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    • 1. 发明授权
    • Microscope apparatus and observation method
    • US09946058B2
    • 2018-04-17
    • US13157805
    • 2011-06-10
    • Ichiro Sase
    • Ichiro Sase
    • G02B21/16G01N21/64G02B21/36G02B21/06G02B27/56
    • G02B21/16G01N21/6458G02B21/06G02B21/367G02B27/56
    • A microscope apparatus comprises: a distribution measurement apparatus which—with respect to an observation region wherein a sample is arranged which comprises a fluorescent material that is activated when irradiated with an activating light of a prescribed wavelength, and that emits fluorescence when irradiated in an activated condition with an exciting light of a wavelength that differs from that of the activating light—obtains a fluorescent picture image by conducting irradiation with the exciting light, and measures a fluorescent intensity distribution of the observation region; an irradiation intensity setting apparatus which sets irradiation intensities of the activating light for respective portions of the observation region based on the fluorescent intensity distribution; and a picture image formation apparatus which obtains a plurality of the fluorescent picture images by multiply repeating operations comprising an operation wherein the observation region is irradiated with the activating light at the irradiation intensities that have been set in the respective portions, and an operation wherein a fluorescent picture image is obtained by irradiating the observation region with the exciting light after the activating light irradiation, and which generates a sample picture image from the plurality of the fluorescent picture images.
    • 6. 发明申请
    • Total Internal Reflectance Fluorescence (TIRF) Microscopy Across Multiple Wavelengths Simultaneously
    • 全内反射荧光(TIRF)显微镜同时跨多个波长
    • US20140104680A1
    • 2014-04-17
    • US14052824
    • 2013-10-14
    • Spectral Applied Research Inc.
    • Richard BermanPeter Maclean SinclairJohn Oreopoulos
    • G02B21/00
    • G02B21/0076G01N21/6458G01N21/648G02B21/16G02B27/56
    • A multiple wavelength total internal reflection fluoresence (TIRF) microscopy system has an objective. A dispersion unit of the system comprises a high-dispersion optical element. The dispersion unit receives illumination light having at least a first wavelength λ1 and a second wavelength λ2, where λ1≠λ2, and splits the illumination light into a first monochromatic beam having the first wavelength λ1 and a second monochromatic beam having the second wavelength λ2. The monochromatic beams are focused onto a back focal plane of the objective, near an outer edge of the objective, at different radial distances from an optical axis of the objective. The dispersion unit is rotatable in order to adjust angles of incidence of the monochromatic beams onto an interface between a substrate and a sample to be imaged, wherein the angles of incidence are greater than the critical angle of the interface.
    • 多波长全内反射荧光(TIRF)显微镜系统有一个目标。 该系统的色散单元包括高色散光学元件。 色散单元接收具有至少第一波长λ1和第二波长λ2的照明光,其中λ1≠λ2,并将照明光分解成具有第一波长λ1的第一单色光束和具有第二波长λ2的第二单色光束。 单色光束在与物镜的光轴不同的径向距离处聚焦在物镜的后焦平面上,靠近物镜的外边缘。 色散单元是可旋转的,以便将单色光束的入射角度调整到衬底和待成像样品之间的界面上,其中入射角大于界面的临界角。
    • 9. 发明授权
    • Device and method for the evanescent illumination of a sample
    • 样品瞬间照明的装置和方法
    • US08378314B2
    • 2013-02-19
    • US12991108
    • 2009-04-28
    • Manfred MatthaeBruene Venus
    • Manfred MatthaeBruene Venus
    • G01N21/64
    • G01N21/648G01N21/6458G01N2021/6419G01Q60/20G01Q60/22G02B27/56
    • A device for the evanescent illumination of a sample, including an optical illumination element with an optical corrective element and an objective arranged downstream from the corrective element, to evanescently illuminate the sample with a supplied ray beam containing optical radiation with at least two different wavelengths. The corrective optical element has a transverse chromatic aberration which, during the illumination, leads to the optical radiation penetrating the pupil of the objective at different heights relative to the optical axis varying according to the wavelength. The corrective optical element is selected in such a way that the wavelength-related difference of the penetration depths of the radiation into the sample is reduced during the evanescent illumination.
    • 一种用于样品的消逝照明的装置,包括具有光学校正元件的光学照明元件和布置在校正元件下游的物镜,以使包含具有至少两个不同波长的光学辐射的所提供的射线束ev逝照射样品。 校正光学元件具有横向色差,其在照明期间导致相对于根据波长变化的光轴的不同高度穿透物镜的光瞳的光学辐射。 选择校正光学元件,使得在渐逝照射期间辐射进入样品的穿透深度的波长相关差异减小。
    • 10. 发明申请
    • MICROSCOPE APPARATUS AND OBSERVATION METHOD
    • MICROSCOPE设备和观察方法
    • US20120062722A1
    • 2012-03-15
    • US13157805
    • 2011-06-10
    • Ichiro SASE
    • Ichiro SASE
    • H04N7/18
    • G02B21/16G01N21/6458G02B21/06G02B21/367G02B27/56
    • A microscope apparatus comprises: a distribution measurement apparatus with respect to an observation region that comprises a fluorescent material that is activated when irradiated with an activating light, and that emits fluorescence when irradiated with an exciting light of a wavelength different from the activating light, obtains a fluorescent picture image through irradiation with the exciting light, and measures a fluorescent intensity distribution; an irradiation intensity setting apparatus which sets irradiation intensities of the activating light for respective portions of the observation region based on the fluorescent intensity distribution; and a picture image formation apparatus which obtains a plurality of the fluorescent picture images by repeating an operation wherein the observation region is irradiated with the activating light at the set irradiation intensities, and repeating an operation wherein a fluorescent picture image is obtained by irradiating with the exciting light after the activating light irradiation, generating a sample picture image.
    • 显微镜装置包括:关于观察区域的分布测量装置,其包括当用活化光照射时被激活的荧光材料,并且当用与激活光不同的激发光照射时发射荧光,获得 荧光图像通过照射激发光,并测量荧光强度分布; 照射强度设定装置,其基于所述荧光强度分布来设定所述观察区域的各部分的激活光的照射强度; 以及图像形成装置,其通过重复以设定的照射强度照射激活光的观察区域的操作来获得多个荧光图像图像,并且重复其中通过照射所述荧光图像获得荧光图像图像的操作 在激活光照射之后激发光,产生样本图像。