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    • 1. 发明授权
    • Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method
    • 试验装置,试验方法,电子装置制造方法,试验模拟装置及试验模拟方法
    • US07532994B2
    • 2009-05-12
    • US11395094
    • 2006-03-31
    • Hideki TadaMitsuo HoriTakahiro KataokaHiroyuki Sekiguchi
    • Hideki TadaMitsuo HoriTakahiro KataokaHiroyuki Sekiguchi
    • G01R27/28
    • G01R31/31932G01R31/31928G01R31/31937
    • A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test apparatus including: a reference timing detecting unit for detecting that one of the output signals has changed; a setting unit for setting beforehand a minimum time from changing of the output signal to changing of another output signal; an acquisition unit for acquiring the value of the latter output signal at a timing at which the minimum time has elapsed from detection of change of the former output signal; and a determination unit for determining the electronic device to be defective in the event that the value of the latter output signal thus acquired does not match the value which the latter output signal should assume following elapsing of the minimum time.
    • 公开了一种用于通过向电子设备提供测试信号并将多个输出信号与各自的预期值进行比较来测试电子设备的测试设备,该测试设备包括:用于检测输出信号中的一个已经改变的参考定时检测单元; 设置单元,用于预先设置从输出信号的改变到另一个输出信号的改变的最小时间; 获取单元,用于在从前一个输出信号的改变的检测经过最小时间的定时获取后一个输出信号的值; 以及确定单元,用于在如此获取的后一个输出信号的值与后一个输出信号应该在最小时间之后应该呈现的值不匹配的情况下确定该电子设备是有缺陷的。
    • 2. 发明授权
    • Test simulator, test simulation program and recording medium
    • 测试模拟器,测试仿真程序和记录介质
    • US07502724B2
    • 2009-03-10
    • US11240811
    • 2005-09-30
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • G06F17/50
    • G06F17/5022G01R31/3183G01R31/318357G06F11/263
    • A test simulator for simulating a test of a semiconductor device is disclosed, the test simulator including: a test pattern holding unit for holding an existing test pattern to be supplied to the semiconductor device; a device output holding unit for preliminarily holding an output to be obtained from the semiconductor device when the existing test pattern is supplied; a test pattern generating unit for generating a new test pattern to be supplied to the semiconductor device; a test pattern deciding unit for deciding whether the new test pattern is equal to the existing test pattern; and a simulation skipping unit for skipping at least a part of a simulation test by reading an output from the device output holding unit and using the output as an output for the new test pattern without supplying the new test pattern to the semiconductor device when the test patterns are equal to each other.
    • 公开了一种用于模拟半导体器件的测试的测试模拟器,所述测试模拟器包括:用于保持要提供给所述半导体器件的现有测试图案的测试图案保持单元; 设备输出保持单元,用于在提供现有测试图案时预先保持从半导体器件获得的输出; 测试图案生成单元,用于生成要提供给半导体器件的新测试图案; 测试模式决定单元,用于判定新的测试模式是否等于现有的测试模式; 以及模拟跳过单元,用于通过读取来自设备输出保持单元的输出并使用输出作为新测试图案的输出来跳过至少一部分模拟测试,而不向新的测试图案提供新的测试图案到半导体器件 模式彼此相等。
    • 3. 发明授权
    • Test emulator, emulation program and method for manufacturing semiconductor device
    • 测试仿真器,仿真程序和制造半导体器件的方法
    • US07506291B2
    • 2009-03-17
    • US11211126
    • 2005-08-24
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • G06F17/50G06F9/45
    • G06F11/24G01R31/31703G06F11/261G06F11/277
    • A test emulator for emulating a test of a semiconductor device is provided. The test emulator includes a test pattern providing means for providing a test pattern to a device simulator which simulates the operation of a semiconductor device, an expected value storage means for associating a comparison timing at which an output signal outputted from the device simulator according to the test pattern is compared with an predetermined expected value with the expected value at the comparison timing and previously storing therein the same, a margin determination means for determining the size of a margin between which the output signal corresponds to the expected value when the output signal corresponds to the expected value at the comparison timing and a notification means for notifying a user that the margin at the comparison timing is small when the size of margin is smaller than a reference value.
    • 提供了一种用于模拟半导体器件测试的测试仿真器。 测试模拟器包括测试模式提供装置,用于向模拟半导体器件的操作的器件模拟器提供测试模式;期望值存储装置,用于将根据所述装置模拟器输出的输出信号的比较定时相关联 将测试图案与预定值在比较定时进行比较,并预先在其中存储相同的值;边界确定装置,用于在输出信号对应于输出信号对应于期望值时确定输出信号对应的余量的大小 到达比较定时的期望值,以及通知单元,用于当余量的大小小于参考值时通知用户比较定时的余量小。
    • 9. 发明申请
    • MEDICAL IMAGE PROCESSING SYSTEM AND A MEDICAL IMAGE PROCESSING SERVER
    • 医学图像处理系统和医学图像处理服务器
    • US20120296962A1
    • 2012-11-22
    • US13519334
    • 2011-11-15
    • Hideki Tada
    • Hideki Tada
    • G06F15/16
    • G06F19/321A61B5/0013
    • In case of communication is interrupted as a result of unforeseen circumstances, it is intended to allow confirming the results of processing executed while communication is interrupted. The medical image processing system includes a server comprising a processor and a screen generator. The processor executes an application for generating and editing a medical image based on instructions from a client. The screen generator generates and delivers the screen to the client upon receiving the processing results of the application. The server comprises a disconnect detector, a screen storage, and a screen storage controller. The disconnect detector detects communication interruption with the client. The screen storage controller causes the screen storage to store the screen generated in a first period from the time when the disconnect detector detects an interruption of communication. A screen playback part delivers the screen stored in the screen storage to the client.
    • 在通信由于意外情况而中断的情况下,旨在允许确认在通信中断时执行的处理结果。 医疗图像处理系统包括包括处理器和屏幕生成器的服务器。 处理器基于来自客户端的指令执行用于生成和编辑医学图像的应用。 屏幕生成器在接收到应用程序的处理结果后生成并传送到客户端。 服务器包括断开检测器,屏幕存储器和屏幕存储控制器。 断开检测器检测到与客户端的通信中断。 屏幕存储控制器使得屏幕存储器存储从断开检测器检测到通信中断的时间开始的第一周期中产生的屏幕。 屏幕回放部分将存储在屏幕存储器中的屏幕传递给客户端。