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1. 发明申请

US20150022220A1 Multi-frequency Microwave Sensor for Temperature Independent Measurement of Moisture 有权
标题翻译：用于温度独立测量水分的多频微波传感器
公开(公告)号：US20150022220A1
公开(公告)日：2015-01-22
申请号：US13947644
申请日：2013-07-22
申请人： Sebastien Tixier , Michael Kon Yew Hughes
发明人： Sebastien Tixier , Michael Kon Yew Hughes
IPC分类号： G01N22/04
CPC分类号： G01N22/04 , D21F7/003 , D21G9/0036 , G01N33/346
摘要： Microwave techniques for measuring moisture and other properties of paper and related products without requiring an independent measurement of temperature are provided. A sensor directly measures the reflection or transmission of microwaves at a number of well-chosen frequencies so as to characterize the absorption spectrum of the product. The technique of measuring the parameters of a composition includes: (a) directing incident microwave radiation over a spectrum of wavelengths from an antenna upon the composition; (b) measuring the microwave radiation over the spectrum of wavelengths that emerges from the composition; (c) determining the reflected and/or transmitted transfer function; and (d) relating the transfer function of the composition to the parameters of the composition by applying a theoretic, calibrated, or hybrid model. The product moisture and temperature are extracted from the transfer function.
摘要翻译：提供微波技术，用于测量纸张和相关产品的水分和其他性能，而无需独立测量温度。传感器直接测量微波的反射或传播，其数量众所周知，以便表征产品的吸收光谱。测量组合物的参数的技术包括：（a）在组合物上从天线引导入射波长的波长的入射微波辐射; （b）测量从组合物出射的波长光谱上的微波辐射; （c）确定反射和/或传送的传递函数; 和（d）通过应用理论，校准或混合模型将组合物的转移函数与组合物的参数相关联。从传递函数中提取产品的水分和温度。

2. 发明授权

US08527212B2 Increased absorption-measurement accuracy through windowing of photon-transit times to account for scattering in continuous webs and powders 有权
标题翻译：通过打开光子传输时间来增加吸收测量精度，以考虑连续卷材和粉末中的散射
公开(公告)号：US08527212B2
公开(公告)日：2013-09-03
申请号：US13027259
申请日：2011-02-14
申请人： Michael Kon Yew Hughes , Sebastien Tixier
发明人： Michael Kon Yew Hughes , Sebastien Tixier
IPC分类号： G06F19/00 , G01N21/35
CPC分类号： G01N21/3563 , G01N21/3559 , G01N21/359 , G01N21/86 , G01N21/8901 , G01N33/346 , G01N33/442 , G01N2021/8663 , G01N2021/869 , G01N2021/8917 , G01N2201/0697 , G01N2201/128 , G01N2201/13
摘要： Radiation scattering is one of the main contributors to the uncertainty of near infrared (NIR) measurements. Enhanced absorption-measurement accuracy for NIR sensors is achieved by using a combination of NIR spectroscopy and time-of-flight techniques to select photons that are the result of a given mean free path within a moving sample target. By measuring absorption as a function of path length or by windowing signals that are attributable to excessive scattering of NIR radiation within the sample, this technique affords the calculation of more accurate and more universal calibrations. The NIR sensor employs short or ultra-short laser pulses to create NIR that is directed to the moving sample and emerging radiation is detected over time. Windowing effectively truncates non-contributing measurements.
摘要翻译：辐射散射是近红外（NIR）测量不确定度的主要原因之一。通过使用NIR光谱和飞行时间技术的组合来选择作为移动样本目标中给定平均自由程的结果的光子，实现NIR传感器增强的吸收测量精度。通过测量作为路径长度的函数的吸收，或者通过对由于样品内的NIR辐射的过度散射而引起的信号的加窗信号，该技术提供了更准确和更通用的校准的计算。 NIR传感器使用短或超短激光脉冲来产生针对移动样品的NIR，并且随着时间的推移检测出新的辐射。窗口化有效地截断了无贡献的测量。

