会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Process for the classification of objects
    • 物体分类过程
    • US5950180A
    • 1999-09-07
    • US530381
    • 1995-10-10
    • Thomas WagnerFriedrich BobelNorbert BauerHermann Haken
    • Thomas WagnerFriedrich BobelNorbert BauerHermann Haken
    • G06F15/18G06K9/66G06N3/00G06T7/00
    • G06K9/6255
    • A method of classifying objects in a system having an electrical signal receiver scans the objects to be classified and outputs for each object M scanned values, and an evaluation unit evaluates the M scanned values and classifies the objects into classes. Classification takes place by performing a learning process to learn adjoint prototypes corresponding to the classes, wherein an adjoint prototype is learned for each of the classes through minimization of a potential function. A classifying process is then performed wherein an object to be classified is assigned to one of the classes, according to a potential function, corresponding to the learned adjoint prototypes.
    • PCT No.PCT / DE94 / 00396 Sec。 371 1995年10月10日第 102(e)日期1995年10月10日PCT 1994年4月11日PCT PCT。 出版物WO94 / 24635 日期1994年10月27日一种对具有电信号接收器的系统中的对象进行分类的方法,扫描要分类的对象,并为每个对象M扫描的值输出,并且评估单元评估M扫描值并将对象分类。 通过执行学习过程来学习对应于类的伴侣原型进行分类,其中通过最小化潜在函数来为每个类学习伴随原型。 然后,根据与学习的伴侣原型对应的潜在功能,执行分类处理,其中要分类的对象被分配给一个类。
    • 2. 发明授权
    • Electronic component
    • 电子元器件
    • US5654579A
    • 1997-08-05
    • US424451
    • 1995-06-16
    • Norbert BauerFriedrich BobelHermann Haken
    • Norbert BauerFriedrich BobelHermann Haken
    • H01L27/14G01J1/44G01R19/165G06F15/18G06G7/12G06N3/063H01L27/15H01L29/36H01L29/66H01L33/00H01L35/00H01L41/08H01S5/00H01S5/026H01L45/00G06G7/00H03K19/14H03K19/23
    • H01L29/66992H01L27/15H01L29/36
    • Described is an electronic component with N input terminals, which admit N input signals, M output terminals, each of which is assigned to one or more input terminals, a component body in which, depending on the input signals, current paths or filaments are created which connect the N input terminals with the M output terminals, wherein, to establish a decision or displacement dynamics, an external quantity applied to the component switches the current flow through the component body between an initial distribution, in which the current densities (j.sub.i) between each input terminal and its assigned output terminal correspond to the input signal admitted at the respective input terminal, and a self-organizing distribution, in which the current flows only between the input terminal admitting the input signal with the highest value and its assigned output terminal.
    • PCT No.PCT / DE93 / 01039 Sec。 371日期:1995年6月16日 102(e)日期1995年6月16日PCT提交1993年10月29日PCT公布。 公开号WO94 / 10755 日期1994年5月11日描述的是具有N个输入端子的电子部件,其允许N个输入信号,M个输出端子,每个输入端子被分配给一个或多个输入端子,其中根据输入信号,电流路径 或者产生将N个输入端子与M个输出端子连接的灯丝,其中,为了建立决定或位移动力学,施加到部件的外部数量在初始分布之间切换通过部件主体的电流,其中电流 每个输入端与其分配的输出端之间的密度(ji)对应于在相应输入端允许的输入信号,以及自组织分布,其中电流仅在允许具有最高值的输入信号的输入端之间流动 及其分配的输出端子。
    • 3. 发明授权
    • Method and arrangement for determining the layer-thickness and the
substrate temperature during coating
    • 用于确定涂层期间层厚度和基材温度的方法和装置
    • US5564830A
    • 1996-10-15
    • US183176
    • 1994-01-18
    • Friedrich BobelNorbert Bauer
    • Friedrich BobelNorbert Bauer
    • G01B11/06G01J5/00G01J5/62
    • G01J5/0003G01B11/0633G01J5/0007G01J2001/4242G01J2005/0048G01J2005/0074G01J5/0834
    • The invention describes a procedure and an arrangement for measurement of temperature and thickness of layer during a deposition or coating process. As coating or depositing processes known technologies of semi-conductor manufacturing arrangements, plasma devices, ion devices, and other dry-etching arrangements may be used. The invention can also be applied to the manufacture of optical coatings. As a consequence of interference of the thermal radiation of the substrate at the growing layer, the emissivity .epsilon. changes continuously during coating or depositing, therefore, a pyrometric measurement of temperature may not be applied. This basic problem is solved by the invention, which uses a reflectometer, which determines the reflectivity R of the wafer. According to the law of conservation of energy .epsilon.=1-R so that with said reflectometer the actual emissivity of the whole (multi-layer) system may be determined. The measurement of temperature then is effected by means of a determination equation. Concurrently the thickness is determined by a comparison of the reflectometer-curve and a theoretical dependency of thickness of layer.
