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    • 8. 发明授权
    • Systems and methods for performing multi-state bit flipping in an LDPC decoder
    • 用于在LDPC解码器中执行多状态位翻转的系统和方法
    • US08694868B1
    • 2014-04-08
    • US13300323
    • 2011-11-18
    • Shashi Kiran ChilappagariNedeljko VarnicaXueshi YangGregory Burd
    • Shashi Kiran ChilappagariNedeljko VarnicaXueshi YangGregory Burd
    • H03M13/00
    • H03M13/1108H03M13/1137H03M13/6577
    • Systems and methods are provided for decoding data using hard decisions and soft information. In particular, the systems and methods described herein are directed to decoders having variable nodes and check nodes, each with multiple states. The systems and methods include receiving, at a decoder during a first iteration, values for each of a plurality of variable nodes, and determining, during a second iteration, one or more indications for each of a plurality of check nodes based on the one or more values of the variable nodes received during the first iteration. The methods further include updating, at the decoder during the second iteration, the values for each of the variable nodes based on the values of the respective variable node received during the first iteration, and the indications for each of the plurality connected check nodes during the first iteration.
    • 提供了使用硬判决和软信息对数据进行解码的系统和方法。 特别地,这里描述的系统和方法涉及具有可变节点和校验节点的解码器,每个具有多个状态。 所述系统和方法包括在第一次迭代期间在解码器处接收多个变量节点中的每一个的值,以及在第二迭代期间,基于所述一个或多个节点在多个检查节点中的每一个确定一个或多个指示 在第一次迭代期间接收到的变量节点的更多值。 所述方法还包括在第二次迭代期间在解码器处更新基于在第一次迭代期间接收到的相应可变节点的值的每个变量节点的值,以及在该第一迭代期间针对多个连接的校验节点中的每一个的指示 第一次迭代
    • 10. 发明授权
    • Determining optimal reference voltages for progressive reads in flash memory systems
    • 确定闪存系统中逐行读取的最佳参考电压
    • US08531888B2
    • 2013-09-10
    • US13167896
    • 2011-06-24
    • Shashi Kiran ChilappagariXueshi Yang
    • Shashi Kiran ChilappagariXueshi Yang
    • G11C11/34
    • G11C16/26G11C11/5642
    • A system including a reference voltage module to select a first reference voltage between a first threshold voltage corresponding to a first state of a memory cell and a second threshold voltage corresponding to a second state of the memory cell, a second reference voltage less than the first reference voltage, and a third reference voltage greater than the first reference voltage. The system includes a read module to perform a first read operation to determine a state of the memory cell based on the first reference voltage, and in response to a first failure to decode data read from the memory cell in the first read operation, perform a second read operation to determine the state based on the second reference voltage and a third read operation to determine the state based on the third reference voltage.
    • 一种包括参考电压模块的系统,用于在对应于存储单元的第一状态的第一阈值电压与对应于存储单元的第二状态的第二阈值电压之间选择第一参考电压,小于第一参考电压的第一参考电压 参考电压和大于第一参考电压的第三参考电压。 该系统包括读取模块,用于执行第一读取操作以基于第一参考电压确定存储器单元的状态,并且响应于在第一读取操作中对从存储器单元读取的数据进行解码的第一个故障,执行一个 第二读取操作,以基于第二参考电压确定状态,以及第三读取操作,以基于第三参考电压来确定状态。