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    • 5. 发明授权
    • Memory cell with volatile and non-volatile storage
    • 具有易失性和非易失性存储的存储单元
    • US09117521B2
    • 2015-08-25
    • US14126067
    • 2012-06-14
    • Yoann GuillemenetLionel Torres
    • Yoann GuillemenetLionel Torres
    • G11C11/00G11C13/00G11C11/16G11C14/00
    • G11C13/0069G11C7/106G11C11/161G11C13/0002G11C14/0081G11C14/009
    • The invention concerns a non-volatile memory element comprising: first and second transistors (106, 108) forming an inverter (104) coupled between a first storage node (112) and an output (110) of the memory element; a third transistor (116) coupled between the first storage node (112) and a first supply voltage (GND, VDD) and comprising a control terminal coupled to said output; a first resistance switching element (102) coupled in series with said third transistor and programmed to have one of first and second resistances (Rmin, Rmax) representing a non-volatile data bit; a fourth transistor (118) coupled between said storage node (112) a second supply voltage (VDD, GND); and control circuitry (130) adapted to activate said third transistor at the start of a transfer phase of said non-volatile data bit to said storage node, and to control said fourth transistor to couple said storage node to said second supply voltage during said transfer phase.
    • 本发明涉及一种非易失性存储元件,包括:第一和第二晶体管(106,108),形成耦合在存储元件的第一存储节点(112)和输出(110)之间的反相器(104) 耦合在所述第一存储节点(112)和第一电源电压(GND,VDD)之间并包括耦合到所述输出的控制端的第三晶体管(116) 与所述第三晶体管串联耦合的第一电阻开关元件(102),并被编程为具有表示非易失性数据位的第一和第二电阻(Rmin,Rmax)之一; 耦合在所述存储节点(112)之间的第二电源电压(VDD,GND)的第四晶体管(118) 以及控制电路(130),适于在所述非易失性数据位的传送阶段开始时激活所述第三晶体管到所述存储节点,并且在所述传输期间控制所述第四晶体管将所述存储节点耦合到所述第二电源电压 相。
    • 6. 发明授权
    • Programmable volatile/non-volatile memory cell
    • 可编程易失性/非易失性存储单元
    • US09042157B2
    • 2015-05-26
    • US13980558
    • 2012-01-19
    • Yoann GuillemenetLionel Torres
    • Yoann GuillemenetLionel Torres
    • G11C13/00G11C11/16G11C11/412
    • G11C13/0069G11C11/16G11C11/1657G11C11/1659G11C11/1675G11C11/1693G11C11/412G11C13/0002G11C13/0028G11C14/0081G11C14/009
    • The invention concerns a memory device comprising at least one memory cell comprising: a first transistor (102) coupled between a first storage node (106) and a first supply line (GND, VDD); a second transistor (104) coupled between a second storage node and said first supply line (GND, VDD), control terminals of said first and second transistors being coupled to said second and first storage nodes respectively; a third transistor (110) coupled between said first storage node and a first access line (BL) and controllable via a first control line (WL1); a fourth transistor (112, 712) coupled between said second storage node (108) and a second access line (BLB) and controllable via a second control line; and a first resistance switching element (202) coupled in series with said first transistor and programmable to have one of first and second resistive states.
    • 本发明涉及一种包括至少一个存储单元的存储器件,包括:耦合在第一存储节点(106)和第一电源线(GND,VDD)之间的第一晶体管(102) 耦合在第二存储节点和所述第一电源线(GND,VDD)之间的第二晶体管(104),所述第一和第二晶体管的控制端分别耦合到所述第二和第一存储节点; 耦合在所述第一存储节点和第一接入线路(BL)之间并通过第一控制线路(WL1)可控的第三晶体管; 耦合在所述第二存储节点(108)和第二接入线(BLB)之间并经由第二控制线可控的第四晶体管(112,712); 以及与所述第一晶体管串联耦合的第一电阻开关元件(202),并且可编程为具有第一和第二电阻状态之一。
    • 7. 发明申请
    • MEMORY CELL WITH VOLATILE AND NON-VOLATILE STORAGE
    • 具有挥发性和非挥发性储存的记忆体
    • US20140269003A1
    • 2014-09-18
    • US14126067
    • 2012-06-14
    • Yoann GuillemenetLionel Torres
    • Yoann GuillemenetLionel Torres
    • G11C13/00
    • G11C13/0069G11C7/106G11C11/161G11C13/0002G11C14/0081G11C14/009
    • The invention concerns a non-volatile memory element comprising: first and second transistors (106, 108) forming an inverter (104) coupled between a first storage node (112) and an output (110) of the memory element; a third transistor (116) coupled between the first storage node (112) and a first supply voltage (GND, VDD) and comprising a control terminal coupled to said output; a first resistance switching element (102) coupled in series with said third transistor and programmed to have one of first and second resistances (Rmin, Rmax) representing a non-volatile data bit; a fourth transistor (118) coupled between said storage node (112) a second supply voltage (VDD, GND); and control circuitry (130) adapted to activate said third transistor at the start of a transfer phase of said non-volatile data bit to said storage node, and to control said fourth transistor to couple said storage node to said second supply voltage during said transfer phase.
