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1. 发明授权

US09285813B2 Supply voltage regulation with temperature scaling 有权
标题翻译：电源电压调节，温度调节
公开(公告)号：US09285813B2
公开(公告)日：2016-03-15
申请号：US14282527
申请日：2014-05-20
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Stefano Pietri , Juxiang Ren , Chris C. Dao , Anis M. Jarrar
IPC分类号： H01L35/00 , G05F1/575 , G05F1/46
CPC分类号： G05F1/575 , G05F1/463
摘要： A supply voltage regulation system for an IC including a temperature sensor that detects temperature of the IC, a scaling resistor coupled between a power grid and a feedback node of the IC, a regulator amplifier that compares a voltage of the feedback node with a reference voltage for developing a supply voltage for the IC, and a temperature scaling circuit that drives a scaling current to the scaling resistor via the feedback node to adjust the supply voltage based on temperature. The temperature scaling circuit may include one or more comparators that compare a temperature signal with corresponding temperature thresholds for selectively applying one or more bias currents to the scaling resistor. The scaling resistor may be coupled to a hot point of the power grid. A voltage difference between a hot point of a ground grid may be converted to a bias current applied to the scaling resistor.
摘要翻译：一种用于IC的电源电压调节系统，包括检测IC的温度的温度传感器，耦合在电网和IC的反馈节点之间的缩放电阻器，将反馈节点的电压与参考电压用于开发用于IC的电源电压，以及温度调节电路，其通过反馈节点驱动缩放电流到缩放电阻器，以基于温度调节电源电压。温度调节电路可以包括一个或多个比较器，其将温度信号与对应的温度阈值进行比较，以选择性地将一个或多个偏置电流施加到缩放电阻器。缩放电阻器可以耦合到电网的热点。接地电网的热点之间的电压差可以转换为施加到比例电阻器的偏置电流。

2. 发明申请

US20160003908A1 METHOD FOR TESTING COMPARATOR AND DEVICE THEREFOR 有权
公开(公告)号：US20160003908A1
公开(公告)日：2016-01-07
申请号：US14853090
申请日：2015-09-14
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Juxiang Ren , Chris C. Dao , Stefano Pietri
IPC分类号： G01R31/317 , H03K5/24
CPC分类号： G01R31/31703 , G01R31/3163 , G01R31/3167 , G01R35/00 , H03K5/24
摘要： An integrated circuit facilitates a self test routine that verifies proper operation of an analog comparator. In response to entering the self test routine, the voltage provided to an input of a comparator is changed from being at an operating voltage supply to being at a self test voltage that is used to verify operation of the comparator. In response to the comparator operating properly, the self test voltage provided to the input of the comparator is replaced with the operating voltage supply, and normal operation resumes. The duration of the self test cycle is based upon the amount of time during which the self test voltage is provided to the comparator is asynchronous in nature, and therefore not a function of a clock signal.

3. 发明授权

US09897649B2 Method for testing comparator and device therefor 有权
公开(公告)号：US09897649B2
公开(公告)日：2018-02-20
申请号：US14853090
申请日：2015-09-14
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Juxiang Ren , Chris C. Dao , Stefano Pietri
IPC分类号： G01R33/02 , H03K5/153 , G01R31/317 , G01R35/00 , G01R31/3163 , H03K5/24 , G01R31/3167
CPC分类号： G01R31/31703 , G01R31/3163 , G01R31/3167 , G01R35/00 , H03K5/24
摘要： An integrated circuit facilitates a self test routine that verifies proper operation of an analog comparator. In response to entering the self test routine, the voltage provided to an input of a comparator is changed from being at an operating voltage supply to being at a self test voltage that is used to verify operation of the comparator. In response to the comparator operating properly, the self test voltage provided to the input of the comparator is replaced with the operating voltage supply, and normal operation resumes. The duration of the self test cycle is based upon the amount of time during which the self test voltage is provided to the comparator is asynchronous in nature, and therefore not a function of a clock signal.

4. 发明授权

US09584118B1 Substrate bias circuit and method for biasing a substrate 有权
标题翻译：衬底偏置电路和偏置衬底的方法
公开(公告)号：US09584118B1
公开(公告)日：2017-02-28
申请号：US14836223
申请日：2015-08-26
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Chris C. Dao , Stefano Pietri , Juxiang Ren , Robert S. Ruth
IPC分类号： H03K17/687
CPC分类号： H03K19/00315 , G05F3/205 , G11C5/146 , G11C11/4074 , G11C11/417 , H01L27/11582 , H01L28/00 , H03K19/018514 , H03K2217/0018
摘要： A substrate bias circuit and method for biasing a substrate are provided. A substrate bias circuit includes a first voltage source, a second voltage source, a diode coupled between the first voltage source and the second voltage source, and a plurality of transistors, each transistor in the plurality of transistors having a substrate terminal. In one example, the first voltage source supplies, via the diode, the substrate terminal of a first transistor of the plurality of transistors during a power-up, and the second voltage source supplies the substrate terminal of the first transistor after the power-up.
摘要翻译：提供了一种用于偏置衬底的衬底偏置电路和方法。衬底偏置电路包括第一电压源，第二电压源，耦合在第一电压源和第二电压源之间的二极管以及多个晶体管，多个晶体管中的每个晶体管具有衬底端子。在一个示例中，第一电压源在上电期间通过二极管提供多个晶体管的第一晶体管的衬底端子，并且第二电压源在上电之后提供第一晶体管的衬底端子。

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