会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • NONVOLATILE SEMICONDUCTOR STORAGE DEVICE
    • 非易失性半导体存储器件
    • US20120155169A1
    • 2012-06-21
    • US13364496
    • 2012-02-02
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • G11C16/04
    • G11C16/10G11C11/5628G11C29/00
    • A nonvolatile semiconductor storage device storing plural data bits in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data. In a first write operation processing data in the first unit, logic of one of the higher-order and the lower-order bit is fixed, and two multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the memory cell in a pseudo binary state. In a second write operation processing data in a second unit larger than the first unit, plural input data bits in a multivalued state and parity data for error correction in the second unit are stored in the memory cell.
    • 一种非易失性半导体存储装置,其通过分配从第一单位中的一对数据中选择的高阶位和从所述一对数据中的另一个中选择的低位位选择多位数据来存储多个数据位在一个存储单元中 。 在第一单元中处理数据的第一写入操作中,高阶和低位中的一个的逻辑是固定的,并且分配两个阈值电压之间的差最大化的多值数据,从而存储一位输入 存储单元中的伪二进制状态的数据。 在第二写入操作中,处理大于第一单元的第二单元中的数据,多值状态中的多个输入数据位和第二单元中用于纠错的奇偶校验数据被存储在存储单元中。
    • 2. 发明授权
    • Nonvolatile semiconductor storage device
    • 非易失性半导体存储器件
    • US08130545B2
    • 2012-03-06
    • US12938435
    • 2010-11-03
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • G11C11/34G11C16/04
    • G11C16/10G11C11/5628G11C29/00
    • A nonvolatile semiconductor storage device capable of storing a plurality of bits of data in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data to each threshold voltage of the memory cell, wherein in a first write operation that processes data in the first unit, the logic of one of the higher-order bit and the lower-order bit is fixed, and two pieces of multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the one memory cell in a pseudo binary state, and in a second write operation that processes data in a second unit larger than the first unit, a plurality of bits of input data is stored in the one memory cell in a multivalued state, and parity data for error correction in the second unit is stored in the memory cell.
    • 一种非易失性半导体存储装置,其能够通过分配具有从第一单位中选择的一对数据中的一个中选择的高阶位的多值数据和从另一个存储单元中选择的低位位来存储多个数据位在一个存储单元中 所述数据对与所述存储单元的每个阈值电压相关,其中在处理所述第一单元中的数据的第一写入操作中,所述高位和低位中的一个的逻辑被固定,并且两个 分配最大化阈值电压之间的差异的多值数据,从而将一位存储单元中的一位输入数据存储在伪二进制状态,并且在第二写入操作中处理大于第一单元的第二单元中的数据 输入数据的多个位以多值状态存储在一个存储单元中,第二单元中用于纠错的奇偶校验数据被存储在存储单元中。
    • 3. 发明授权
    • Nonvolatile semiconductor storage device
    • 非易失性半导体存储器件
    • US07843728B2
    • 2010-11-30
    • US12272161
    • 2008-11-17
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • G11C16/04
    • G11C16/10G11C11/5628G11C29/00
    • A nonvolatile semiconductor storage device capable of storing a plurality of bits of data in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data to each threshold voltage of the memory cell, wherein in a first write operation that processes data in the first unit, the logic of one of the higher-order bit and the lower-order bit is fixed, and two pieces of multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the one memory cell in a pseudo binary state, and in a second write operation that processes data in a second unit larger than the first unit, a plurality of bits of input data is stored in the one memory cell in a multivalued state, and parity data for error correction in the second unit is stored in the memory cell.
