专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US5111043A Apparatus for material surface observation 失效
标题翻译：用于材料表面观察的装置
公开(公告)号：US5111043A
公开(公告)日：1992-05-05
申请号：US639129
申请日：1991-01-09
申请人： Naoto Shigenaka , Tsuneyuki Hashimoto , Motomasa Fuse
发明人： Naoto Shigenaka , Tsuneyuki Hashimoto , Motomasa Fuse
IPC分类号： G01Q30/02 , H01J37/28
CPC分类号： H01J37/28 , H01J2237/244
摘要： An apparatus of material surface observation related to the present invention is a scanning electron microscope which is combined with an accelerator of charged particles. The material surface is activated by irradiation of the charged particles and a surface reaction is induced. Secondary electron in generated by irradiation of the scanning electron beam depending on a shape of the material surface. The secondary electron generated by the irradiation of the scanning electron beam is discriminated from the secondary electrode generated by the irradiation of the charged particles, and only a signal of the secondary electron generated by the irradiation of the scanning electron beam is visualized. Consequently, a reaction process of the material surface which is activated or is reaction-induced by the irradiation of the charged particles can be observed in atomic level with less noise.
摘要翻译：与本发明有关的材料表面观察装置是与带电粒子的加速器结合的扫描型电子显微镜。材料表面通过照射带电粒子而被激活，并引起表面反应。根据材料表面的形状通过扫描电子束的照射而产生的二次电子。通过照射扫描电子束产生的二次电子与通过照射带电粒子产生的二次电极区分开，只有通过扫描电子束的照射产生的二次电子的信号被可视化。因此，能够以较小的噪音以原子级观察被激发的物质表面或被带电粒子的照射反应的反应过程。

2. 发明授权

US5991906A Semiconductor integrated circuit device and its test method 失效
标题翻译：半导体集成电路器件及其测试方法
公开(公告)号：US5991906A
公开(公告)日：1999-11-23
申请号：US9257
申请日：1998-01-20
申请人： Tsuneyuki Hashimoto
发明人： Tsuneyuki Hashimoto
IPC分类号： G01R31/28 , G01R31/3185
CPC分类号： G01R31/318527
摘要： In a semiconductor integrated circuit device having a test circuit, the test time can be shortened and further the circuit activation ratio can be increased, while reducing the circuit scale. In the operation test mode, the counter circuit (10) is divided into the first counter circuit (10a) and the second counter circuit (10b) by use of the test circuit (20). Further, the same input count clock CK is inputted at the same time to both the first and second counter circuits (10a, 10b) in parallel. The normal operation of the counter circuit (10) can be discriminated by checking whether the output signal A of the first counter circuit (10a) matches the output signal B of the second counter circuit (10b) or not.
摘要翻译：在具有测试电路的半导体集成电路器件中，可以缩短测试时间，并且在减小电路规模的同时可以进一步提高电路激活率。在操作测试模式中，通过使用测试电路（20）将计数器电路（10）分成第一计数器电路（10a）和第二计数器电路（10b）。此外，相同的输入计数时钟CK被同时输入到第一和第二计数器电路（10a，10b）并行。可以通过检查第一计数器电路（10a）的输出信号A是否与第二计数器电路（10b）的输出信号B匹配来鉴别计数器电路（10）的正常操作。

3. 发明授权

US5596615A Fuel assembly for nuclear reactor and manufacturing method thereof 失效
标题翻译：核反应堆燃料组件及其制造方法
公开(公告)号：US5596615A
公开(公告)日：1997-01-21
申请号：US404041
申请日：1995-03-14
申请人： Kiyomi Nakamura , Masahisa Inagaki , Syouko Tanikoshi , Hideo Maki , Tsuneyuki Hashimoto
发明人： Kiyomi Nakamura , Masahisa Inagaki , Syouko Tanikoshi , Hideo Maki , Tsuneyuki Hashimoto
IPC分类号： G21C3/06 , C22C1/04 , C22C16/00 , G21C3/07 , G21C3/20 , G21C3/30 , G21C3/34 , G21C3/60
CPC分类号： G21C3/60 , C22C1/0491 , C22C16/00 , B22F2998/10 , Y02E30/38 , Y10S376/90
摘要： A fuel assembly avoiding the generation of irradiation damage, a Zr alloy used for the same, and a manufacturing method thereof. According to one embodiment, a super-saturated solid-solution Zr alloy powder having a crystal grain size in the range of 1000 nm or less and containing Fe, Ni and Cr is prepared by mechanical alloying, and the alloy powder is subjected to HIP, hot-working, cold-working and final heat-treatment.
摘要翻译：一种避免产生照射损伤的燃料组件，用于其的Zr合金及其制造方法。根据一个实施方案，通过机械合金化制备晶体尺寸在1000nm以下且含有Fe，Ni和Cr的超饱和固溶体Zr合金粉末，并将合金粉末进行HIP，热加工，冷加工和最终热处理。

4. 发明授权

US4803356A Method and apparatus for measuring degree of vacuum in an electron microscope 失效
标题翻译：用于在电子显微镜中测量真空度的方法和装置
公开(公告)号：US4803356A
公开(公告)日：1989-02-07
申请号：US70549
申请日：1987-07-07
申请人： Hiroki Kumahora , Tsuneyuki Hashimoto , Eiichi Nishimura
发明人： Hiroki Kumahora , Tsuneyuki Hashimoto , Eiichi Nishimura
IPC分类号： G01L21/32 , G01N23/225 , H01J37/18 , H01J37/26 , H01J41/04 , G21K1/00
CPC分类号： H01J37/18
摘要： The present invention comprises disposing an electrode group consisting of an anode and cathodes provided on both sides of the anode at a portion where the degree of vacuum in an electron microscope is to be measured closing in thermal electrons between the electrode group and a magnetic field forming lens systems such as objective lens system, condenser lens system and the like of the electron microscope, collecting a gas ionized by the thermal electrons closed therebetween to measure an ionic current, thereby realizing measurement of a degree of vacuum on a sample specimen part or thereabout without deteriorating a performance of the electrons microscope. For generating the thermal electron, for example, an observing electron beam of the electron microscope is collided with cathodes of the electrode group. For measuring the degree of vacuum on the sample specimen part of thereabout, the anode is disposed between an objective lens pole piece and a sample specimen holder stage and the objective lens pole piece and the sample specimen holder stage are used as cathodes so that the degree of vacuum can simply be measured thereby.
摘要翻译：本发明包括将由阳极组成的电极组和设置在阳极两侧的阴极的电极组和磁场形成之间的热电子闭合的电子显微镜中的真空度进行测量的部分透镜系统如电子显微镜的物镜系统，聚光透镜系统等，收集由其间封闭的热电子离子化的气体来测量离子电流，从而实现对样品部分或其上的真空度的测量而不会劣化电子显微镜的性能。为了产生热电子，例如，电子显微镜的观察电子束与电极组的阴极相撞。为了测量其上的样品部分的真空度，将阳极设置在物镜极片和样品保持台之间，并且将物镜极片和样品保持台用作阴极，使得程度可以简单地测量真空度。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式