3. 发明授权

US09581433B2 Caliper sensor and method using mid-infrared interferometry 有权
标题翻译：卡尺传感器和使用中红外干涉测量的方法
公开(公告)号：US09581433B2
公开(公告)日：2017-02-28
申请号：US14103733
申请日：2013-12-11
申请人： Sebastien Tixier , Michael Kon Yew Hughes , Stephane Savard
发明人： Sebastien Tixier , Michael Kon Yew Hughes , Stephane Savard
IPC分类号： G01B5/02 , G01B7/02 , G01B11/02 , G01B13/02 , G01B11/06
CPC分类号： G01B11/0691 , G01B9/02001 , G01B11/0633 , G01B11/0675 , G01B2210/42 , G01B2210/44 , G01B2290/65
摘要： Non-contacting caliper measurements of free standing sheets such as porous polymer and paper detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface wherein the laser beam comprises radiation having a wavelength in the 3-50 micron range and scanning the laser beam through a selected angle range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected From the exposed outer surface and from the inner surface. Thickness can be extracted from the fringe separation in the interference pattern. Rotating and focusing elements ensure that the spot position on the sheet remains the same while varying the incident angle.
摘要翻译：通过从片材的顶部和底部表面反射的光产生的自由基片材（如多孔聚合物和纸张）的非接触卡尺测量检测中红外干涉条纹。该技术包括将激光束定向到暴露的外表面上的单个点上的入射角，其中激光束包括波长在3-50微米范围内的辐射，并且将激光束扫过选定的角度范围作为激光束被引导到暴露的外表面上，并且测量从暴露的外表面和内表面反射的辐射的叠加形成的干涉图案的强度。可以从干涉图案中的边缘分离中提取厚度。旋转和聚焦元件可确保纸张上的光点位置保持不变，同时改变入射角度。

4. 发明授权

US09007589B2 Co-located porosity and caliper measurement for membranes and other web products 有权
标题翻译：用于膜和其他网状产品的共同孔隙度和卡尺测量
公开(公告)号：US09007589B2
公开(公告)日：2015-04-14
申请号：US14027883
申请日：2013-09-16
申请人： Michael Kon Yew Hughes , Sebastien Tixier , Stuart James Heath
发明人： Michael Kon Yew Hughes , Sebastien Tixier , Stuart James Heath
IPC分类号： G01B11/06 , G01N15/08 , D21F7/06 , B65H20/10
CPC分类号： G01B11/0691 , B65H20/10 , D21F7/06 , G01B7/107 , G01N15/0826 , G01N21/86 , G01N33/346 , G01N2015/086 , G01N2021/8609 , G01N2201/101
摘要： Dual mounting head scanners measure the thickness of flexible moving porous webs and employ an air clamp on the operative surface of the lower head to maintain the web in physical contact with a measurement surface. As the web is held firmly by the clamp, the vacuum level that is established is indicative of the porosity of the membrane. As compressed air is supplied to a vacuum generator at a given operational pressure, the rate of airflow through the web can be inferred from the vacuum pressure measurements. The rate of airflow through the membrane and therefore the porosity of the membrane are related to the vacuum level. It is not necessary to measure the airflow through the membrane. From the vacuum pressure measurements, the membrane's permeability can also be determined by correlation to empirical data. Thickness measurements are effected by optical triangulation and inductive proximity measurements.
摘要翻译：双重安装头扫描仪测量柔性移动多孔网的厚度，并在下头的操作表面上采用气夹，以保持网与测量表面物理接触。当网状物通过夹具牢固地固定时，建立的真空度表示膜的孔隙率。当压缩空气在给定的操作压力下被供应到真空发生器时，可以从真空压力测量推断出通过幅材的气流速率。通过膜的气流速率以及膜的孔隙率与真空度有关。没有必要测量通过膜的气流。从真空压力测量，膜的渗透性也可以通过与经验数据的相关性来确定。厚度测量通过光学三角测量和感应接近度测量来实现。

