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    • 1. 发明申请
    • NONVOLATILE SEMICONDUCTOR STORAGE DEVICE
    • 非易失性半导体存储器件
    • US20120155169A1
    • 2012-06-21
    • US13364496
    • 2012-02-02
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • G11C16/04
    • G11C16/10G11C11/5628G11C29/00
    • A nonvolatile semiconductor storage device storing plural data bits in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data. In a first write operation processing data in the first unit, logic of one of the higher-order and the lower-order bit is fixed, and two multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the memory cell in a pseudo binary state. In a second write operation processing data in a second unit larger than the first unit, plural input data bits in a multivalued state and parity data for error correction in the second unit are stored in the memory cell.
    • 一种非易失性半导体存储装置,其通过分配从第一单位中的一对数据中选择的高阶位和从所述一对数据中的另一个中选择的低位位选择多位数据来存储多个数据位在一个存储单元中 。 在第一单元中处理数据的第一写入操作中,高阶和低位中的一个的逻辑是固定的,并且分配两个阈值电压之间的差最大化的多值数据,从而存储一位输入 存储单元中的伪二进制状态的数据。 在第二写入操作中,处理大于第一单元的第二单元中的数据,多值状态中的多个输入数据位和第二单元中用于纠错的奇偶校验数据被存储在存储单元中。
    • 2. 发明授权
    • Nonvolatile semiconductor storage device
    • 非易失性半导体存储器件
    • US08130545B2
    • 2012-03-06
    • US12938435
    • 2010-11-03
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • G11C11/34G11C16/04
    • G11C16/10G11C11/5628G11C29/00
    • A nonvolatile semiconductor storage device capable of storing a plurality of bits of data in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data to each threshold voltage of the memory cell, wherein in a first write operation that processes data in the first unit, the logic of one of the higher-order bit and the lower-order bit is fixed, and two pieces of multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the one memory cell in a pseudo binary state, and in a second write operation that processes data in a second unit larger than the first unit, a plurality of bits of input data is stored in the one memory cell in a multivalued state, and parity data for error correction in the second unit is stored in the memory cell.
    • 一种非易失性半导体存储装置,其能够通过分配具有从第一单位中选择的一对数据中的一个中选择的高阶位的多值数据和从另一个存储单元中选择的低位位来存储多个数据位在一个存储单元中 所述数据对与所述存储单元的每个阈值电压相关,其中在处理所述第一单元中的数据的第一写入操作中,所述高位和低位中的一个的逻辑被固定,并且两个 分配最大化阈值电压之间的差异的多值数据,从而将一位存储单元中的一位输入数据存储在伪二进制状态,并且在第二写入操作中处理大于第一单元的第二单元中的数据 输入数据的多个位以多值状态存储在一个存储单元中,第二单元中用于纠错的奇偶校验数据被存储在存储单元中。
    • 3. 发明授权
    • Nonvolatile semiconductor storage device
    • 非易失性半导体存储器件
    • US07843728B2
    • 2010-11-30
    • US12272161
    • 2008-11-17
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • Yasuhiko HondaTakahiro SuzukiMasao IwamotoKiyochika Kinjo
    • G11C16/04
    • G11C16/10G11C11/5628G11C29/00
    • A nonvolatile semiconductor storage device capable of storing a plurality of bits of data in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data to each threshold voltage of the memory cell, wherein in a first write operation that processes data in the first unit, the logic of one of the higher-order bit and the lower-order bit is fixed, and two pieces of multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the one memory cell in a pseudo binary state, and in a second write operation that processes data in a second unit larger than the first unit, a plurality of bits of input data is stored in the one memory cell in a multivalued state, and parity data for error correction in the second unit is stored in the memory cell.
