专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08791426B2 Electron beam diagnostic system using computed tomography and an annular sensor 有权
标题翻译：使用计算机断层扫描和环形传感器的电子束诊断系统
公开(公告)号：US08791426B2
公开(公告)日：2014-07-29
申请号：US12917028
申请日：2010-11-01
申请人： John W. Elmer , Alan T. Teruya
发明人： John W. Elmer , Alan T. Teruya
IPC分类号： H01J37/244 , G01T1/29
CPC分类号： H01J37/244 , G01T1/2914 , H01J37/315 , H01J2237/24405 , H01J2237/24542 , H01J2237/28 , H01J2237/30472
摘要： A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
摘要翻译：一种用于分析包括适于接收电子束的圆形电子束诊断传感器的电子束的系统，所述圆形电子束诊断传感器具有中心轴线; 环形传感器结构可操作地连接到圆形电子束诊断传感器，其中传感器结构接收电子束; 用于将电子束从圆形电子束诊断传感器的中心轴径向向外扫描到环形传感器结构的系统，其中电子束被环形传感器结构拦截; 以及用于测量被环形传感器结构拦截的电子束的装置。

2. 发明授权

US5554926A Modified Faraday cup 失效
标题翻译：修改法拉第杯
公开(公告)号：US5554926A
公开(公告)日：1996-09-10
申请号：US509552
申请日：1995-07-31
申请人： John W. Elmer , Alan T. Teruya , Dennis W. O'Brien
发明人： John W. Elmer , Alan T. Teruya , Dennis W. O'Brien
IPC分类号： G01R19/00 , G01R13/00
CPC分类号： G01R19/0061
摘要： A tomographic technique for measuring the current density distribution in electron beams using electron beam profile data acquired from a modified Faraday cup to create an image of the current density in high and low power beams. The modified Faraday cup includes a narrow slit and is rotated by a stepper motor and can be moved in the x, y and z directions. The beam is swept across the slit perpendicular thereto and controlled by deflection coils, and the slit rotated such that waveforms are taken every few degrees form 0.degree. to 360.degree. and the waveforms are recorded by a digitizing storage oscilloscope. Two-din-tensional and three-dimensional images of the current density distribution in the beam can be reconstructed by computer tomography from this information, providing quantitative information about the beam focus and alignment.
摘要翻译：一种用于使用从修改的法拉第杯获得的电子束轮廓数据来测量电子束中的电流密度分布以在高功率和低功率光束中产生电流密度的图像的断层摄影技术。修改后的法拉第杯包括狭窄的狭缝，并由步进电机旋转，并可在x，y和z方向上移动。光束扫过与其垂直的狭缝并由偏转线圈控制，狭缝旋转，使得波形从0°至360°每隔几度进行，波形由数字化存储示波器记录。可以通过计算机断层扫描从该信息重建光束中的电流密度分布的二维和三维图像，提供关于束聚焦和对准的定量信息。

3. 发明授权

US5468966A System for tomographic determination of the power distribution in electron beams 失效
公开(公告)号：US5468966A
公开(公告)日：1995-11-21
申请号：US283438
申请日：1994-08-01
申请人： John W. Elmer , Alan T. Teruya , Dennis W. O'Brien
发明人： John W. Elmer , Alan T. Teruya , Dennis W. O'Brien
IPC分类号： G01R19/00 , H01J37/26 , G01R13/00
CPC分类号： G01R19/0061 , H01J37/265 , H01J2237/24405 , H01J2237/282
摘要： A tomographic technique for measuring the current density distribution in electron beams using electron beam profile data acquired from a modified Faraday cup to create an image of the current density in high and low power beams. The modified Faraday cup includes a narrow slit and is rotated by a stepper motor and can be moved in the x, y and z directions. The beam is swept across the slit perpendicular thereto and controlled by deflection coils, and the slit rotated such that waveforms are taken every few degrees form 0.degree. to 360.degree. and the waveforms are recorded by a digitizing storage oscilloscope. Two-dimensional and three-dimensional images of the current density distribution in the beam can be reconstructed by computer tomography from this information, providing quantitative information about the beam focus and alignment.

