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    • 3. 发明授权
    • Method for the production of a plurality of opto-electronic semiconductor chips and opto-electronic semiconductor chip
    • 生产多个光电子半导体芯片和光电半导体芯片的方法
    • US08017416B2
    • 2011-09-13
    • US10566955
    • 2004-07-22
    • Volker Härle
    • Volker Härle
    • H01L21/00
    • H01L33/005H01L21/02532H01L21/0262H01L21/02639H01L21/02642H01L2924/0002H01L2924/00
    • Presented is a method for the production of a plurality of optoelectronic semiconductor chips each having a plurality of structural elements with at least one semiconductor layer. The method involves providing a chip composite base that includes a substrate and a growth surface. A mask material layer is formed on the growth surface. The mask material layer includes a multiplicity of windows having an average extent of less than or equal to 1 μm. A mask material is chosen so that a semiconductor material of the semiconductor layer that is to be grown essentially cannot grow on the mask material or can grow in a substantially worse manner in comparison with the growth surface. Subsequently, semiconductor layers are deposited essentially simultaneously onto regions of the growth surface that lie within the windows. The chip composite base with applied material is singulated to form semiconductor chips.
    • 提出了一种用于制造多个具有多个具有至少一个半导体层的结构元件的光电子半导体芯片的方法。 该方法包括提供包括基底和生长表面的芯片复合基底。 在生长表面上形成掩模材料层。 掩模材料层包括平均程度小于或等于1μm的多个窗口。 选择掩模材料,使得待生长的半导体层的半导体材料基本上不能在掩模材料上生长,或者可以以与生长表面相比更差的方式生长。 随后,半导体层基本上同时沉积在位于窗内的生长表面的区域上。 将具有应用材料的芯片复合基底单片化以形成半导体芯片。
    • 8. 发明授权
    • Method of production of a patterned semiconductor layer
    • 图案化半导体层的制造方法
    • US06864112B1
    • 2005-03-08
    • US09722461
    • 2000-11-28
    • Volker Härle
    • Volker Härle
    • H01L21/20H01L21/205H01L21/306H01S5/02H01S5/026H01L21/00
    • H01L21/30604
    • The present invention relates to a method for the production of semiconductor components. This method comprises the steps of applying masking layers and components on epitaxial semiconductor substrates within the epitaxy reactor without removal of the substrate from the reactor. The masking layers may be HF soluble such that a gas etchant may be introduced within the reactor so as to etch a select number and portion of masking layers. This method may be used for production of lateral integrated components on a substrate wherein the components may be of the same or different type. Such types include electronic and optoelectronic components. Numerous masking layers may be applied, each defining particular windows intended to receive each of the various components. In the reactor, the masks may be selectively removed, then the components grown in the newly exposed windows.
    • 本发明涉及半导体元件的制造方法。 该方法包括以下步骤:在外延反应器内的外延半导体衬底上施加掩模层和组件,而不从反应器移除衬底。 掩蔽层可以是HF可溶的,使得可以在反应器内引入气体蚀刻剂,以便蚀刻选择数量和部分掩蔽层。 该方法可以用于在衬底上生产横向集成组件,其中组件可以具有相同或不同的类型。 这些类型包括电子和光电子元件。 可以应用许多掩蔽层,每个屏蔽层限定旨在接收各种部件中的每一个的特定窗口。 在反应器中,可以选择性地去除掩模,然后在新露出的窗口中生长组分。