5. 发明授权

US08021517B2 Use of fluorescent nanoparticles to make on-line measurements of cross-web and machine-direction component and property variations in paper and continuous web products 有权
标题翻译：使用荧光纳米粒子可以对纸张和连续网页产品中的横幅和机器方向分量进行在线测量和性能变化
公开(公告)号：US08021517B2
公开(公告)日：2011-09-20
申请号：US12039696
申请日：2008-02-28
申请人： Michael Kon Yew Hughes , Sebastien Tixier
发明人： Michael Kon Yew Hughes , Sebastien Tixier
IPC分类号： D21H11/00
CPC分类号： D21G9/0009 , D21H17/28 , D21H17/675 , D21H17/68 , D21H21/30 , G01N21/6428
摘要： Fluorescent nanoparticles such as quantum dots are incorporated into paper and other web products such as plastics to achieve cross-direction and machine direction on-line detection of selected components during manufacture. Fluorescent nanoparticles markers are added in known proportions into product formulations along with the selected components of interest. By detecting the fluorescence from the nanoparticles, the selected components can be traced at various stages of production. In addition, by using different fluorescent nanoparticles that emit radiation at different wavelengths, data from individual materials or layers in a composite structure can be ascertained simultaneously with a single sensor. The technique is particularly suited for monitoring expensive and difficult-to-measure components that may be present only in trace quantities. The technique can be implemented continuously during normal production, during start-up or re-formulation, such as a grade change in paper production, when considerable changes in the process parameters occur.
摘要翻译：诸如量子点之类的荧光纳米颗粒被结合到纸和其它纤维产品如塑料中以在制造过程中实现所选部件的横向和机器方向在线检测。以已知比例将荧光纳米颗粒标记物与所选择的组分一起加入到产品制剂中。通过检测来自纳米颗粒的荧光，所选择的组分可以在生产的各个阶段进行追踪。此外，通过使用发射不同波长的辐射的不同荧光纳米粒子，可以使用单个传感器同时确定复合结构中单个材料或层的数据。该技术特别适用于监测可能仅以痕量存在的昂贵且难以测量的成分。该技术可以在正常生产期间，在启动或重新配置期间连续实施，例如纸张生产中的等级变化，当过程参数出现相当大的变化时。

6. 发明授权

US09182360B2 Multi-frequency microwave sensor for temperature independent measurement of moisture 有权
标题翻译：多频微波传感器用于温度独立测量水分
公开(公告)号：US09182360B2
公开(公告)日：2015-11-10
申请号：US13947644
申请日：2013-07-22
申请人： Sebastien Tixier , Michael Kon Yew Hughes
发明人： Sebastien Tixier , Michael Kon Yew Hughes
IPC分类号： G01N22/00 , G01N22/04 , D21F7/00 , D21G9/00 , G01N33/34
CPC分类号： G01N22/04 , D21F7/003 , D21G9/0036 , G01N33/346
摘要： Microwave techniques for measuring moisture and other properties of paper and related products without requiring an independent measurement of temperature are provided. A sensor directly measures the reflection or transmission of microwaves at a number of well-chosen frequencies so as to characterize the absorption spectrum of the product. The technique of measuring the parameters of a composition includes: (a) directing incident microwave radiation over a spectrum of wavelengths from an antenna upon the composition; (b) measuring the microwave radiation over the spectrum of wavelengths that emerges from the composition; (c) determining the reflected and/or transmitted transfer function; and (d) relating the transfer function of the composition to the parameters of the composition by applying a theoretic, calibrated, or hybrid model. The product moisture and temperature are extracted from the transfer function.
摘要翻译：提供微波技术，用于测量纸张和相关产品的水分和其他性能，而无需独立测量温度。传感器直接测量微波的反射或传播，其数量众所周知，以便表征产品的吸收光谱。测量组合物的参数的技术包括：（a）在组合物上从天线引导入射波长的波长的入射微波辐射; （b）测量从组合物出射的波长光谱上的微波辐射; （c）确定反射和/或传送的传递函数; 和（d）通过应用理论，校准或混合模型将组合物的转移函数与组合物的参数相关联。从传递函数中提取产品的水分和温度。

