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    • 1. 发明授权
    • Level shift circuit
    • 电平移位电路
    • US08736346B2
    • 2014-05-27
    • US13524391
    • 2012-06-15
    • Yuui ShimizuMasaru Koyanagi
    • Yuui ShimizuMasaru Koyanagi
    • H03L5/00
    • According to one embodiment, a level shift circuit includes a plurality of level shift units which are connected to each other and in which the delay time of the rising edge of an output voltage is different from the delay time of the falling edge of the output voltage. The delay time of the rising edge of the output voltage from the previous level shift unit is compensated by the delay time of the falling edge of the output voltage from the next level shift unit, and the delay time of the falling edge of the output voltage from the previous level shift unit is compensated by the delay time of the rising edge of the output voltage from the next level shift unit.
    • 根据一个实施例,电平移位电路包括彼此连接的多个电平移位单元,其中输出电压的上升沿的延迟时间与输出电压的下降沿的延迟时间不同 。 来自先前电平移位单元的输出电压的上升沿的延迟时间由下一个电平移位单元的输出电压的下降沿的延迟时间补偿,并且输出电压的下降沿的延迟时间 来自先前电平移位单元的输出电压的上升沿的延迟时间由下一个电平移位单元补偿。
    • 3. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • 半导体集成电路
    • US20110128063A1
    • 2011-06-02
    • US12884533
    • 2010-09-17
    • Ryo FukudaMasaru Koyanagi
    • Ryo FukudaMasaru Koyanagi
    • H03L5/00
    • H03K3/356113
    • According to one embodiment, a semiconductor integrated circuit includes first and second level shift circuits. The first level shifter includes a plurality of transistors and is connected to a power source voltage supply node of a first power source system and to which a first signal of a second power source system and a level inversion signal of the first signal are input. The second level shifter includes a plurality of transistors and is connected to the power source voltage supply node of the first power source system and to which the level inversion signal of the first signal of the second power source system and an output signal of the first level shifter are input. The first and second level shifters have substantially the same circuit configuration and driving abilities of corresponding ones of the transistors in the first and second level shifters are substantially set equal.
    • 根据一个实施例,半导体集成电路包括第一和第二电平移位电路。 第一电平移位器包括多个晶体管,并连接到第一电源系统的电源电压供应节点,第二电源系统的第一信号和第一信号的电平反转信号被输入到该第一电源系统。 第二电平移位器包括多个晶体管,并连接到第一电源系统的电源电压供应节点,并且第二电源系统的第一信号的电平反转信号和第一电平系统的输出信号 移位器被输入。 第一和第二电平移位器具有基本上相同的电路配置,并且第一和第二电平移位器中对应的晶体管的驱动能力基本上相等。
    • 5. 发明授权
    • Semiconductor memory device inputting/outputting data synchronously with clock signal
    • 半导体存储器件与时钟信号同步输入/输出数据
    • US06801144B2
    • 2004-10-05
    • US10678742
    • 2003-10-02
    • Katsuki MatsuderaMasaru KoyanagiKazuhide YoneyaToshiki Hisada
    • Katsuki MatsuderaMasaru KoyanagiKazuhide YoneyaToshiki Hisada
    • H03M900
    • G11C7/1036
    • An input/output circuit inputs/outputs serial data. A register section comprises a first and a second register. The first register converts the serial data into parallel data. The second register converts parallel data into serial data. A first control signals supply a conversion timing for each bit when the serial data are converted into the parallel data. A second control signals supply a conversion timing for each bit when the parallel data are converted into the serial data. The signal generating circuit controls a timing of rise or fall of the first control signals and sets which of the memory cells should store a value for each bit, of the serial data, and controls a timing of rise or fall of the second control signals and sets which number of value of the serial data should be the value for each bit, of the parallel data read from the memory cells.