    • 本发明描述了在沉积或涂覆过程期间测量层的温度和厚度的过程和布置。 作为涂覆或沉积工艺,已知有半导体制造布置的技术,可以使用等离子体装置,离子装置和其它干蚀刻装置。 本发明也可以应用于光学涂层的制造。 由于衬底在生长层处的热辐射的干扰,发射率ε在涂覆或沉积期间连续变化,因此,可能不会进行温度测量。 本发明解决了这个基本问题,本发明使用了确定晶片的反射率R的反射计。 根据能量守恒定律ε= 1-R,因此与所述反射计相比,可以确定整个(多层)系统的实际发射率。 然后通过测定方程来测量温度。 同时,通过比较反射计曲线和层厚度的理论依赖性来确定厚度。
    • 5. 发明授权
    • Semiconductor production control and/or measuring unit
    • 半导体生产控制和/或测量单元
    • US5153674A
    • 1992-10-06
    • US652150
    • 1991-02-07
    • Friedrich BobelNorbert Bauer
    • Friedrich BobelNorbert Bauer
    • G01N21/64G01N21/85H01L21/00
    • G01N21/6456H01L21/67253G01N21/85G01N2201/0696
    • A semiconductor production control and measuring unit for a two-dimensional detection and control of concentration and pressure distribution of process particles within a process chamber, which forms part of a semiconductor production device and in the interior of which a vacuum can be generated with the aid of a vacuum pump. A light fan source produces a substantially parallel light fan within the process chamber, the light fan penetrating the area of the process chamber which is to be examined with regard to concentration distribution or pressure distribution, the wavelength of the light emitted by the light fan source being so short that the process particle have imparted thereto an excitation energy sufficient for fluorescent radiation. A camera is disposed at an angle with respect to the light fan and it covers the area to be examined. In the spectral region of the fluorescent radiation of the process particles, the camera has a quantum efficiency which detects the fluorescent radiation. A processing device is connected to the camera and determines the two-dimensional concentration and pressure distribution of the process particles on the basis of the image signals received from the camera.
    • 一种用于二维检测和控制处理室内的处理颗粒的浓度和压力分布的半导体生产控制和测量单元,其形成半导体生产装置的一部分,并且其内部可以借助于其产生真空 的真空泵。 光风扇源在处理室内产生基本上平行的光风扇,光风扇关于浓度分布或压力分布渗透待检查处理室的区域,光风扇源发出的光的波长 太短,使得工艺颗粒赋予足够用于荧光辐射的激发能。 照相机相对于光风扇以一定角度设置,并且其覆盖待检查的区域。 在过程颗粒的荧光辐射的光谱区域中,相机具有检测荧光辐射的量子效率。 处理装置连接到照相机,并且基于从照相机接收的图像信号确定处理颗粒的二维浓度和压力分布。
    • 9. 发明授权
    • Leading sheave mine winding engine with improved cooling air conduction
    • 领先的滑轮矿井绕组发动机具有改善的冷却空气传导性
    • US07451963B2
    • 2008-11-18
    • US11660983
    • 2005-09-08
    • Rainer FinkenbuschNorbert BauerRolf HeepFrank Kristek
    • Rainer FinkenbuschNorbert BauerRolf HeepFrank Kristek
    • B66D1/26
    • B66B15/08B66B11/043
    • The invention relates to a Koepe winder or drum winder comprising an electric motor (5) for driving winding ropes (11). The rotor (6) of said motor is connected to the cylinder jacket (4) of the Koepe winder (2) and the stator frame (7) is fixed on a support structure that has a hollow shaft (3). The winder is characterised by an improved ventilation system. The motor (5) is located inside the cylinder jacket (4) in a cavity (12) between the plates (13) of the Koepe winder (2), said cavity being supplied with cooling air to ventilate the motor (5) from the exterior The hollow shaft (3) is formed by two half-shafts (18, 19), which together with at least one support disc (8) and the stator frame (7) form the support structure (10).
    • 本发明涉及一种包括用于驱动卷绕绳索(11)的电动马达(5)的柯佩卷绕机或滚筒卷取机。 所述电动机的转子(6)连接到Koepe络纱机(2)的气缸套(4),定子架(7)固定在具有中空轴(3)的支撑结构上。 卷绕机的特点是改进了通风系统。 电动机(5)位于气缸套(4)内部位于Koepe络纱机(2)的板(13)之间的空腔(12)中,所述空腔被供应冷却空气以使马达(5)从 外部空心轴(3)由两个半轴(18,19)形成,其与至少一个支撑盘(8)和定子框架(7)一起形成支撑结构(10)。