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    • 5. 发明授权
    • Analog to digital converters, image sensor systems, and methods of operating the same
    • 模数转换器,图像传感器系统及其操作方法
    • US08810676B2
    • 2014-08-19
    • US13270968
    • 2011-10-11
    • Seung-Hyun LimKwi-Sung YooKyoung-Min KohYu-Jin ParkChi-Ho HwangYong Lim
    • Seung-Hyun LimKwi-Sung YooKyoung-Min KohYu-Jin ParkChi-Ho HwangYong Lim
    • H04N5/228
    • H03M1/144H03M1/56H04N5/378
    • An analog to digital converter (ADC) can include a multi-input comparison unit configured to compare a pixel voltage from an image sensor, a comparison voltage comprising a stepped voltage modified during a coarse mode of operation, and a ramp voltage comprising a ramped voltage modified to one another during a fine mode of operation, to provide a comparison result signal that indicates whether the comparison voltage combined with the ramp voltage is greater than or less than the pixel voltage. A selection control signal generation unit can receive the comparison result signal and a mode control signal, to indicate the coarse or fine mode, to provide a selection control signal allowing modification of the comparison voltage in the coarse mode and to hold the comparison voltage constant in the fine mode. A reference voltage selection unit can receive the selection control signal to control modification of the comparison voltage.
    • 模数转换器(ADC)可以包括多输入比较单元,其被配置为比较来自图像传感器的像素电压,包括在粗略操作模式期间修改的阶梯电压的比较电压和包括斜坡电压的斜坡电压 在精细操作模式下彼此修改,以提供指示与斜坡电压组合的比较电压是否大于或小于像素电压的比较结果信号。 选择控制信号生成单元可以接收比较结果信号和模式控制信号,以指示粗略或精细模式,以提供允许修改粗略模式中的比较电压并且保持比较电压恒定的选择控制信号 精细模式。 参考电压选择单元可以接收选择控制信号以控制比较电压的修改。
    • 6. 发明申请
    • Charge trap flash memory device and memory card and system including the same
    • 充电陷阱闪存设备和存储卡及系统包括相同
    • US20080246078A1
    • 2008-10-09
    • US12080315
    • 2008-04-02
    • Zong-liang HuoIn-seok YeoSeung-Hyun LimKyong-hee JooJun-kyu Yang
    • Zong-liang HuoIn-seok YeoSeung-Hyun LimKyong-hee JooJun-kyu Yang
    • H01L29/792
    • H01L21/28273B82Y10/00H01L29/42332H01L29/7881
    • A charge trap flash memory device and method of making same are provided. The device includes: a tunnel insulating layer, a charge trap layer; a blocking insulating layer; and a gate electrode sequentially formed on a substrate. The charge trap layer includes: plural trap layers comprising a first material having a first band gap energy level; spaced apart nanodots, each nanodot being at least partially surrounded by at least one of the trap layers, wherein the nanodots comprise a second material having a second band gap energy level that is lower than the first band gap energy level; and an intermediate blocking layer comprising a third material having a third band gap energy level that is higher than the first band gap energy level, formed between at least two of the trap layers. This structure prevents loss of charges from the charge trap layer and improves charge storage capacity.
    • 提供了一种电荷阱闪存器件及其制造方法。 该器件包括:隧道绝缘层,电荷陷阱层; 阻挡绝缘层; 以及依次形成在基板上的栅电极。 电荷陷阱层包括:多个陷阱层,包括具有第一带隙能级的第一材料; 间隔开的纳米点,每个纳米点至少部分地被至少一个捕获层包围,其中该纳米点包括具有低于第一带隙能级的第二带隙能级的第二材料; 以及中间阻挡层,其包括形成在至少两个捕获层之间的具有高于第一带隙能级的第三带隙能级的第三材料。 这种结构防止电荷陷阱层的电荷损失并且改善电荷存储容量。