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    • 5. 发明授权
    • Compact ReRAM based FPGA
    • 紧凑型基于ReRAM的FPGA
    • US09444464B1
    • 2016-09-13
    • US15010222
    • 2016-01-29
    • Microsemi SoC Corporation
    • John L. McCollumFethi Dhaoui
    • G11C11/00H03K19/177G11C13/00
    • H01L27/2454G11C13/003G11C13/0069G11C2213/74G11C2213/78G11C2213/79G11C2213/82H01L21/768H01L45/16H03K19/1776
    • A push-pull resistive random access memory cell circuit includes an output node, a word line, a first bit line, and a second bit line. A first resistive random access memory device is connected between the first bit line and the output node and a second resistive random access memory device is connected between the output node and the second bit line. A first programming transistor has a gate connected to the word line, a drain connected to the output node, and a source. A second programming transistor has a gate connected to the word line, a drain connected to the source of the first programming transistor, and a source. The first and second programming transistors have the same pitch, the same channel length, and the same gate dielectric thickness, the gate dielectric thickness chosen to withstand programming and erase potentials encountered during operation of the push-pull ReRAM cell circuit.
    • 推挽电阻随机存取存储器单元电路包括输出节点,字线,第一位线和第二位线。 第一电阻随机存取存储器件连接在第一位线和输出节点之间,第二电阻随机存取存储器件连接在输出节点和第二位线之间。 第一编程晶体管具有连接到字线的栅极,连接到输出节点的漏极和源极。 第二编程晶体管具有连接到字线的栅极,连接到第一编程晶体管的源极的漏极和源极。 第一和第二编程晶体管具有相同的间距,相同的沟道长度和相同的栅介质厚度,选择栅极电介质厚度以承受在推挽式ReRAM单元电路的操作期间遇到的编程和擦除电位。
    • 7. 发明申请
    • IDENTIFYING INTEGRATED CIRCUIT ORIGIN USING TOOLING SIGNATURE
    • 使用工具识别识别集成电路原点
    • US20150370247A1
    • 2015-12-24
    • US14747758
    • 2015-06-23
    • Microsemi SoC Corporation
    • G. Richard NewellRussell Robert Garcia
    • G05B19/418
    • G05B19/41875G05B2219/32222Y02P90/22
    • A method for determining if an individual integrated circuit was manufactured using an individual instance of tooling includes collecting from the individual integrated circuit first data representing at least one attribute that varies as a function of the tooling used to manufacture the individual integrated circuit and second data identifying the integrated circuit as having been manufactured using the individual instance of tooling. The first data is compared to a signature of the individual instance of tooling identified by the second data. The signature is derived from the at least one attribute measured from a population of integrated circuits that were manufactured using the individual instance of tooling. The individual integrated circuit is identified as having been manufactured using the individual instance of tooling identified in the second data collected from the individual integrated circuit if the first data correlates to the signature by a predetermined threshold.
    • 用于确定单个集成电路是否使用单个工具实例来制造的方法包括从各个集成电路收集首先表示至少一个属性的数据,所述属性随着用于制造单个集成电路的工具而变化,并且第二数据识别 集成电路已经使用工具的单独实例制造。 将第一数据与由第二数据标识的工具的单个实例的签名进行比较。 签名是从使用个别工具实例制造的集成电路群体测量的至少一个属性导出的。 如果第一数据与签名相关联的预定阈值,则将个体集成电路识别为已经使用从单个集成电路收集的第二数据中标识的工具的单独实例来制造。
    • 9. 发明申请
    • Background Auto-refresh Apparatus and Method for Non-Volatile Memory Array
    • 背景自动刷新装置和非易失性存储器阵列的方法
    • US20140269133A1
    • 2014-09-18
    • US14208513
    • 2014-03-13
    • Microsemi SoC Corporation
    • John McCollum
    • G11C11/406
    • H03K19/1776G11C11/23G11C16/3431
    • A method for automatically refreshing a non-volatile memory array in the background without memory interruption includes selecting an unrefreshed segment of the memory, reading data from each row in the selected segment during memory dead time and storing the data read from each row in a local temporary storage memory until an entire segment is read out, remapping all memory addresses in the selected segment to the temporary storage memory, isolating column lines in the selected segment from global column lines, erasing the data in the selected segment without disturbing the column lines, rewriting memory data in each row of the selected segment, remapping all memory addresses in the selected segment to the memory, and repeating the process until all segments have been refreshed.
    • 用于在没有存储器中断的情况下自动刷新背景中的非易失性存储器阵列的方法包括选择存储器的未刷新段,在存储器死区时间期间从所选段中的每一行读取数据,并将从每行读取的数据存储在本地 临时存储器,直到读出整个段,将所选段中的所有存储器地址重新映射到临时存储器,将所选段中的列与全局列线隔离,擦除所选段中的数据而不干扰列线, 重写所选段的所有存储器地址到存储器,并重复该过程,直到所有段被刷新。