4. 发明授权

US5382895A System for tomographic determination of the power distribution in electron beams 失效
标题翻译：电子束功率分布断层扫描测定系统
公开(公告)号：US5382895A
公开(公告)日：1995-01-17
申请号：US996892
申请日：1992-12-28
申请人： John W. Elmer , Alan T. Teruya , Dennis W. O'Brien
发明人： John W. Elmer , Alan T. Teruya , Dennis W. O'Brien
IPC分类号： G01R19/00 , H01J37/26 , G01R13/00 , G01T1/29
CPC分类号： G01R19/0061 , H01J37/265 , H01J2237/24405 , H01J2237/282
摘要： A tomographic technique for measuring the current density distribution in electron beams using electron beam profile data acquired from a modified Faraday cup to create an image of the current density in high and low power beams. The modified Faraday cup includes a narrow slit and is rotated by a stepper motor and can be moved in the x, y and z directions. The beam is swept across the slit perpendicular thereto and controlled by deflection coils, and the slit rotated such that waveforms are taken every few degrees form 0.degree. to 360.degree. and the waveforms are recorded by a digitizing storage oscilloscope. Two-dimensional and three-dimensional images of the current density distribution in the beam can be reconstructed by computer tomography from this information, providing quantitative information about the beam focus and alignment.
摘要翻译：一种用于使用从修改的法拉第杯获得的电子束轮廓数据来测量电子束中的电流密度分布以在高功率和低功率光束中产生电流密度的图像的断层摄影技术。修改后的法拉第杯包括狭窄的狭缝，并由步进电机旋转，并可在x，y和z方向上移动。光束扫过与其垂直的狭缝并由偏转线圈控制，狭缝旋转，使得波形从0°至360°每隔几度进行，波形由数字化存储示波器记录。可以通过计算机断层摄影从该信息重建光束中的电流密度分布的二维和三维图像，提供关于束聚焦和对准的定量信息。

5. 发明授权

US06300755B1 Enhanced modified faraday cup for determination of power density distribution of electron beams 有权
标题翻译：用于确定电子束功率密度分布的增强型改进法拉第杯
公开(公告)号：US06300755B1
公开(公告)日：2001-10-09
申请号：US09320226
申请日：1999-05-26
申请人： John W. Elmer , Alan T. Teruya
发明人： John W. Elmer , Alan T. Teruya
IPC分类号： G01N2700
CPC分类号： G01R19/0061 , H01J37/244 , H01J2237/24405
摘要： An improved tomographic technique for determining the power distribution of an electron or ion beam using electron beam profile data acquired by an enhanced modified Faraday cup to create an image of the current density in high and low power ion or electron beams. A refractory metal disk with a number of radially extending slits, one slit being about twice the width of the other slits, is placed above a Faraday cup. The electron or ion beam is swept in a circular pattern so that its path crosses each slit in a perpendicular manner, thus acquiring all the data needed for a reconstruction in one circular sweep. The enlarged slit enables orientation of the beam profile with respect to the coordinates of the welding chamber. A second disk having slits therein is positioned below the first slit disk and inside of the Faraday cup and provides a shield to eliminate the majority of secondary electrons and ions from leaving the Faraday cup. Also, a ring is located below the second slit disk to help minimize the amount of secondary electrons and ions from being produced. In addition, a beam trap is located in the Faraday cup to provide even more containment of the electron or ion beam when full beam current is being examined through the center hole of the modified Faraday cup.
摘要翻译：一种改进的断层摄影技术，用于使用由增强的改进的法拉第杯获得的电子束轮廓数据来确定电子或离子束的功率分布，以在高功率和低功率离子或电子束中产生电流密度的图像。具有多个径向延伸狭缝的难熔金属盘，一个狭缝约为另一个狭缝宽度的两倍，放置在法拉第杯的上方。电子或离子束以圆形图案扫描，使得其路径以垂直方式与每个狭缝交叉，从而获得一次循环扫描中重建所需的所有数据。放大的狭缝使得能够相对于焊接室的坐标定位光束轮廓。其中具有狭缝的第二盘定位在第一狭缝盘的下方和法拉第杯的内部，并且提供屏蔽物以消除大部分二次电子和离子离开法拉第杯。此外，环位于第二狭缝盘的下方，以帮助最小化二次电子和离子的产生量。此外，当通过修改的法拉第杯的中心孔检查全光束电流时，在法拉第杯中设置光束捕获器以提供更多的电子或离子束的容纳。

