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    • 8. 发明授权
    • Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit
    • 使用开关电容电路的批量CMOS QCRIT测量方法
    • US07881135B2
    • 2011-02-01
    • US11679406
    • 2007-02-27
    • Ethan H. CannonAlan J. DrakeFadi H. GebaraJohn P. KeaneAJ Kleinosowski
    • Ethan H. CannonAlan J. DrakeFadi H. GebaraJohn P. KeaneAJ Kleinosowski
    • G11C29/00
    • G01R31/318594G01R31/318597
    • A test setup for estimating the critical charge of a circuit under test (CUT) uses a charge injection circuit having a switched capacitor that is selectively connected to a node of the CUT. A voltage measurement circuit measures the voltage at a tap in the charge injection circuit before and after the charge is injected. When the injected charge causes an upset in the logical state of the CUT, the critical charge is calculated as the product of the voltage difference and the known capacitance of the capacitor. In one embodiment, (NMOS drain strike simulation) the amount of charge injected is controlled by a variable pulse width generator gating the switch of the charge injection circuit. In another embodiment (PMOS drain strike simulation) the amount of charge injected is controlled by a variable voltage supply selectively connected to the charge storage node.
    • 用于估计被测电路的临界电荷的测试装置(CUT)使用具有选择性地连接到CUT的节点的开关电容器的电荷注入电路。 电压测量电路测量电荷注入前后电荷注入电路中的电压。 当注入的电荷导致CUT的逻辑状态不正常时,临界电荷被计算为电压差和电容器的已知电容的乘积。 在一个实施例中,(NMOS漏极击穿模拟)通过门控电荷注入电路的开关的可变脉冲宽度发生器来控制注入的电荷量。 在另一实施例(PMOS漏极击穿模拟)中,注入的电荷量由选择性地连接到电荷存储节点的可变电压电源来控制。
    • 9. 发明授权
    • Dynamic logic circuit incorporating reduced leakage state-retaining devices
    • 动态逻辑电路结合了减少的泄漏状态保持装置
    • US07193446B2
    • 2007-03-20
    • US10992486
    • 2004-11-18
    • Hung Cai NgoJente Benedict KuangHarmander Singh DeogunAJ Kleinosowski
    • Hung Cai NgoJente Benedict KuangHarmander Singh DeogunAJ Kleinosowski
    • H03K19/094
    • H03K19/0963H03K19/0016
    • A dynamic logic circuit incorporating reduced leakage state-retaining devices reduces power consumption of processors and other systems incorporating dynamic circuits. A keeper circuit provides a low leakage retention of the state of the output stage of the dynamic circuit so that an output circuit foot device can be disabled except when required for a transition in the output of the dynamic circuit. The keeper circuit includes a transistor having a smaller area than a corresponding transistor in the output circuit, thus reducing leakage through the gate of the output circuit when the keeper circuit is holding the output and the output circuit foot device is disabled. A self-clocked control of the output circuit foot device can be provided via a delayed version of the dynamic logic gate output, or may be provided by an external control circuit that generates a delayed version of the precharge clock or a multi-cycle signal.
    • 结合减少泄漏状态保持装置的动态逻辑电路降低了处理器和其他结合动态电路的系统的功耗。 保持器电路提供动态电路的输出级的状态的低泄漏保持,使得输出电路脚装置可以被禁用,除非在动态电路的输出中需要转换。 保持器电路包括具有比输出电路中的对应晶体管更小的面积的晶体管,从而当保持器电路保持输出并且输出电路脚器件被禁用时减小通过输出电路的栅极的泄漏。 可以通过延迟版本的动态逻辑门输出来提供输出电路脚装置的自定时控制,或者可以由产生预充电时钟的延迟版本或多周期信号的外部控制电路提供。