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    • 12. 发明申请
    • CACHE MEMORY
    • 高速缓存存储器
    • US20100011169A1
    • 2010-01-14
    • US12169091
    • 2008-07-08
    • Anil Pothireddy
    • Anil Pothireddy
    • G06F12/08
    • G06F12/0862G06F2212/6022
    • Disclosed is a cache memory, design structure, and corresponding method for improving cache performance comprising one or more cache lines of equal size, each cache line adapted to store a cache block of data from a main memory in response to an access request from a processor; and a predict buffer, of size equal to the size of the cache lines, configured to store a next block of data from said main memory in response to a predict-fetch signal generated using at least one previous access request.
    • 公开了一种缓存存储器,设计结构以及用于改进高速缓存性能的相应方法,其包括一个或多个相同大小的高速缓存行,每个高速缓存行适于响应来自处理器的访问请求而存储来自主存储器的数据的高速缓存块 ; 以及大小等于高速缓存线的大小的预测缓冲器,被配置为响应于使用至少一个先前访问请求生成的预测获取信号来存储来自所述主存储器的下一个数据块。
    • 13. 发明申请
    • IN SYSTEM DIAGNOSTICS THROUGH SCAN MATRIX
    • 通过扫描矩阵进行系统诊断
    • US20090158105A1
    • 2009-06-18
    • US11958468
    • 2007-12-18
    • Baalaji Ramamoorthy KondaKenneth PichamuthuJayashri Arsikere BasappaAnil Pothireddy
    • Baalaji Ramamoorthy KondaKenneth PichamuthuJayashri Arsikere BasappaAnil Pothireddy
    • G01R31/3185G06F11/26
    • G06F11/267G01R31/318555
    • A method of in system diagnostics through scan matrix, and an integrated circuit chip in which the diagnostics are performed, are disclosed. The integrated circuit chip operable in a plurality of Boundary Scan test modes in which at least a part of the circuitry in the integrated circuit chip is tested, the integrated circuit chip comprises a scan matrix controller and an instruction register. The scan matrix controller is provided for partitioning said circuitry into multiple matrices, each of the matrices having a plurality of scan elements. The instruction register is provided for holding instructions for the scan matrix controller for partitioning the chip into said multiple matrices. The scan matrix controller is further arranged to test each of said matrices according to instructions in the instruction register by applying a test signal to the tested part of the circuitry.
    • 公开了一种通过扫描矩阵进行系统诊断的方法,以及执行诊断的集成电路芯片。 所述集成电路芯片可操作在多个边界扫描测试模式中,其中所述集成电路芯片中的至少一部分电路被测试,所述集成电路芯片包括扫描矩阵控制器和指令寄存器。 提供扫描矩阵控制器用于将所述电路划分成多个矩阵,每个矩阵具有多个扫描元件。 提供指令寄存器用于保持扫描矩阵控制器的指令,用于将芯片划分为所述多个矩阵。 扫描矩阵控制器还被布置为通过将测试信号施加到电路的测试部分来根据指令寄存器中的指令来测试每个所述矩阵。
    • 15. 发明授权
    • Finite state machine error recovery
    • 有限状态机错误恢复
    • US08161366B2
    • 2012-04-17
    • US11949305
    • 2007-12-03
    • Anil PothireddyNeranjen Ramalingam
    • Anil PothireddyNeranjen Ramalingam
    • G06F11/00
    • G06F11/28G06F11/0796
    • A method and system for using a magnitude comparator circuit and a flag bit, for detecting and preventing errors from occurring in the FSM state bits that could otherwise cause the system to hang. Preferably, the flag bit is set with all the valid state transitions, and a magnitude comparator is used to continuously monitor the value of the current state bits. When a FSM state transition occurs based on the flag bit and the output of the magnitude comparator, a potential error condition can be detected and the FSM transition can be blocked or the FSM can be safely transitioned into a predetermined “reset state”.
    • 一种使用幅度比较器电路和标志位的方法和系统,用于检测和防止在FSM状态位中发生的错误,否则可能导致系统挂起。 优选地,标志位被设置为具有所有有效状态转换,并且使用幅度比较器来连续监视当前状态位的值。 当基于标志位和幅度比较器的输出发生FSM状态转换时,可以检测潜在的错误状况,并且可以阻止FSM转换或FSM可以安全地转换到预定的“复位状态”。