6. 发明授权

US07378830B2 Miniature modified Faraday cup for micro electron beams 失效
标题翻译：用于微电子束的微型修改法拉第杯
公开(公告)号：US07378830B2
公开(公告)日：2008-05-27
申请号：US11166716
申请日：2005-06-23
申请人： Alan T. Teruya , John W. Elmer , Todd A. Palmer , Chris C. Walton
发明人： Alan T. Teruya , John W. Elmer , Todd A. Palmer , Chris C. Walton
IPC分类号： G01N27/00
CPC分类号： H01J37/244 , G01R19/0061 , H01J2237/24405 , H01J2237/24507 , H01J2237/24514 , H01J2237/24542 , H01J2237/30472
摘要： A micro beam Faraday cup assembly includes a refractory metal layer with an odd number of thin, radially positioned traces in this refractory metal layer. Some of the radially positioned traces are located at the edge of the micro modified Faraday cup body and some of the radially positioned traces are located in the central portion of the micro modified Faraday cup body. Each set of traces is connected to a separate data acquisition channel to form multiple independent diagnostic networks. The data obtained from the two diagnostic networks are combined and inputted into a computed tomography algorithm to reconstruct the beam shape, size, and power density distribution.
摘要翻译：微型法拉第杯组件包括难熔金属层，该难熔金属层在该难熔金属层中具有奇数个薄的径向定位的迹线。一些径向定位的迹线位于微改进的法拉第杯体的边缘，并且一些径向定位的迹线位于微改进的法拉第杯体的中心部分。每组轨迹连接到单独的数据采集通道，形成多个独立的诊断网络。将从两个诊断网络获得的数据组合并输入到计算机断层摄影算法中以重建波束形状，大小和功率密度分布。

7. 发明授权

US07244950B2 Trigger probe for determining the orientation of the power distribution of an electron beam 有权
标题翻译：用于确定电子束功率分布取向的触发探头
公开(公告)号：US07244950B2
公开(公告)日：2007-07-17
申请号：US11158481
申请日：2005-06-21
申请人： John W. Elmer , Todd A. Palmer , Alan T. Teruya
发明人： John W. Elmer , Todd A. Palmer , Alan T. Teruya
IPC分类号： G01N27/00
CPC分类号： H01J37/244 , B23K15/0026 , H01J2237/24405 , H01J2237/24475 , H01J2237/2448 , H01J2237/24507 , H01J2237/3104 , H01J2237/3175
摘要： The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.
摘要翻译：本发明涉及一种用于确定异型电子束取向的探针。为了精确地计时电子束的位置，探针被设计成仅从狭窄的区域接受电子。然后将由探头产生的信号用作可操作耦合的数据采集系统的定时或触发基准。这种布置消除了狭缝几何形状的变化，焊接室壁中的附加信号馈通和数据采集系统上的第二定时或触发通道。结果，本发明通过最小化当前狭缝触发方法的不利影响，从而精确地重建电子或离子束来提高所得数据的精度。

8. 发明授权

US5583427A Tomographic determination of the power distribution in electron beams 失效
标题翻译：电子束功率分布的层析确定
公开(公告)号：US5583427A
公开(公告)日：1996-12-10
申请号：US545070
申请日：1995-10-19
申请人： Alan T. Teruya , John W. Elmer
发明人： Alan T. Teruya , John W. Elmer
IPC分类号： G01R19/00 , H01J37/26 , G01N27/00
CPC分类号： G01R19/0061 , H01J37/265 , H01J2237/24405 , H01J2237/282
摘要： A tomographic technique for determining the power distribution of an electron beam using electron beam profile data acquired from a modified Faraday cup to create an image of the current density in high and low power beams. A refractory metal disk with a number of radially extending slits is placed above a Faraday cup. The beam is swept in a circular pattern so that its path crosses each slit in a perpendicular manner, thus acquiring all the data needed for a reconstruction in one circular sweep. Also, a single computer is used to generate the signals actuating the sweep, to acquire that data, and to do the reconstruction, thus reducing the time and equipment necessary to complete the process.
摘要翻译：一种断层摄影技术，用于使用从修改的法拉第杯获得的电子束轮廓数据确定电子束的功率分布，以在高功率和低功率光束中产生电流密度的图像。具有多个径向延伸狭缝的难熔金属盘被放置在法拉第杯的上方。光束被扫描成圆形图案，使得其路径以垂直方式穿过每个狭缝，从而获得在一个循环扫描中重建所需的所有数据。此外，单个计算机用于产生致动扫描的信号，以获取该数据，并进行重建，从而减少完成该过程所需的时间和设备。

