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    • 7. 发明申请
    • Magnetic Tunnel Junction for MRAM Applications
    • MRAM应用的磁隧道结
    • US20160211442A1
    • 2016-07-21
    • US14979949
    • 2015-12-28
    • Headway Technologies, Inc.
    • Wei CaoCheng T. HorngWitold KulaChyu Jiuh Torng
    • H01L43/10H01L43/08G11C11/16H01L43/02
    • H01L43/10G11C11/161H01L27/222H01L43/00H01L43/02H01L43/08
    • A MTJ in an MRAM array is disclosed with a composite free layer having a lower crystalline layer contacting a tunnel barrier and an upper amorphous layer for improved bit switching performance. According to one embodiment, the amorphous layer has a NiFeM1/NiFeM2 configuration where M1 and M2 are Mg, Hf, Zr, Nb, or Ta, and M1 is unequal to M2. The crystalline layer is Fe, Ni, or FeB with a thickness of at least 6 Angstroms that affords a high magnetoresistive ratio. The M1 and M2 elements in the NiFeM1 and NiFeM2 layers each have a content of 5 to 30 atomic %. The NiFeM1/NiFeM2 configuration substantially reduces bit line switching current and number of shorted bits. In an alternative embodiment, the crystalline layer may be a Fe/NiFe bilayer. Annealing at 300° C. to 360° C. provides a high magnetoresistive ratio of about 150%.
    • 公开了一种MRAM阵列中的MTJ,其具有与隧道势垒和上部非晶层接触的较低结晶层的复合自由层,以改善位切换性能。 根据一个实施例,非晶层具有其中M1和M2是Mg,Hf,Zr,Nb或Ta的NiFeM1 / NiFeM2构型,M1不等于M2。 结晶层是厚度至少为6埃的Fe,Ni或FeB,具有高的磁阻比。 NiFeM1和NiFeM2层中的M1和M2元素各自具有5至30原子%的含量。 NiFeM1 / NiFeM2配置大大减少了位线切换电流和短路位数。 在替代实施例中,结晶层可以是Fe / NiFe双层。 在300℃至360℃退火,提供约150%的高磁阻比。