会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Circuit and method for a Vdd level memory sense amplifier
    • 用于Vdd级存储器读出放大器的电路和方法
    • US07848166B2
    • 2010-12-07
    • US12046276
    • 2008-03-11
    • Kuoyuan Peter HsuYoung Suk KimBing WangMing Chieh Huang
    • Kuoyuan Peter HsuYoung Suk KimBing WangMing Chieh Huang
    • G11C7/08G11C7/12
    • G11C11/4091G11C7/08G11C7/12G11C11/4094G11C11/4097
    • A circuit and method for a sense amplifier for sensing the charge stored by a memory cell is disclosed. The memory cell is coupled to a bit line, a complementary bit line and a differential sense amplifier is coupled to the bit line and the complementary bit line. A control signal couples a reference voltage to the complementary bit line. A positive precharge voltage is applied to the bit line and complementary bit line prior to the sense amplifier being enabled. The memory cell outputs a voltage to the bit line responsive to a word line, and the sense amplifier senses the differential voltage between the bit line and the complementary bit line responsive to a sense enable signal. A voltage regulator for generating the reference voltage, preferably about 80% of a positive supply voltage, is disclosed. A method of sensing data stored by a memory cell is disclosed.
    • 公开了一种用于感测由存储器单元存储的电荷的读出放大器的电路和方法。 存储单元耦合到位线,互补位线和差分读出放大器耦合到位线和互补位线。 控制信号将参考电压耦合到互补位线。 在读出放大器使能之前,将正预充电电压施加到位线和互补位线。 存储单元响应于字线向位线输出电压,并且感测放大器响应于感测使能信号来感测位线和互补位线之间的差分电压。 公开了用于产生参考电压的电压调节器,优选地为正电源电压的约80%。 公开了一种感测由存储器单元存储的数据的方法。
    • 3. 发明申请
    • Circuit and Method for a Vdd Level Memory Sense Amplifier
    • 用于Vdd级存储器检测放大器的电路和方法
    • US20090231939A1
    • 2009-09-17
    • US12046276
    • 2008-03-11
    • Kuoyuan Peter HsuYoung Suk KimBing WangMing Chieh Huang
    • Kuoyuan Peter HsuYoung Suk KimBing WangMing Chieh Huang
    • G11C7/08G11C7/12
    • G11C11/4091G11C7/08G11C7/12G11C11/4094G11C11/4097
    • A circuit and method for a sense amplifier for sensing the charge stored by a memory cell is disclosed. The memory cell is coupled to a bit line, a complementary bit line and a differential sense amplifier is coupled to the bit line and the complementary bit line. A control signal couples a reference voltage to the complementary bit line. A positive precharge voltage is applied to the bit line and complementary bit line prior to the sense amplifier being enabled. The memory cell outputs a voltage to the bit line responsive to a word line, and the sense amplifier senses the differential voltage between the bit line and the complementary bit line responsive to a sense enable signal. A voltage regulator for generating the reference voltage, preferably about 80% of a positive supply voltage, is disclosed. A method of sensing data stored by a memory cell is disclosed.
    • 公开了一种用于感测由存储器单元存储的电荷的读出放大器的电路和方法。 存储单元耦合到位线,互补位线和差分读出放大器耦合到位线和互补位线。 控制信号将参考电压耦合到互补位线。 在读出放大器使能之前,将正预充电电压施加到位线和互补位线。 存储单元响应于字线向位线输出电压,并且感测放大器响应于感测使能信号来感测位线和互补位线之间的差分电压。 公开了用于产生参考电压的电压调节器,优选地为正电源电压的约80%。 公开了一种感测由存储器单元存储的数据的方法。
    • 4. 发明申请
    • Controlling Global Bit Line Pre-Charge Time for High Speed eDRAM
    • 控制高速eDRAM的全局位线预充电时间
    • US20090141570A1
    • 2009-06-04
    • US11970188
    • 2008-01-07
    • Kuoyuan (Peter) HsuBing WangYoung Suk Kim
    • Kuoyuan (Peter) HsuBing WangYoung Suk Kim
    • G11C7/00
    • G11C7/12G11C7/1048
    • A method of operating a memory includes performing a write operation and a read operation on a memory cell. The write operation includes starting a first global bit line (GBL) pre-charge on a GBL; and after the first GBL pre-charge is started, enabling a word line to write into the memory cell, wherein the steps of starting the first GBL pre-charge and enabling the word line have a first time interval. The read operation includes starting a second GBL pre-charge on the GBL; and after the second GBL pre-charge is started, enabling the word line to read from the memory cell, wherein the steps of starting the second GBL pre-charge and enabling the word line have a second time interval. The first time interval is greater than the second time interval.
    • 操作存储器的方法包括对存储器单元执行写入操作和读取操作。 写入操作包括在GBL上启动第一个全局位线(GBL)预充电; 并且在开始第一GBL预充电之后,使得字线能够写入存储单元,其中启动第一GBL预充电和启用字线的步骤具有第一时间间隔。 读取操作包括在GBL上启动第二个GBL预充电; 并且在开始第二GBL预充电之后,使得字线能够从存储器单元读取,其中启动第二GBL预充电和使字线的步骤具有第二时间间隔。 第一时间间隔大于第二时间间隔。
    • 5. 发明授权
    • Controlling global bit line pre-charge time for high speed eDRAM
    • 控制高速eDRAM的全局位线预充电时间
    • US07733724B2
    • 2010-06-08
    • US11970188
    • 2008-01-07
    • Kuoyuan (Peter) HsuBing WangYoung Suk Kim
    • Kuoyuan (Peter) HsuBing WangYoung Suk Kim
    • G11C7/00
    • G11C7/12G11C7/1048
    • A method of operating a memory includes performing a write operation and a read operation on a memory cell. The write operation includes starting a first global bit line (GBL) pre-charge on a GBL; and after the first GBL pre-charge is started, enabling a word line to write into the memory cell, wherein the steps of starting the first GBL pre-charge and enabling the word line have a first time interval. The read operation includes starting a second GBL pre-charge on the GBL; and after the second GBL pre-charge is started, enabling the word line to read from the memory cell, wherein the steps of starting the second GBL pre-charge and enabling the word line have a second time interval. The first time interval is greater than the second time interval.
    • 操作存储器的方法包括对存储器单元执行写入操作和读取操作。 写入操作包括在GBL上启动第一个全局位线(GBL)预充电; 并且在开始第一GBL预充电之后,使得字线能够写入存储单元,其中启动第一GBL预充电和启用字线的步骤具有第一时间间隔。 读取操作包括在GBL上启动第二个GBL预充电; 并且在开始第二GBL预充电之后,使得字线能够从存储器单元读取,其中启动第二GBL预充电和使字线的步骤具有第二时间间隔。 第一时间间隔大于第二时间间隔。