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    • 5. 发明申请
    • SOLID-STATE IMAGING APPARATUS AND SEMICONDUCTOR DEVICE
    • 固态成像装置和半导体器件
    • US20150236712A1
    • 2015-08-20
    • US14702492
    • 2015-05-01
    • RENESAS ELECTRONICS CORPORATION
    • Shunsuke OKURAFukashi MORISHITA
    • H03M1/46H04N5/378
    • H03M1/468H03M1/38H03M1/46H03M1/804H04N5/374H04N5/37455H04N5/378
    • The present invention provides a small-sized inexpensive solid-state imaging apparatus. A D/A converter included in a successive comparison type A/D converter of the solid-state imaging apparatus includes a multiplexer which selects any of reference voltages VR0 to VR16 and sets it as an analog reference signal when coarse A/D conversion is performed, and which selects reference voltages VR (n−1) to VR (n+2) of the reference voltages VR0 to VR16 when fine A/D conversion is performed, and a capacitor array which generates an analog reference signal, based on the reference voltages VR (n−1) to VR (n+2) when the fine A/D conversion is performed. It is thus possible to reduce settling errors in reference voltage without using redundant capacitors.
    • 本发明提供一种小型便宜的固态成像装置。 包括在固态成像装置的连续比较型A / D转换器中的AD / A转换器包括多路复用器,其选择参考电压VR0至VR16中的任何一个,并且当执行粗略A / D转换时将其设置为模拟参考信号, 并且当执行精细的A / D转换时,其选择参考电压VR0至VR16的参考电压VR(n-1)至VR(n + 2),以及基于参考电压产生模拟参考信号的电容器阵列 当进行精细的A / D转换时,VR(n-1)至VR(n + 2)。 因此,可以在不使用冗余电容器的情况下降低参考电压的稳定误差。
    • 7. 发明申请
    • SOLID-STATE IMAGING DEVICE
    • US20180152656A1
    • 2018-05-31
    • US15797085
    • 2017-10-30
    • Renesas Electronics Corporation
    • Osamu MATSUMOTOFukashi MORISHITA
    • H04N5/378H03M1/46
    • H04N5/378H03M1/123H03M1/46H03M1/466H03M1/682H03M1/765H04N5/37455
    • Provided is a solid-state imaging device capable of increasing the speed of an A/D converter. The solid-state imaging device includes a successive approximation A/D converter that performs A/D conversion on an analog pixel signal. The successive approximation A/D converter includes a D/A converter, a comparator, and a successive approximation register. The D/A converter converts a digital reference signal to an analog reference signal. The successive approximation register operates based on the result of comparison by the comparator to generate the digital reference signal in such a manner that the analog reference signal approximates the analog pixel signal. The D/A converter includes a split capacitor, first capacitors, second capacitors, a switch array, a third capacitor, and a multiplexer. The first capacitors each have a first electrode coupled to the output node. The second capacitors are coupled to a second electrode of the split capacitor. The switch array is coupled to a second electrode of each of the first and second capacitors and is adapted to generate the analog reference signal at the output node by selectively applying a first reference voltage. The third capacitor is coupled to the second electrode of the split capacitor. The multiplexer is coupled to a second electrode of the third capacitor and is adapted to generate the analog reference signal at the output node by selectively applying a second reference voltage.
    • 9. 发明申请
    • SOLID-STATE IMAGE SENSING DEVICE AND ELECTRONIC DEVICE
    • 固态图像感测装置和电子装置
    • US20150304578A1
    • 2015-10-22
    • US14689913
    • 2015-04-17
    • Renesas Electronics Corporation
    • Shunsuke OKURAFukashi MORISHITA
    • H04N5/363H04N5/374
    • H04N5/378H04N5/363H04N5/374H04N5/3765
    • The present invention provides a technique for achieving higher picture quality of a captured image by reducing noise which occurs at the time of resetting in a solid-state image sensing device and the like. A pixel array in a solid-state image sensing device includes a plurality of pixels and includes an OB pixel region and an effective pixel region. The solid-state image sensing device has a signal processing unit outputting a pixel signal of each of the pixels in the effective pixel region on the basis of the signal level of a signal output from each of the pixels. The solid-state image sensing device obtains a signal without applying a reset signal to each of the pixels in the OB pixel region, obtains the difference between the signal and a signal of a pixel in the effective pixel region, and outputs an image signal.
    • 本发明提供了一种通过减少在固态图像感测装置等中复位时发生的噪声来获得拍摄图像的更高图像质量的技术。 固态图像感测装置中的像素阵列包括多个像素,并且包括OB像素区域和有效像素区域。 固态图像感测装置具有信号处理单元,其基于从每个像素输出的信号的信号电平,输出有效像素区域中的每个像素的像素信号。 固态图像感测装置获取信号而不对OB像素区域中的每个像素施加复位信号,获得有效像素区域中的信号与像素的信号之间的差,并输出图像信号。
    • 10. 发明申请
    • SOLID-STATE IMAGING APPARATUS AND SEMICONDUCTOR DEVICE
    • 固态成像装置和半导体器件
    • US20140362273A1
    • 2014-12-11
    • US14301120
    • 2014-06-10
    • RENESAS ELECTRONICS CORPORATION
    • Shunsuke OKURAFukashi MORISHITA
    • H04N5/3745H04N5/374
    • H03M1/468H03M1/38H03M1/46H03M1/804H04N5/374H04N5/37455H04N5/378
    • The present invention provides a small-sized inexpensive solid-state imaging apparatus. A D/A converter included in a successive comparison type A/D converter of the solid-state imaging apparatus includes a multiplexer which selects any of reference voltages VR0 to VR16 and sets it as an analog reference signal when coarse A/D conversion is performed, and which selects reference voltages VR (n−1) to VR (n+2) of the reference voltages VR0 to VR16 when fine A/C conversion is performed, and a capacitor array which generates an analog reference signal, based on the reference voltages VR (n−1) to VR (n+2) when the fine A/D conversion is performed. It is thus possible to reduce settling errors in reference voltage without using redundant capacitors.
    • 本发明提供一种小型便宜的固态成像装置。 包括在固态成像装置的连续比较型A / D转换器中的AD / A转换器包括多路复用器,其选择参考电压VR0至VR16中的任何一个,并且当执行粗略A / D转换时将其设置为模拟参考信号, 并且当执行精细的A / C转换时,其选择参考电压VR0至VR16的参考电压VR(n-1)至VR(n + 2),以及基于参考电压产生模拟参考信号的电容器阵列 当进行精细的A / D转换时,VR(n-1)至VR(n + 2)。 因此,可以在不使用冗余电容器的情况下降低参考电压的稳定误差。