会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明授权
    • Illumination device for an optical viewing apparatus
    • 用于光学观察装置的照明装置
    • US09568722B2
    • 2017-02-14
    • US14752693
    • 2015-06-26
    • Carl Zeiss Meditec AG
    • Peter ReimerDaniel KolsterFranz MerzStefan Meinkuss
    • G02B21/06G02B21/08G02B21/12G02B21/00
    • G02B21/06G02B21/0012G02B21/082G02B21/125
    • An illumination device for an optical viewing apparatus has a light source including a first individual light source and a second individual light source arranged in a plane. The first individual light source has a first midpoint and the second individual light source has a second midpoint. An axial direction is defined by a vector from the second midpoint to the first midpoint. An illumination optical unit defines an optical axis which is arranged perpendicularly to the plane and intersects the plane at an intersection point. The light source is imaged toward infinity by the illumination optical unit. The first individual light source has an extent along the axial direction. The midpoint is offset by an amount (Δ) in a positive direction along the axial direction relative to the intersection. The relationship 0.1*L1≦Δ≦1*L1 is satisfied for the offset.
    • 用于光学观察装置的照明装置具有包括布置在平面中的第一单独光源和第二单独光源的光源。 第一单独光源具有第一中点,而第二单独光源具有第二中点。 轴向方向由从第二中点到第一中点的矢量定义。 照明光学单元限定垂直于该平面配置的光轴,并且在交叉点处与平面相交。 光源通过照明光学单元向无穷远成像。 第一单独的光源具有沿着轴向的程度。 中点相对于交叉点沿轴向的正方向偏移量(Δ)。 偏移量满足关系式为0.1 *L1≤Δ≤1* L1。
    • 6. 发明申请
    • ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD
    • 工具波形测量系统和方法
    • US20150300913A1
    • 2015-10-22
    • US14560932
    • 2014-12-04
    • APPLIED MATERIALS ISRAEL LTD.
    • Boris GolbergAmir Moshe SagivHaim FeldmanUriel MalulAdam Baer
    • G01M11/02
    • G01M11/00G01N21/8806G01N21/9501G01N2021/95676G02B21/125
    • An on-tool measurement system and a method for measuring optical system's wavefront (WF) aberrations are disclosed. The on-tool measurement system includes an optical setup comprising a moveable deflection element further comprising a highly transparent region. The deflection element includes a first surface configured to project a first image of at least one object onto a sensor and the highly transparent region includes a second surface configured to project a second image of the at least one object onto the sensor. The on-tool measurement system includes a sensor configured to capture the first and second images and a controller configured to measure differential displacements between the first and second images at each deflection element position and to calculate the optical setup local WF gradients that depend on the measured differential displacements.
    • 公开了一种工具测量系统和用于测量光学系统的波前(WF)像差的方法。 工具测量系统包括光学装置,其包括还包括高度透明区域的可移动偏转元件。 偏转元件包括被配置为将至少一个物体的第一图像突出到传感器上的第一表面,并且高透明区域包括配置成将至少一个物体的第二图像投影到传感器上的第二表面。 工具测量系统包括被配置为捕获第一和第二图像的传感器和被配置为测量在每个偏转元件位置处的第一和第二图像之间的差分位移的控制器,并且计算取决于被测量的光学设置局部WF梯度 差分位移。
    • 8. 发明申请
    • WIDEFIELD MICROSCOPE ILLUMINATION SYSTEM AND WIDEFIELD ILLUMINATION METHOD
    • US20140061445A1
    • 2014-03-06
    • US14111759
    • 2012-04-11
    • Jonas Foelling
    • Jonas Foelling
    • G02B21/06
    • G02B21/06G01N21/6458G02B21/088G02B21/125G02B21/16G02B21/367
    • A widefield microscope illumination system and a method for illumination, the system having a microscope objective with an optical objective axis, an illumination light source sending widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined illumination light entry area, a spatially resolving light detector detecting detected light sent from an illuminated sample through the microscope objective along a detected light beam path, and an automatic illumination light beam path manipulation device, controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of illumination light entry sites.
    • 一种宽幅显微镜照明系统和一种照明方法,该系统具有具有光学物镜轴的显微镜物镜,照明光源沿着具有对应的照明轴的照明光束路径发送宽场照明光,照明光线沿着该照明轴照射到显微镜物镜中 位于预定照明光入射区域内的照明光进入位置,沿着检测到的光束路径检测从被照射的样品通过显微镜物镜发送的检测光的空间分辨光检测器,以及自动照明光束路径操纵装置, 控制系统,其布置在相对于照明光束路径的方向在显微镜物镜的前方,并且照明光束路径操纵装置的照明轴可以以时间间隔自动地移动到多个照明l 入境点。