    • 输入/输出电路输入/输出串行数据。 寄存器部分包括第一和第二寄存器。 第一个寄存器将串行数据转换为并行数据。 第二个寄存器将并行数据转换为串行数据。 当串行数据被转换成并行数据时,第一控制信号为每个位提供转换定时。 当并行数据被转换成串行数据时,第二控制信号为每个位提供转换定时。 信号发生电路控制第一控制信号的上升或下降的定时,并设置哪个存储单元应存储串行数据的每个位的值,并且控制第二控制信号的上升或下降的定时,以及 将串行数据的值的数量设置为从存储器单元读取的并行数据的每个位的值。
    • 7. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06498741B2
    • 2002-12-24
    • US09746890
    • 2000-12-21
    • Katsuki MatsuderaKazuhide YoneyaToshiki HisadaMasaru KoyanagiNatsuki KushiyamaKaoru NakagawaTakahiko Hara
    • Katsuki MatsuderaKazuhide YoneyaToshiki HisadaMasaru KoyanagiNatsuki KushiyamaKaoru NakagawaTakahiko Hara
    • G11C506
    • G11C5/063
    • A semiconductor memory device is provided which ensures the symmetry of memory data transmission time and a high-speed operation and has large write/read operation margin with no need of increasing the chip area. By placing a horizontally long peripheral circuit section in the middle in the vertical direction of a semiconductor chip, placing a vertically long shift register section above and below and perpendicularly to the peripheral circuit section, and making the memory core and shift register arrangement symmetrical in the horizontal direction, the data/signal lines between the memory core and the shift register section can be made short and the symmetry of the interconnections can be maintained, which allows the implementation of a high-speed and large-margin semiconductor memory device. In addition, a faster semiconductor memory can be obtained by forming the shift register section by stacking shift registers each corresponding to a data block and selecting the order in which the shift registers are stacked so that the length of interconnections between the peripheral circuit and the shift register is minimized.
    • 提供一种半导体存储器件,其确保存储器数据传输时间和高速操作的对称性,并且具有大的写入/读取操作裕度,而不需要增加芯片面积。 通过在半导体芯片的垂直方向上的中间放置一个水平长的外围电路部分,将垂直长的移位寄存器部分设置在周边电路部分的上下方向并垂直于外围电路部分,并使存储器核心和移位寄存器装置在 水平方向,可以使存储器芯和移位寄存器部分之间的数据/信号线短,并且可以保持互连的对称性,这允许实现高速和大面积的半导体存储器件。 另外,通过将每个对应于数据块的移位寄存器堆叠并选择堆叠移位寄存器的顺序,使得外围电路与移位之间的互连长度可以获得更快的半导体存储器 寄存器被最小化。
    • 8. 发明授权
    • Dynamic random access memory device and semiconductor integrated circuit device
    • 动态随机存取存储器件和半导体集成电路器件
    • US06496442B2
    • 2002-12-17
    • US10076558
    • 2002-02-19
    • Masaru KoyanagiKaoru NakagawaTakahiko HaraSatoru Takase
    • Masaru KoyanagiKaoru NakagawaTakahiko HaraSatoru Takase
    • G11C800
    • G11C8/18G11C8/12G11C11/406
    • A DRAM, including a plurality of banks each having a plurality of sub-arrays, and sense amplifier circuits commonly shared by sub-arrays in different banks, has a row access mode for activating a sub-array selected from each bank for reading or writing data, and a refresh mode for activating a plurality of sub-arrays in each bank and refreshing memory cell data therein at substantially the same timing. Sub-arrays in each bank activated at substantially the same timing in the refresh mode are more than sub-arrays in each bank activated in the row access model. Thereby, occurrence of operation constrains is minimized to ensure high-speed operation and improve the system performance of DRAMs employing the non-independent bank system.
    • 包括多个具有多个子阵列的多个存储体的DRAM和通常由不同存储体中的子阵列共享的读出放大器电路具有用于激活从每个存储体中选择的用于读取或写入的子阵列的行访问模式 数据和刷新模式,用于激活每个存储体中的多个子阵列,并以基本相同的定时刷新存储器单元数据。 在刷新模式中基本上相同的定时激活的每个存储体中的子阵列多于在行存取模型中激活的每个存储体中的子阵列。 由此,操作约束的发生被最小化以确保高速操作,并且提高采用非独立银行系统的DRAM的系统性能。