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    • 1. 发明申请
    • Color Film Developing Apparatus
    • 彩色显影装置
    • US20140044429A1
    • 2014-02-13
    • US13642543
    • 2012-09-05
    • Liwei Hu
    • Liwei Hu
    • G03D5/00
    • G03D5/00G03F7/3064
    • The present invention provides a color film developing apparatus, which is used to uniformly develop photoresist on the surface of a substrate as manufacturing a liquid crystal panel, comprising a developing chamber. The developing chamber comprises a first developing chamber and a second developing chamber respectively set inclined to a horizontal plane; the inclined directions of the first developing chamber and the second developing chamber inclined to the horizontal plane are contrary to each other. The color film developing apparatus according to the present invention can avoid the secondary development of the photoresist on the inclined substrate caused by the developer flowing from top to bottom when the substrate passes the developing chamber and proceeds to develop; enhance the uniformity of the development of the substrate; improve the uniformity of the in-plane process; narrow the differences; improve the quality of the product.
    • 本发明提供了一种彩色显影装置,其用于在制造液晶面板时在基板的表面上均匀地显影光致抗蚀剂,其包括显影室。 显影室包括分别设置成倾斜于水平面的第一显影室和第二显影室; 第一显影室和第二显影室相对于水平面倾斜的倾斜方向彼此相反。 根据本发明的彩色显影装置可以避免当显影室通过显影室时由显影剂从顶部向底部流动而引起的倾斜基板上的光致抗蚀剂的二次显影并进行显影; 增强基材的均匀性; 提高平面过程的均匀性; 缩小差异; 提高产品质量。
    • 2. 发明申请
    • RINSING METHOD, DEVELOPING METHOD, DEVELOPING SYSTEM AND COMPUTER-READ STORAGE MEDIUM
    • 研究方法,开发方法,开发系统和计算机读取存储介质
    • US20110045414A1
    • 2011-02-24
    • US12913420
    • 2010-10-27
    • Hirofumi TAKEGUCHIJunji NAKAMURAKousuke YOSHIHARA
    • Hirofumi TAKEGUCHIJunji NAKAMURAKousuke YOSHIHARA
    • G03C5/00
    • G03D5/00B08B3/04H01L21/67051
    • The present invention provides a rinsing method capable of satisfactorily rinsing the surface of a resist film regardless of the condition of the surface of the resist film so that development defects caused by residuals produced by development may be reduced. A rinsing method of rinsing a substrate processed by a developing process for developing an exposed pattern comprises the steps of discharging a rinsing liquid onto a central part of the substrate processed by the developing process and coated with a developer puddle while the substrate is stopped or rotated (step 5), stopping discharging the rinsing liquid in a state where the developer puddle remains at least in a peripheral part of the substrate (step 6), and rotating the substrate at a high rotating speed to shake the developer remaining on the substrate off the substrate together with the rinsing liquid (step 7).
    • 本发明提供了能够令人满意地冲洗抗蚀剂膜的表面的冲洗方法,而与抗蚀剂膜的表面的状态无关,从而可以减少由显影产生的残留物引起的显影缺陷。 漂洗通过用于显影曝光图案的显影工艺处理的基材的冲洗方法包括以下步骤:将冲洗液体排出到通过显影过程处理的基材的中心部分上,并在基材停止或旋转时涂覆显影剂水坑 (步骤5),在显影剂熔池至少保持在基板的周边部分的状态下停止排出冲洗液体(步骤6),并且以高转速旋转基板以摇动残留在基板上的显影剂 基底与冲洗液一起(步骤7)。
    • 3. 发明授权
    • Developing apparatus, developing method, coating and developing system and storage medium
    • 开发设备,开发方法,涂层开发系统和存储介质
    • US07828488B2
    • 2010-11-09
    • US12105701
    • 2008-04-18
    • Nobuaki Matsuoka
    • Nobuaki Matsuoka
    • G03D5/00
    • G03D5/00
    • A developing apparatus includes two rotating members respectively having parallel horizontal axes of rotation and disposed longitudinally opposite to each other, a carrying passage forming mechanism extended between the rotating members to form a carrying passage, and capable of moving along an orbital path to carry a wafer supported thereon along the carrying passage, a sending-in transfer unit disposed at the upstream end of the carrying passage, a sending-out transfer unit disposed at the downstream end of the carrying passage, a developer pouring nozzle for pouring a developer onto the wafer, a cleaning nozzle for pouring a cleaning liquid onto the wafer, and a gas nozzle for blowing a gas against the wafer. The developer pouring nozzle, the cleaning nozzle and the gas nozzle are arranged in that order in a direction in which the wafer is carried along the carrying passage.
