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    • 94. 发明授权
    • Ion mobility analyzer, combination device thereof, and ion mobility analysis method
    • 离子迁移率分析仪,其组合装置和离子迁移率分析方法
    • US09429543B2
    • 2016-08-30
    • US14735876
    • 2015-06-10
    • SHIMADZU CORPORATION
    • Gongyu JiangYupeng ChengXiaoqiang ZhangWenjian Sun
    • H01J49/00H01J49/34H01J49/40G01N27/62H01J49/22
    • G01N27/622G01N27/624H01J49/004H01J49/22
    • An ion mobility analyzer, combination device thereof, and ion mobility analysis method. The ion mobility analyzer comprises an electrode system that surrounds the analytical space and a power device that attaches to the electrode system an ion mobility electric potential field that moves along one space axis. During the process of analyzing mobility of ions to be measured, by always placing the ions to be measured in the moving ion mobility electric potential field, and keeping the movement direction of the ion mobility electric potential field consistent with the direction of the electric field on the ions to be measured within the ion mobility electric potential field, theoretically a mobility path of an infinite length can be formed so as to distinguish ions having mobility or ion cross sections that have very small differences.
    • 离子迁移率分析仪,其组合装置和离子迁移率分析方法。 离子迁移率分析仪包括围绕分析空间的电极系统和附接到电极系统的沿着一个空间轴移动的离子迁移电位场的功率器件。 在分析被测离子的迁移率的过程中,通过总是将待测离子置于移动离子迁移电势场,并保持离子迁移率电位场的移动方向与电场方向一致 在离子迁移电势场内要测量的离子理论上可以形成无限长度的迁移率路径,以区分具有极小差异的迁移率的离子或离子横截面。
    • 95. 发明授权
    • Mass analysis using alternating fragmentation modes
    • 使用交替分片模式进行质量分析
    • US09384951B2
    • 2016-07-05
    • US14136884
    • 2013-12-20
    • Micromass UK Limited
    • Robert Harold Bateman
    • H01J49/00H01J49/10H01J49/34
    • H01J49/0031H01J49/0027H01J49/0045H01J49/10H01J49/34
    • A method of mass spectrometry is disclosed wherein a Surface Induced Dissociation fragmentation device is repeatedly switched between a high fragmentation mode and a low fragmentation mode. Parent ions from a first sample are passed through the device and parent ion mass spectra and fragmentation ion mass spectra are obtained. Parent ions from a second sample are then passed through the device and a second set of parent ion mass spectra and fragmentation ion mass spectra are obtained. The mass spectra are then compared and if either certain parent ions or certain fragmentation ions in the two samples are expressed differently then further analysis is performed to seek to identify the ions which are expressed differently in the two different samples.
    • 公开了一种质谱法,其中表面诱导解离破碎装置在高碎裂模式和低碎裂模式之间重复切换。 来自第一个样品的亲本离子通过器件,并获得亲本离子质谱和碎片离子质谱。 然后将来自第二个样品的母离子通过该装置,并获得第二组母离子质谱和碎裂离子质谱。 然后比较质谱,并且如果两个样品中的某些亲本离子或某些断裂离子不同地表达,则进行进一步分析以寻找在两个不同样品中不同表达的离子。