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    • 1. 发明授权
    • Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method
    • 试验装置,试验方法,电子装置制造方法,试验模拟装置及试验模拟方法
    • US07532994B2
    • 2009-05-12
    • US11395094
    • 2006-03-31
    • Hideki TadaMitsuo HoriTakahiro KataokaHiroyuki Sekiguchi
    • Hideki TadaMitsuo HoriTakahiro KataokaHiroyuki Sekiguchi
    • G01R27/28
    • G01R31/31932G01R31/31928G01R31/31937
    • A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test apparatus including: a reference timing detecting unit for detecting that one of the output signals has changed; a setting unit for setting beforehand a minimum time from changing of the output signal to changing of another output signal; an acquisition unit for acquiring the value of the latter output signal at a timing at which the minimum time has elapsed from detection of change of the former output signal; and a determination unit for determining the electronic device to be defective in the event that the value of the latter output signal thus acquired does not match the value which the latter output signal should assume following elapsing of the minimum time.
    • 公开了一种用于通过向电子设备提供测试信号并将多个输出信号与各自的预期值进行比较来测试电子设备的测试设备,该测试设备包括:用于检测输出信号中的一个已经改变的参考定时检测单元; 设置单元,用于预先设置从输出信号的改变到另一个输出信号的改变的最小时间; 获取单元,用于在从前一个输出信号的改变的检测经过最小时间的定时获取后一个输出信号的值; 以及确定单元,用于在如此获取的后一个输出信号的值与后一个输出信号应该在最小时间之后应该呈现的值不匹配的情况下确定该电子设备是有缺陷的。
    • 2. 发明授权
    • Test simulator, test simulation program and recording medium
    • 测试模拟器,测试仿真程序和记录介质
    • US07502724B2
    • 2009-03-10
    • US11240811
    • 2005-09-30
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • G06F17/50
    • G06F17/5022G01R31/3183G01R31/318357G06F11/263
    • A test simulator for simulating a test of a semiconductor device is disclosed, the test simulator including: a test pattern holding unit for holding an existing test pattern to be supplied to the semiconductor device; a device output holding unit for preliminarily holding an output to be obtained from the semiconductor device when the existing test pattern is supplied; a test pattern generating unit for generating a new test pattern to be supplied to the semiconductor device; a test pattern deciding unit for deciding whether the new test pattern is equal to the existing test pattern; and a simulation skipping unit for skipping at least a part of a simulation test by reading an output from the device output holding unit and using the output as an output for the new test pattern without supplying the new test pattern to the semiconductor device when the test patterns are equal to each other.
    • 公开了一种用于模拟半导体器件的测试的测试模拟器,所述测试模拟器包括:用于保持要提供给所述半导体器件的现有测试图案的测试图案保持单元; 设备输出保持单元,用于在提供现有测试图案时预先保持从半导体器件获得的输出; 测试图案生成单元,用于生成要提供给半导体器件的新测试图案; 测试模式决定单元,用于判定新的测试模式是否等于现有的测试模式; 以及模拟跳过单元,用于通过读取来自设备输出保持单元的输出并使用输出作为新测试图案的输出来跳过至少一部分模拟测试,而不向新的测试图案提供新的测试图案到半导体器件 模式彼此相等。
    • 3. 发明授权
    • Method of searching information site by item keyword and action keyword
    • 按项目关键字和动作关键字搜索信息的方法
    • US07346651B2
    • 2008-03-18
    • US10022992
    • 2001-12-17
    • Yasushi KurakakeMitsuo Hori
    • Yasushi KurakakeMitsuo Hori
    • G06F15/16
    • G06F17/30873G06F17/30864Y10S707/99933Y10S707/99934Y10S707/99936
    • A method is designed for searching contents information presented by a plurality of information sites over a network based on a query sent from a client terminal to a searching server through the network. The method is carried out by the computer-implemented steps of registering information sites which present contents information involving various items and actions related to each other, initiating the client terminal to transmit a query to the searching server through the network, the query containing an item keyword indicating an item as a target of searching and an action keyword indicating an action to be made on the item, operating the searching server according to the query to search for one or more of the registered information sites having contents information matching the query, and to send back directory information indicative of locations of the searched information sites to the client terminal, and operating the client terminal according to the directory information for accessing the searched information sites, thereby enabling a user to make the action on the item.