    • 一种非易失性半导体存储装置,其能够通过分配具有从第一单位中选择的一对数据中的一个中选择的高阶位的多值数据和从另一个存储单元中选择的低位位来存储多个数据位在一个存储单元中 所述数据对与所述存储单元的每个阈值电压相关,其中在处理所述第一单元中的数据的第一写入操作中,所述高位和低位中的一个的逻辑被固定,并且两个 分配最大化阈值电压之间的差异的多值数据,从而将一位存储单元中的一位输入数据存储在伪二进制状态,并且在第二写入操作中处理大于第一单元的第二单元中的数据 输入数据的多个位以多值状态存储在一个存储单元中,第二单元中用于纠错的奇偶校验数据被存储在存储单元中。
    • 10. 发明申请
    • IRON OXIDE-ZIRCONIA COMPOSITE OXIDE AND METHOD FOR PRODUCING SAME, AND EXHAUST GAS PURIFICATION CATALYST
    • 氧化铁 - 氧化锆氧化物及其制造方法和排气净化催化剂
    • US20150080211A1
    • 2015-03-19
    • US14384283
    • 2013-04-26
    • Masahide MiuraAtsushi TanakaTakahiro SuzukiTadashi SuzukiToshitaka TanabeNaoki Takahashi
    • Masahide MiuraAtsushi TanakaTakahiro SuzukiTadashi SuzukiToshitaka TanabeNaoki Takahashi
    • B01J23/89B01J23/83B01J23/745
    • B01J23/894B01J21/066B01J23/10B01J23/745B01J23/83B01J35/0006B01J35/002B01J37/0248B01J37/03C01G25/00C01G49/0018C01G49/0054C01P2002/72C01P2004/03C01P2004/32C01P2004/45C01P2004/61C01P2006/12
    • A composite oxide with a high oxygen storage capacity is provided without using cerium. The composite oxide is an iron oxide-zirconia composite oxide containing iron, zirconium, and a rare-earth element. The total content of Fe2O3, ZrO2, and an oxide of the rare-earth element is not less than 90 mass %, the content of an iron oxide in terms of Fe2O3 is 10 to 90 mass %, and the absolute value of the covariance COV(Fe, Zr+X) of the composite oxide, which has been baked in the atmosphere at a temperature of greater than or equal to 900° C. for 5 hours or more, determined by the following Formulae (1) to (3), is not greater than 20:  [ Math .  1 ]  R i  ( Fe ) = I i  ( Fe ) × 100 I i  ( Fe ) + I i  ( Zr ) + I i  ( X ) ( 1 )  R i  ( Zr + X ) = { I i  ( Zr ) + I i  ( X ) } × 100 I i  ( Fe ) + I i  ( Zr ) + I i  ( X ) ( 2 ) COV  ( Fe , Zr + X ) = 1 n  ∑ i = 1 n   [ { R i  ( Fe ) - R av  ( Fe ) } × { R i  ( Zr + X ) - R av  ( Zr + X ) } ] ( 3 ) (in the formula, Ii(Fe), Ii(Zr), and Ii(X) respectively represent the ratios of the X-ray intensities of iron, zirconium, and the rare-earth element measured at a measurement point i (where i=1 to n) to the 100% intensities of the respective elements as measured by subjecting the composite oxide to a ray analysis through EPMA (WDX: wavelength dispersive X-ray spectrometry), where Rav(Fe) and Rav(Zr+X) represent the mean values of Ri(Fe) and Ri(Zr+X), respectively, at all measurement points n).
    • 提供具有高储氧能力的复合氧化物,而不使用铈。 复合氧化物是含有铁,锆和稀土元素的氧化铁 - 氧化锆复合氧化物。 Fe2O3,ZrO2和稀土类元素的氧化物的总含量为90质量%以上,Fe 2 O 3的氧化铁含量为10〜90质量%,协方差COV的绝对值 (1)〜(3)确定的复合氧化物的(Fe,Zr + X),其在大气中在大于或等于900℃的温度下烘烤5小时以上, ,不大于20: (Fe)= I(Fe)×100 I i(Fe)+ I(Zr)+ I(X)(1)R i(Zr + X )(I)(X)(X)(2)COV(Fe,Zr + X) )= 1 nΣi = 1 n[{R i(Fe)-R av(Fe)}×{R i(Zr + X)-R av(Zr + X)}] 3)(式中,Ii(Fe),Ii(Zr)和Ii(X)分别表示在测量点i测量的铁,锆和稀土元素的X射线强度的比例 其中i = 1至n)相对于通过EPMA(WDX:波长色散X射线光谱法)对复合氧化物进行射线分析测量的各元素的100%强度,其中Rav(Fe)和Rav(Zr + X)分别表示在所有测量点n处的Ri(Fe)和Ri(Zr + X)的平均值。