    • 显影装置包括分别具有平行的水平旋转轴线和彼此纵向相对设置的两个旋转构件,在旋转构件之间延伸以形成承载通道并且能够沿着轨道路径移动以承载晶片的承载通道形成机构 沿着输送通道支撑在其上的输送转印单元,设置在输送通道的上游端的送出转印单元,设置在输送通道的下游端的送出转印单元,用于将显影剂倾倒到晶片上的显影剂倾倒喷嘴 用于将清洗液注入到晶片上的清洗喷嘴和用于将气体吹向晶片的气体喷嘴。 显影剂倾倒喷嘴,清洁喷嘴和气体喷嘴沿着沿承载通道承载晶片的方向依次排列。
    • 6. 发明申请
    • DEVELOPING APPARATUS, DEVELOPING METHOD, COATING AND DEVELOPING SYSTEM AND STORAGE MEDIUM
    • 开发设备,开发方法,涂装和开发系统和存储介质
    • US20080267619A1
    • 2008-10-30
    • US12105701
    • 2008-04-18
    • Nobuaki MATSUOKA
    • Nobuaki MATSUOKA
    • G03D5/00
    • G03D5/00
    • A developing apparatus includes two rotating members 41 and 42 respectively having parallel horizontal axes of rotation and disposed longitudinally opposite to each other, a carrying passage forming mechanism 4 extended between the rotating members 41 and 42 to form a carrying passage, and capable of moving along an orbital path to carry a wafer W supported thereon along the carrying passage, a sending-in transfer unit 31 disposed at the upstream end of the carrying passage, a sending-out transfer unit 32 disposed at the downstream end of the carrying passage, a developer pouring nozzle 71 for pouring a developer onto the wafer W, a cleaning nozzle 72 for pouring a cleaning liquid onto the wafer W, and a gas nozzle 74 for blowing a gas against the wafer W. The developer pouring nozzle 71, the cleaning nozzle 72 and the gas nozzle 74 are arranged in that order in a direction in which the wafer W is carried along the carrying passage between the upstream and the downstream end of the carrying passage.
    • 显影装置包括分别具有平行的水平旋转轴线和彼此纵向相对布置的两个旋转构件41和42,在旋转构件41和42之间延伸的承载通道形成机构4,以形成承载通道,并且能够沿着 携带沿着输送通道支撑在其上的晶片W的轨道,设置在运送通道的上游端的送入传送单元31,设置在运送通道的下游端的送出传送单元32, 用于将显影剂倾倒到晶片W上的显影剂倾倒嘴71,用于将清洗液注入到晶片W上的清洁喷嘴72和用于将气体吹向晶片W的气体喷嘴74.显影剂倾倒嘴71,清洁喷嘴 72和气体喷嘴74沿着沿着车辆的上游和下游端之间的输送通道承载晶片W的方向依次布置 通行证
    • 8. 发明申请
    • PHOTOLITHOGRAPHY SYSTEM AND METHOD
    • 光刻系统和方法
    • US20070297794A1
    • 2007-12-27
    • US11767324
    • 2007-06-22
    • Byong-Cheol PARKDong-Hwa SHINYun-Sik YANG
    • Byong-Cheol PARKDong-Hwa SHINYun-Sik YANG
    • G03D5/00
    • G03D5/00G03F7/70533G03F7/70991H01L21/67225H01L21/67271
    • A photolithography system includes an application and development module, an exposure module, and an interface module interposed between the first two modules. Bake units for performing a post-exposure bake process are provided to both the application and development module and the interface module. The interface module also includes a buffer unit. An error detected within the application and development module would ordinarily stop operation of the post-exposure bake process in the application and development module. Upon detection of the error, communication between the auxiliary controller controlling the bake unit of the interface module and the exposure controller is made, and a wafer processed at the exposure module undergoes a post-exposure bake process at the bake unit of the interface module, and then is stored in the buffer unit of the interface module.
    • 光刻系统包括应用和开发模块,曝光模块和插入在前两个模块之间的接口模块。 用于进行曝光后烘烤处理的烘烤单元被提供给应用和开发模块和接口模块。 接口模块还包括缓冲单元。 在应用程序和开发模块中检测到的错误通常会在应用程序和开发模块中停止曝光后烘烤过程的操作。 在检测到错误时,进行控制接口模块的烘烤单元的辅助控制器与曝光控制器之间的通信,并且在曝光模块处理的晶片在接口模块的烘烤单元处进行曝光后烘烤处理, 然后存储在接口模块的缓冲单元中。
    • 9. 发明申请
    • DEVELOPING APPARATUS, DEVELOPING PROCESSING METHOD, DEVELOPING PROCESSING PROGRAM, AND COMPUTER READABLE RECORDING MEDIUM RECORDING THE PROGRAM
    • 开发设备,开发处理方法,开发处理程序以及记录程序的计算机可读记录介质
    • US20070253709A1
    • 2007-11-01
    • US11739848
    • 2007-04-25
    • Kousuke YOSHIHARA
    • Kousuke YOSHIHARA
    • G03D5/00
    • G03D5/00
    • A developing apparatus, a developing processing method, a developing processing program, and a computer readable recording medium recording the program, which can reduce the consumption amount of the developing solution and the developing processing time irrespective of the type of resist materials or the shape of resist patterns, are provided. A step of horizontally holding a substrate and rotating the substrate around a vertical axis at a prescribed rotation rate, and a step of intermittently supplying a developing solution to a center of the substrate from a discharge port of a developing solution nozzle arranged opposing to the surface of the substrate are executed. In the step of intermittently supplying the developing solution to the center of the substrate, an intermittence time and a substrate rotation rate in the intermittence time are set to prevent the developing solution supplied to the substrate from drying.
    • 记录程序的显影装置,显影处理方法,显影处理程序和计算机可读记录介质,无论抗蚀剂材料的类型如何,都可以减少显影液的消耗量和显影处理时间, 抗蚀剂图案。 水平地保持基板并以规定的旋转速度使垂直轴线旋转的步骤,以及从显影液喷嘴的排出口向基板的中心间歇地供给显影液的步骤 的基板。 在将显影液间歇地供给到基板的中心的步骤中,设置间歇时间的间歇时间和基板旋转速度,以防止供给到基板的显影液干燥。