output when selecting from multiple clock signals
    • 多路复用器从多个时钟信号中选择时产生无毛刺的输出
    • US06563349B2
    • 2003-05-13
    • US09891541
    • 2001-06-27
    • Vinod MenezesRajith Kumar Mavila
    • Vinod MenezesRajith Kumar Mavila
    • H03K1700
    • G06F1/08
    • A multiplexor generating a glitch free output. A slower clock signal and sleep clock signal are respectively synchronized with positive and negative edges of the faster clock signal. The sleep signal is further synchronized with a negative edge of the slower clock signal and provided to an AND gate gating the slower clock signal based on the value of a select signal formed by the synchronized sleep signal. The slower clock signal is delayed by a number of faster clock cycles equal to the time taken by the select signal to be received at the AND gate after the sleep signal is synchronized to the slower clock signal. In an alternative embodiment, a signal control block ensures that the 0 to 1 transition on one of the select signals follows the 1 to 0 transition on another select signal when the value of the sleep signal changes. In addition, each select signal is synchronized with a negative edge of the corresponding clock signal selected.
    • 多路复用器产生无毛刺输出。 较慢的时钟信号和睡眠时钟信号分别与较快时钟信号的正和负边沿同步。 休眠信号进一步与较慢时钟信号的下降沿同步,并提供给基于由同步睡眠信号形成的选择信号的值门控较慢时钟信号的“与”门。 较慢的时钟信号被延迟了等于在睡眠信号与较慢时钟信号同步之后在与门接收的选择信号所花费的时间的更快的时钟周期。 在替代实施例中,当睡眠信号的值改变时,信号控制块确保在其中一个选择信号上的0至1转换在另一选择信号上的1至0转换之后。 此外,每个选择信号与所选择的相应时钟信号的下降沿同步。