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    • 1. 发明申请
    • Double Data Rate Chaining for Synchronous DDR Interfaces
    • 双数据速率链接同步DDR接口
    • US20070300095A1
    • 2007-12-27
    • US11426651
    • 2006-06-27
    • Michael FeePatrick J. MeaneyChristopher J. BerryJonathan Y. ChenAlan P. Wagstaff
    • Michael FeePatrick J. MeaneyChristopher J. BerryJonathan Y. ChenAlan P. Wagstaff
    • G06F1/12
    • G06F13/4217
    • A system and method in which the receiving chip separately latches each half of the data received from the double data rate bus. Each half is launched as soon as it is available; one on the normal chip cycle time and the other is launched from a Master (L1) latch a half cycle into the normal chip cycle time. The first launched half of the data proceeds through the chip along its standard design chip path to be captured by the chips driving interface latch and launched again after one cycle of latency on the chip. The second half of the data proceeds through the chip one half cycle behind the first half, and is latched a half clock cycle later part way through the path into a Slave (L2) latch. On the next edge of the local clock, the data then continues from the L2 latch to the driving double data rate interface. This allows a half cycle set up time for the second half of the data so that it can be launched again, maintaining a one-cycle time on the chip.
    • 一种系统和方法,其中接收芯片分别锁存从双数据速率总线接收​​的数据的每一半。 每一半都可以立即启动; 一个在正常的芯片周期时间,另一个从主(L1)锁存器半个周期启动到正常的芯片周期时间。 首先推出的一半数据通过芯片沿其标准设计芯片路径进行,由芯片驱动接口锁存器捕获,并在芯片上的一个延迟周期后再次启动。 数据的后半部分通过芯片在上半部分后半个周期进行,并且稍后通过进入从(L2)锁存器的路径被锁存半个时钟周期。 在本地时钟的下一个边缘,数据然后从L2锁存器继续到驱动双数据速率接口。 这允许半周期的半周期设置时间,以便可以再次启动,在芯片上保持一个周期的时间。
    • 2. 发明授权
    • Double data rate chaining for synchronous DDR interfaces
    • 双数据速率链接同步DDR接口
    • US07739538B2
    • 2010-06-15
    • US11426651
    • 2006-06-27
    • Michael FeePatrick J. MeaneyChristopher J. BerryJonathan Y. ChenAlan P. Wagstaff
    • Michael FeePatrick J. MeaneyChristopher J. BerryJonathan Y. ChenAlan P. Wagstaff
    • G06F5/06G11C8/16
    • G06F13/4217
    • A system and method in which the receiving chip separately latches each half of the data received from the double data rate bus. Each half is launched as soon as it is available; one on the normal chip cycle time and the other is launched from a Master (L1) latch a half cycle into the normal chip cycle time. The first launched half of the data proceeds through the chip along its standard design chip path to be captured by the chips driving interface latch and launched again after one cycle of latency on the chip. The second half of the data proceeds through the chip one half cycle behind the first half, and is latched a half clock cycle later part way through the path into a Slave (L2) latch. On the next edge of the local clock, the data then continues from the L2 latch to the driving double data rate interface. This allows a half cycle set up time for the second half of the data so that it can be launched again, maintaining a one-cycle time on the chip.
    • 一种系统和方法,其中接收芯片分别锁存从双数据速率总线接收​​的数据的每一半。 每一半都可以立即启动; 一个在正常的芯片周期时间,另一个从主(L1)锁存器半个周期启动到正常的芯片周期时间。 首先推出的一半数据通过芯片沿其标准设计芯片路径进行,由芯片驱动接口锁存器捕获,并在芯片上的一个延迟周期后再次启动。 数据的后半部分通过芯片在上半部分后半个周期进行,并且稍后通过进入从(L2)锁存器的路径被锁存半个时钟周期。 在本地时钟的下一个边缘,数据然后从L2锁存器继续到驱动双数据速率接口。 这允许半周期的半周期设置时间,以便可以再次启动,在芯片上保持一个周期的时间。
    • 7. 发明授权
    • Method for providing an area optimized binary orthogonality checker
    • 提供区域优化二进制正交检验器的方法
    • US07275224B2
    • 2007-09-25
    • US10817279
    • 2004-04-02
    • Patrick J. MeaneyAlan P. Wagstaff
    • Patrick J. MeaneyAlan P. Wagstaff
    • G06F17/50H04J11/00G06F13/00G06F3/00G06F15/173
    • G06F17/5045
    • A method for minimizing the area of a binary orthogonality checker implemented in static CMOS circuits for minimizing the gate count and area needed for checker implementation. The method is adaptable to various libraries of logical gates to implement the circuit and the area for each gate in the library. The optimal mix of hierarchical levels and stages is determined such that the orthogonality checker achieves the minimized circuit area. An orthogonality checker is employed in a scalable selector system for controlling data transfers and routing in a data processing system to allow. Combining orthogonality checking with existing selector hierarchically allows for the maximum reuse of circuits, signals, and proximity; thus potentially reducing wiring as well. Multiple hierarchical checks are used in favor of one large. This structure is extended to multiple hierarchical levels and works with orthogonality checks of any size or implementation. The invention also determines the optimal hierarchical structure for a given technology library and a given number of inputs to check. It can also be used within a flat hierarchy or macro as a technique to reduce circuits.
    • 一种用于最小化在静态CMOS电路中实现的二进制正交检验器的面积的方法,用于最小化检验器实现所需的门数和面积。 该方法适用于逻辑门的各种库,以实现库中每个门的电路和区域。 确定层次级别和级别的最佳组合,使得正交检验器实现最小化的电路面积。 在可扩展选择器系统中采用正交检验器,用于在数据处理系统中控制数据传输和路由以允许。 将正交检查与现有选择器分层组合允许电路,信号和接近度的最大重用; 从而潜在地减少布线。 使用多层次检查有利于一个大型。 该结构扩展到多个层次级别,并且可以与任何大小或实现的正交性检查一起工作。 本发明还确定给定技术库的最优层次结构以及给定数量的输入以进行检查。 它也可以在平面层级或宏中用作减少电路的技术。