7. 发明授权

US07858953B2 Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices 有权
标题翻译：使用荧光纳米颗粒来测量多层膜中的单层厚度或组成，并校准二次测量装置
公开(公告)号：US07858953B2
公开(公告)日：2010-12-28
申请号：US12125932
申请日：2008-05-23
申请人： Michael Kon Yew Hughes , Sebastien Tixier
发明人： Michael Kon Yew Hughes , Sebastien Tixier
IPC分类号： G01N21/64
CPC分类号： G01J1/58 , B32B37/153 , B32B41/00 , B32B2041/04 , B32B2305/30 , B32B2309/105 , D21F7/06 , G01B11/0658 , G01B11/0683 , G01B11/0691 , G01N21/64 , G01N21/8422 , G01N2021/8411 , G01N2021/8438
摘要： Fluorescent nanoparticles such as quantum dots are incorporated into plastic, paper and other web layered products to achieve cross-direction and machine direction on-line analysis of the individual layers therein. Fluorescent nanoparticles markers are added in known proportions into product formulations. By detecting the fluorescence from the nanoparticles, the thickness and other physical characteristics of the web can be traced at various stages of production. In addition, by using different populations of fluorescent nanoparticles that emit radiation at different wavelengths, data from individual layers in a composite structure can be ascertained simultaneously with a single sensor. The technique is particularly suited for monitoring difficult-to-measure polymers in complex multilayer structures.
摘要翻译：将诸如量子点的荧光纳米颗粒结合到塑料，纸和其他纤维网分层产品中以实现其中各层的横向和机器方向的在线分析。将荧光纳米颗粒标记物以已知比例加入到产品制剂中。通过检测来自纳米颗粒的荧光，幅材的厚度和其他物理特性可以在生产的各个阶段进行追踪。此外，通过使用发射不同波长的辐射的不同荧光纳米粒子，可以使用单个传感器同时确定复合结构中各层的数据。该技术特别适用于在复杂多层结构中监测难以测量的聚合物。

8. 发明申请

US20090289199A1 Use of Fluorescent Nanoparticles to Measure Individual Layer Thicknesses or Composition in Multi-layer Films and to Calibrate Secondary Measurement Devices 有权
标题翻译：使用荧光纳米颗粒测量多层膜中的单层厚度或组成并校准二次测量设备
公开(公告)号：US20090289199A1
公开(公告)日：2009-11-26
申请号：US12125932
申请日：2008-05-23
申请人： Michael Kon Yew Hughes , Sebastien Tixier
发明人： Michael Kon Yew Hughes , Sebastien Tixier
IPC分类号： G01J1/58
CPC分类号： G01J1/58 , B32B37/153 , B32B41/00 , B32B2041/04 , B32B2305/30 , B32B2309/105 , D21F7/06 , G01B11/0658 , G01B11/0683 , G01B11/0691 , G01N21/64 , G01N21/8422 , G01N2021/8411 , G01N2021/8438
摘要： Fluorescent nanoparticles such as quantum dots are incorporated into plastic, paper and other web layered products to achieve cross-direction and machine direction on-line analysis of the individual layers therein. Fluorescent nanoparticles markers are added in known proportions into product formulations. By detecting the fluorescence from the nanoparticles, the thickness and other physical characteristics of the web can be traced at various stages of production. In addition, by using different populations of fluorescent nanoparticles that emit radiation at different wavelengths, data from individual layers in a composite structure can be ascertained simultaneously with a single sensor. The technique is particularly suited for monitoring difficult-to-measure polymers in complex multilayer structures.
摘要翻译：将诸如量子点的荧光纳米颗粒结合到塑料，纸和其他纤维网分层产品中以实现其中各层的横向和机器方向的在线分析。将荧光纳米颗粒标记物以已知比例加入到产品制剂中。通过检测来自纳米颗粒的荧光，幅材的厚度和其他物理特性可以在生产的各个阶段进行追踪。此外，通过使用发射不同波长的辐射的不同荧光纳米粒子，可以使用单个传感器同时确定复合结构中各层的数据。该技术特别适用于在复杂多层结构中监测难以测量的聚合物。