9. 发明申请

US20110121180A1 ELECTRON BEAM DIAGNOSTIC SYSTEM USING COMPUTED TOMOGRAPHY AND AN ANNULAR SENSOR 有权
标题翻译：电子束诊断系统使用计算机图形和环形传感器
公开(公告)号：US20110121180A1
公开(公告)日：2011-05-26
申请号：US12917028
申请日：2010-11-01
申请人： John W. Elmer , Alan T. Teruya
发明人： John W. Elmer , Alan T. Teruya
IPC分类号： G01T1/00
CPC分类号： H01J37/244 , G01T1/2914 , H01J37/315 , H01J2237/24405 , H01J2237/24542 , H01J2237/28 , H01J2237/30472
摘要： A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.
摘要翻译：一种用于分析包括适于接收电子束的圆形电子束诊断传感器的电子束的系统，所述圆形电子束诊断传感器具有中心轴线; 环形传感器结构可操作地连接到圆形电子束诊断传感器，其中传感器结构接收电子束; 用于将电子束从圆形电子束诊断传感器的中心轴径向向外扫描到环形传感器结构的系统，其中电子束被环形传感器结构拦截; 以及用于测量被环形传感器结构拦截的电子束的装置。

10. 发明授权

US07348568B2 Electron beam diagnostic for profiling high power beams 有权
标题翻译：用于分析高功率光束的电子束诊断
公开(公告)号：US07348568B2
公开(公告)日：2008-03-25
申请号：US11159978
申请日：2005-06-22
申请人： John W. Elmer , Todd A. Palmer , Alan T. Teruya
发明人： John W. Elmer , Todd A. Palmer , Alan T. Teruya
IPC分类号： G01K1/16
CPC分类号： G01R19/0061 , H01J37/244 , H01J2237/24405 , H01J2237/30433 , H01J2237/31
摘要： A system for characterizing high power electron beams at power levels of 10 kW and above is described. This system is comprised of a slit disk assembly having a multitude of radial slits, a conducting disk with the same number of radial slits located below the slit disk assembly, a Faraday cup assembly located below the conducting disk, and a start-stop target located proximate the slit disk assembly. In order to keep the system from over-heating during use, a heat sink is placed in close proximity to the components discussed above, and an active cooling system, using water, for example, can be integrated into the heat sink. During use, the high power beam is initially directed onto a start-stop target and after reaching its full power is translated around the slit disk assembly, wherein the beam enters the radial slits and the conducting disk radial slits and is detected at the Faraday cup assembly. A trigger probe assembly can also be integrated into the system in order to aid in the determination of the proper orientation of the beam during reconstruction. After passing over each of the slits, the beam is then rapidly translated back to the start-stop target to minimize the amount of time that the high power beam comes in contact with the slit disk assembly. The data obtained by the system is then transferred into a computer system, where a computer tomography algorithm is used to reconstruct the power density distribution of the beam.
摘要翻译：描述了用于表征功率水平为10kW及以上的高功率电子束的系统。该系统由具有多个径向狭缝的狭缝盘组件，位于狭缝盘组件下方的相同数量的径向狭缝的导电盘，位于导电盘下方的法拉第杯组件和位于靠近狭缝盘组件。为了在使用过程中保持系统过热，将散热器放置在紧邻上述部件的位置，并且使用例如水的主动冷却系统可以集成到散热器中。在使用期间，高功率光束最初被引导到起停目标上，并且在达到其全部功率之后，围绕狭缝盘组件平移，其中光束进入径向狭缝和导电盘径向狭缝，并在法拉第杯部件。触发探针组件也可以集成到系统中，以帮助确定重建过程中光束的正确定向。在通过每个狭缝之后，光束然后迅速地转回到启动 - 停止目标，以最小化高功率光束与狭缝盘组件接触的时间量。然后将由系统获得的数据传送到计算机系统中，其中使用计算机断层摄影算法来重建光束的功率密度分布。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式