    • 基于通过网络从客户终端发送到搜索服务器的查询,设计用于通过网络搜索由多个信息站点呈现的内容信息的方法。 该方法通过计算机实现的步骤来进行,该信息站点呈现涉及各种相关的各种项目和动作的内容信息,启动客户端通过网络向搜索服务器发送查询,该查询包含项目 指示作为搜索对象的项目的关键字和指示要对项目进行动作的动作关键字,根据查询操作搜索服务器,以搜索具有与查询匹配的内容信息的一个或多个注册信息站点;以及 将指示搜索到的信息站点的位置的目录信息发送到客户终端,并且根据用于访问所搜索的信息站点的目录信息来操作客户终端,从而使得用户能够对该项目进行动作。
    • 8. 发明授权
    • Acoustic damping pipe cover
    • 声阻尼管盖
    • US06202702B1
    • 2001-03-20
    • US09507090
    • 2000-02-18
    • Yasuyuki OhiraMitsuo Hori
    • Yasuyuki OhiraMitsuo Hori
    • F16L921
    • F16L59/021
    • A generally tubular laminated acoustic damping pipe cover to be used on a water pipe to reduce the noise level of the pipe, having a sound insulation layer whose area density is 1.5-5.0 kg/m2 and a sound absorptive layer whose thickness is 4.0-10.0 mm, covered with a heat-contractile film which when heat treated will tighten the acoustic damping pipe cover on the water pipe but hold the pipe cover in a sliding fashion. The acoustic damping pipe cover is lightweight and easy to manipulate, and provides an excellent acoustic damping performance.
    • 一种在管道上使用的通常管状层压声阻尼管罩,以减小管道的噪声水平,具有面积密度为1.5-5.0kg / m 2的隔音层和厚度为4.0-10.0的吸声层 mm,覆盖有热收缩膜,当热处理时,会拧紧水管上的声阻尼管盖,同时以滑动方式固定管盖。 声阻尼管壁重量轻且易于操作,并提供优异的阻尼性能。
    • 10. 发明授权
    • Test emulator, emulation program and method for manufacturing semiconductor device
    • 测试仿真器,仿真程序和制造半导体器件的方法
    • US07506291B2
    • 2009-03-17
    • US11211126
    • 2005-08-24
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • Hideki TadaMitsuo HoriTakahiro Kataoka
    • G06F17/50G06F9/45
    • G06F11/24G01R31/31703G06F11/261G06F11/277
    • A test emulator for emulating a test of a semiconductor device is provided. The test emulator includes a test pattern providing means for providing a test pattern to a device simulator which simulates the operation of a semiconductor device, an expected value storage means for associating a comparison timing at which an output signal outputted from the device simulator according to the test pattern is compared with an predetermined expected value with the expected value at the comparison timing and previously storing therein the same, a margin determination means for determining the size of a margin between which the output signal corresponds to the expected value when the output signal corresponds to the expected value at the comparison timing and a notification means for notifying a user that the margin at the comparison timing is small when the size of margin is smaller than a reference value.
    • 提供了一种用于模拟半导体器件测试的测试仿真器。 测试模拟器包括测试模式提供装置,用于向模拟半导体器件的操作的器件模拟器提供测试模式;期望值存储装置,用于将根据所述装置模拟器输出的输出信号的比较定时相关联 将测试图案与预定值在比较定时进行比较,并预先在其中存储相同的值;边界确定装置,用于在输出信号对应于输出信号对应于期望值时确定输出信号对应的余量的大小 到达比较定时的期望值,以及通知单元,用于当余量的大小小于参考值时通知用户比较定时的余量小。