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    • 6. 发明申请
    • METHOD FOR MEASURING REFRACTIVE INDEX, REFRACTIVE INDEX MEASURING DEVICE, AND METHOD FOR PRODUCING OPTICAL ELEMENT
    • 用于测量折射率指标,折射率测量装置的方法和用于生产光学元件的方法
    • US20160153901A1
    • 2016-06-02
    • US14900595
    • 2014-06-18
    • CANON KABUSHIKI KAISHA
    • Tomohiro Sugimoto
    • G01N21/45G01M11/02
    • G01N21/45G01M11/0228G01N2201/13
    • The refractive index of a test object is measured with high precision.The present invention relates to a method for measuring a refractive index of a test object by splitting light from a light source into test light and reference light and measuring interference light resulting from interference between the reference light and the test light transmitted through the test object. In the method, the test object is arranged in a medium whose group refractive index is equal to a group refractive index of the test object at a particular wavelength, interference light is measured, the particular wavelength is determined based on a wavelength dependence of a phase difference between the test light and the reference light, and the group refractive index of the medium corresponding to the particular wavelength is calculated as the group refractive index of the test object corresponding to the particular wavelength.
    • 以高精度测量被测物的折射率。 本发明涉及一种通过将来自光源的光分解为测试光和参考光并测量由参考光与通过测试对象透射的测试光之间的干扰而产生的干涉光来测量被测物体的折射率的方法。 在该方法中,测试对象被布置在其特定波长的组折射率等于测试对象的组折射率的介质中,测量干涉光,特定波长基于相位的波长依赖性来确定 将测试光与参考光之间的差异以及对应于特定波长的介质的组折射率计算为对应于特定波长的测试对象的组折射率。