9. 发明申请

US20150253127A1 Thickness Determination of Web Product by Mid-infrared Wavelength Scanning Interferometry 审中-公开
标题翻译：通过中红外波长扫描干涉测量法测定网页产品的厚度
公开(公告)号：US20150253127A1
公开(公告)日：2015-09-10
申请号：US14197181
申请日：2014-03-04
申请人： Michael Kon Yew Hughes , Sebastien Tixier , Stephane Savard
发明人： Michael Kon Yew Hughes , Sebastien Tixier , Stephane Savard
IPC分类号： G01B11/06
CPC分类号： G01B11/0691 , G01B11/0625 , G01B2210/46
摘要： Non-contacting caliper measurements of free-standing sheets detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface and scanning the laser beam through a selected wavelength range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected from the exposed outer surface and from the inner surface. Alternatively, the intensity of an interference pattern formed from the superposition of radiation that is directly transmitted through the web and radiation that is transmitted through the web after internal reflections from the internal surfaces of the web. Thickness can be extracted from the fringe separation in the interference pattern.
摘要翻译：独立纸张的非接触式卡尺测量法检测由片材的顶部和底部表面反射的光产生的中红外干涉条纹。该技术包括将激光束以选定的入射角定向到暴露的外表面上的单个点上，并且当激光束被引导到暴露的外表面上并且测量干涉强度时，将激光束扫过选定的波长范围从暴露的外表面和内表面反射的辐射的叠加形成的图案。或者，由内部反射从网的内表面通过幅材直接透过的辐射叠加形成的干涉图案的强度和透过纸幅的辐射。可以从干涉图案中的边缘分离中提取厚度。

10. 发明申请

US20150159995A1 Caliper sensor and method using mid-infrared interferometry 有权
标题翻译：卡尺传感器和使用中红外干涉测量的方法
公开(公告)号：US20150159995A1
公开(公告)日：2015-06-11
申请号：US14103733
申请日：2013-12-11
申请人： Sebastien Tixier , Michael Kon Yew Hughes , Stephane Savard
发明人： Sebastien Tixier , Michael Kon Yew Hughes , Stephane Savard
IPC分类号： G01B11/06
CPC分类号： G01B11/0691 , G01B9/02001 , G01B11/0633 , G01B11/0675 , G01B2210/42 , G01B2210/44 , G01B2290/65
摘要： Non-contacting caliper measurements of free standing sheets such as porous polymer and paper detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface wherein the laser beam comprises radiation having a wavelength in the 3-50 micron range and scanning the laser beam through a selected angle range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected From the exposed outer surface and from the inner surface. Thickness can be extracted from the fringe separation in the interference pattern. Rotating and focusing elements ensure that the spot position on the sheet remains the same while varying the incident angle.
摘要翻译：通过从片材的顶部和底部表面反射的光产生的自由基片材（如多孔聚合物和纸张）的非接触卡尺测量检测中红外干涉条纹。该技术包括将激光束定向到暴露的外表面上的单个点上的入射角，其中激光束包括波长在3-50微米范围内的辐射，并且将激光束扫过选定的角度范围作为激光束被引导到暴露的外表面上，并且测量从暴露的外表面和内表面反射的辐射的叠加形成的干涉图案的强度。可以从干涉图案中的边缘分离中提取厚度。旋转和聚焦元件可确保纸张上的光点位置保持不变，同时改变入射角度。

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