    • 本发明涉及一种非易失性存储元件,包括:第一和第二晶体管(106,108),形成耦合在存储元件的第一存储节点(112)和输出(110)之间的反相器(104) 耦合在所述第一存储节点(112)和第一电源电压(GND,VDD)之间并包括耦合到所述输出的控制端的第三晶体管(116) 与所述第三晶体管串联耦合的第一电阻开关元件(102),并被编程为具有表示非易失性数据位的第一和第二电阻(Rmin,Rmax)之一; 耦合在所述存储节点(112)之间的第二电源电压(VDD,GND)的第四晶体管(118) 以及控制电路(130),适于在所述非易失性数据位的传送阶段开始时激活所述第三晶体管到所述存储节点,并且在所述传输期间控制所述第四晶体管将所述存储节点耦合到所述第二电源电压 相。
    • 8. 发明申请
    • PROGRAMMABLE VOLATILE/NON-VOLATILE MEMORY CELL
    • 可编程易失性/非易失性存储单元
    • US20140050012A1
    • 2014-02-20
    • US13980558
    • 2012-01-19
    • Yoann GuillemenetLionel Torres
    • Yoann GuillemenetLionel Torres
    • G11C13/00
    • G11C13/0069G11C11/16G11C11/1657G11C11/1659G11C11/1675G11C11/1693G11C11/412G11C13/0002G11C13/0028G11C14/0081G11C14/009
    • The invention concerns a memory device comprising at least one memory cell comprising: a first transistor (102) coupled between a first storage node (106) and a first supply line (GND, VDD); a second transistor (104) coupled between a second storage node and said first supply line (GND, VDD), control terminals of said first and second transistors being coupled to said second and first storage nodes respectively; a third transistor (110) coupled between said first storage node and a first access line (BL) and controllable via a first control line (WL1); a fourth transistor (112, 712) coupled between said second storage node (108) and a second access line (BLB) and controllable via a second control line; and a first resistance switching element (202) coupled in series with said first transistor and programmable to have one of first and second resistive states.
    • 本发明涉及一种包括至少一个存储单元的存储器件,包括:耦合在第一存储节点(106)和第一电源线(GND,VDD)之间的第一晶体管(102) 耦合在第二存储节点和所述第一电源线(GND,VDD)之间的第二晶体管(104),所述第一和第二晶体管的控制端分别耦合到所述第二和第一存储节点; 耦合在所述第一存储节点和第一接入线路(BL)之间并通过第一控制线路(WL1)可控的第三晶体管; 耦合在所述第二存储节点(108)和第二接入线(BLB)之间并经由第二控制线可控的第四晶体管(112,712); 以及与所述第一晶体管串联耦合的第一电阻开关元件(202),并且可编程为具有第一和第二电阻状态之一。
    • 10. 发明申请
    • COMPACT VOLATILE/NON-VOLATILE MEMORY CELL
    • 紧急挥发性/非易失性记忆细胞
    • US20140043062A1
    • 2014-02-13
    • US13980529
    • 2012-01-19
    • Yoann GuillemenetLionel Torres
    • Yoann GuillemenetLionel Torres
    • G11C13/00H03K19/177
    • G11C13/003G11C11/15G11C11/16G11C11/1659G11C11/1675G11C11/1693G11C11/412G11C13/0002G11C13/0069G11C14/0081G11C14/009H03K19/1776
    • The invention concerns a memory device comprising at least one memory cell comprising: a first transistor (102) coupled between a first storage node (106) and a first supply voltage (GND, VDD); a second transistor (104) coupled between a second storage node (108) and said first supply voltage, control terminals of the first and second transistors being coupled to the second and first storage nodes respectively; and a single resistance switching element (202), wherein said single resistive switching element is coupled in series with said first transistor and is programmable to have one of first and second resistances (Rmin, Rmax), wherein said first storage node is coupled to a first access line (BL) via a third transistor (110, 810) connected to said first storage node, and said second storage node is coupled to a second access line (BLB) via a fourth transistor (112, 812) connected to said second storage node.
    • 本发明涉及一种包括至少一个存储单元的存储器件,包括:耦合在第一存储节点(106)和第一电源电压(GND,VDD)之间的第一晶体管(102) 耦合在第二存储节点(108)和所述第一电源电压之间的第二晶体管(104),所述第一和第二晶体管的控制端分别耦合到所述第二和第一存储节点; 和单电阻开关元件(202),其中所述单电阻开关元件与所述第一晶体管串联耦合,并且可编程为具有第一和第二电阻(Rmin,Rmax)中的一个,其中所述第一存储节点耦合到 第一接入线路(BL)经由连接到所述第一存储节点的第三晶体管(110,810),并且所述第二存储节点经由连接到所述第二存储节点的第四晶体管(112,812)耦合到第二存取线路(BLB) 存储节点。