    • 一种非易失性半导体存储装置,其能够通过分配具有从第一单位中选择的一对数据中的一个中选择的高阶位的多值数据和从另一个存储单元中选择的低位位来存储多个数据位在一个存储单元中 所述数据对与所述存储单元的每个阈值电压相关,其中在处理所述第一单元中的数据的第一写入操作中,所述高位和低位中的一个的逻辑被固定,并且两个 分配最大化阈值电压之间的差异的多值数据,从而将一位存储单元中的一位输入数据存储在伪二进制状态,并且在第二写入操作中处理大于第一单元的第二单元中的数据 输入数据的多个位以多值状态存储在一个存储单元中,第二单元中用于纠错的奇偶校验数据被存储在存储单元中。
    • 6. 发明申请
    • REGENERATED CUTTING BLADE AND SHEARING TYPE GRINDER
    • 再生切割刀片和剪切型磨床
    • US20150251188A1
    • 2015-09-10
    • US14417344
    • 2012-08-28
    • Naoya WadaNaoki UenoYasuhiko HondaIsao Nagai
    • Naoya WadaNaoki UenoYasuhiko HondaIsao Nagai
    • B02C18/18B02C18/14
    • B02C18/184B02C18/142B02C18/145
    • To present a regenerated cutting blade, capable of regenerating efficiently by saving the cost and labor for regenerating a cutting blade, and improved in the grinding efficiency of a shearing type grinder to be close to that of a new cutting blade, when mounted and used in a shearing type grinder, including a fixed part 125, and a blade tip 127 projecting outward from this fixed part 125, in which the blade tip 127 has a leading end edge 109 pointed toward the rotating direction, and side edges 110 on the lateral side outer periphery including the blade tip 127, the leading end edge 109 and the side edges 110 are regenerated and formed by build-up welding, and the lateral sides are provided with slip preventive build-up welding parts 111, 112, 113 of the workpiece extending from the side edges 110 toward the central side of its rotation or the central direction, being formed by three regenerating processes.
    • 为了提供能够通过节省用于再生切割刀片的成本和劳动力而有效地再生的再生切割刀片,并且将剪切式研磨机的研磨效率提高为接近于新的切割刀片的磨削效率,当安装和使用时 包括固定部分125的剪切式研磨机以及从该固定部125向外突出的叶片尖端127,其中叶片尖端127具有朝向旋转方向指向的前端边缘109,侧面侧的侧边缘110 包括叶片尖端127,前端缘109和侧边缘110的外周边通过堆积焊接再生和形成,并且侧边设置有工件的防滑成型焊接部111,112,113 从侧边缘110向其旋转中心方向或中心方向延伸,由三个再生过程形成。
    • 7. 发明授权
    • Nonvolatile semiconductor memory including charge accumulation layer and control gate
    • 非易失性半导体存储器,包括电荷累积层和控制栅极
    • US07924620B2
    • 2011-04-12
    • US12543161
    • 2009-08-18
    • Yasuhiko Honda
    • Yasuhiko Honda
    • G11C16/00
    • G11C8/08G11C16/0483G11C16/10
    • A nonvolatile semiconductor memory includes a transistor, a first MOS, a second MOS, a first voltage circuit, and a second voltage circuit. The transistor includes a accumulation layer, a control gate, and a first impurity diffused layer. The first MOS includes a first electrode and a second layer. The second MOS includes a second electrode and a third layer, after the channels being formed, the first MOS and the second MOS being cut off. The first voltage circuit applies a first voltage to an active region to generate a forward bias. The second voltage circuit applies a second voltage, and a third voltage to the control gate of the transistor, after the first voltage circuit charges the first to third impurity diffused layer to the first voltage, the second voltage circuit applying the second voltage and the third voltage to the control gate of the transistor.
    • 非易失性半导体存储器包括晶体管,第一MOS,第二MOS,第一电压电路和第二电压电路。 晶体管包括累积层,控制栅极和第一杂质扩散层。 第一MOS包括第一电极和第二层。 第二MOS包括第二电极和第三层,在形成沟道之后,第一MOS和第二MOS被截止。 第一电压电路向有源区域施加第一电压以产生正向偏置。 在第一电压电路将第一至第三杂质扩散层充电至第一电压之后,第二电压电路将第二电压和第三电压施加到晶体管的控制栅极,施加第二电压的第二电压电路和施加第二电压的第二电压电路 电压到晶体管的控制栅极。