会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明申请
    • LIGHT-EMITTING DEVICE INCLUDING QUANTUM DOTS
    • 发光装置,包括量子点
    • US20110140075A1
    • 2011-06-16
    • US12896856
    • 2010-10-02
    • Zhaoqun ZHOUPeter T. KazlasMead MisicZoran PopovicJohn Spencer Morris
    • Zhaoqun ZHOUPeter T. KazlasMead MisicZoran PopovicJohn Spencer Morris
    • H01L33/04B82Y99/00
    • H01L51/5012B82Y20/00H01L51/5048H01L51/5088H01L2251/552
    • A light emitting device including an emissive material comprising quantum dots is disclosed. In one embodiment, the device includes a cathode, a layer comprising a material capable of transporting and injection electrons comprising an inorganic material, an emissive layer comprising quantum dots, a layer comprising a material capable of transporting holes, a layer comprising a hole injection material, and an anode. In certain embodiments, the hole injection material can be a p-type doped hole transport material. In certain preferred embodiments, quantum dots comprise semiconductor nanocrystals. In another aspect of the invention, there is provided a light emitting device wherein the device has an initial turn-on voltage that is not greater than 1240/λ, wherein λ represents the wavelength (nm) of light emitted by the emissive layer. Other light emitting devices and a method are disclosed.
    • 公开了包括包含量子点的发射材料的发光器件。 在一个实施例中,该器件包括阴极,包含能够传输和注入包含无机材料的电子的材料的层,包含量子点的发射层,包含能够传输空穴的材料的层,包括空穴注入材料 ,和阳极。 在某些实施例中,空穴注入材料可以是p型掺杂的空穴传输材料。 在某些优选实施例中,量子点包括半导体纳米晶体。 在本发明的另一方面,提供了一种发光器件,其中器件具有不大于1240 /λ的初始导通电压,其中λ表示由发射层发射的光的波长(nm)。 公开了其它发光器件和方法。
    • 10. 发明申请
    • Contactless system and method for detecting defective points on a chargeable surface
    • 用于检测可充电表面上的缺陷点的非接触式系统和方法
    • US20070080693A1
    • 2007-04-12
    • US11247576
    • 2005-10-11
    • Johann JungingerZoran PopovicSurendar Jeyadev
    • Johann JungingerZoran PopovicSurendar Jeyadev
    • G01N27/60
    • G03G15/751G03G15/55
    • A method for detecting charge defect spots (CDSs) on a chargeable surface is provided, including charging the chargeable surface to receive and hold a first voltage charge, spacing a surface of a scanner probe a distance from the chargeable surface, the scanner probe having a diameter, and biasing the scanner probe to a second voltage charge within a predetermined voltage threshold of the first voltage charge, wherein a parallel plate capacitor is established with the chargeable surface and a dielectric substance between the scanner probe and the chargeable surface. The method further includes reading with the scanner probe potentials associated with charges induced from the applied charges and any CDSs on the chargeable surface, including sensing the potentials and generating a signal corresponding to the sensing, applying a reference charge to the chargeable surface, and determining the potential of a CDS on the chargeable surface based on the scanner probe readings and at least one of the applied charges, which includes correcting for non-uniform charge distribution caused by a point-like nature of the CDS on the chargeable surface.
    • 提供了一种用于检测可充电表面上的电荷缺陷点(CDS)的方法,包括对可充电表面充电以接收和保持第一电荷电荷,将扫描器探针的表面与可充电表面间隔一定距离,扫描仪探针具有 并且将扫描仪探针偏置到第一电压电荷的预定电压阈值内的第二电压电荷,其中与可充电表面建立平行板电容器,并且在扫描仪探针与可充电表面之间建立介电物质。 该方法还包括利用扫描器探针电位读取与所施加的电荷和可计费表面上的任何CDS相关的电荷,包括感测电位并产生对应于感测的信号,向可计费表面施加参考电荷,以及确定 基于扫描器探针读数和所施加的电荷中的至少一个,可充电表面上的CDS的电位,其包括校正由可充电表面上的CDS的点状特性引起的不均匀的电荷分布。