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    • 1. 发明授权
    • Mixed granularity higher-level redundancy for non-volatile memory
    • 非易失性存储器的混合粒度更高级冗余
    • US08856431B2
    • 2014-10-07
    • US13565752
    • 2012-08-02
    • Zhengang ChenYunxiang Wu
    • Zhengang ChenYunxiang Wu
    • G06F12/00
    • G06F11/1068G06F11/1048G06F11/108G11C29/52
    • Mixed-granularity higher-level redundancy for NVM provides improved higher-level redundancy operation with better error recovery and/or reduced redundancy information overhead. For example, pages of the NVM that are less reliable, such as relatively more prone to errors, are operated in higher-level redundancy modes having relatively more error protection, at a cost of relatively more redundancy information. Concurrently, blocks of the NVM that are more reliable are operated in higher-level redundancy modes having relatively less error protection, at a cost of relatively less redundancy information. Compared to techniques that operate the entirety of the NVM in the higher-level redundancy modes having relatively less error protection, techniques described herein provide better error recovery. Compared to techniques that operate the entirety of the NVM in the higher-level redundancy modes having relatively more error protection, the techniques described herein provide reduced redundancy information overhead.
    • NVM的混合级别更高级别的冗余提供了更高级别的冗余操作,具有更好的错误恢复和/或减少的冗余信息开销。 例如,以相对更多的冗余信息为代价,具有较不可靠性的诸如相对更易于出现错误的NVM的页面在具有相对更多的错误保护的较高级冗余模式中操作。 同时,更具可靠性的NVM块以牺牲相对较少的冗余信息为代价的具有相对较少的错误保护的较高级冗余模式运行。 与在较高级冗余模式下操作整个NVM的技术相比,具有相对更少的错误保护的技术相比,本文所述的技术提供更好的错误恢复。 与在具有相对更多的错误保护的较高级别冗余模式中操作NVM的整体的技术相比,本文所描述的技术提供减少的冗余信息开销。
    • 3. 发明申请
    • FLASH MEMORY READ ERROR RATE REDUCTION
    • 闪存读取错误速率减少
    • US20140026003A1
    • 2014-01-23
    • US13555444
    • 2012-07-23
    • Zhengang ChenYunxiang Wu
    • Zhengang ChenYunxiang Wu
    • G06F11/07
    • G06F11/1048G11C16/00G11C29/021G11C29/028G11C2029/0409
    • An apparatus having a first circuit and a second circuit is disclosed. The first circuit may be configured to (i) generate a reference voltage used by a memory circuit in a first read of a set of data and (ii) adjust the reference voltage based on a plurality of parameters to lower an error rate in a second read of the set from the memory circuit. The second circuit may be configured to update the parameters in response to an error correction applied to the set after the first read from the memory circuit. The memory circuit is generally configured to store the data in a nonvolatile condition by adjusting a plurality of threshold voltages.
    • 公开了一种具有第一电路和第二电路的装置。 第一电路可以被配置为(i)在一组数据的第一次读取中产生由存储器电路使用的参考电压,以及(ii)基于多个参数来调整参考电压以降低第二个中的错误率 从存储器电路读取该组。 第二电路可以被配置为响应于在从存储器电路的第一次读取之后施加到该组的错误校正来更新参数。 存储器电路通常被配置为通过调整多个阈值电压将数据存储在非易失性状态。
    • 5. 发明授权
    • Systems and methods for storing variable rate product codes
    • 用于存储可变费率产品代码的系统和方法
    • US08627183B1
    • 2014-01-07
    • US13100644
    • 2011-05-04
    • Zhengang ChenXueshi Yang
    • Zhengang ChenXueshi Yang
    • H03M13/00
    • H03M13/2909H03M13/1102H03M13/1515H03M13/152H03M13/19H03M13/23
    • Systems and methods for storing variable rate product codes are provided. A plurality of row code parity symbols is stored on a storage unit. Each symbol of the row code parity symbols is associated with a different one of a plurality of equal sized portions of information. A plurality of column code parity symbols is computed. Each of the plurality of column code parity symbols is computed based on (1) a respective one of the plurality of row code parity symbols and (2) the portion of information associated with the respective one of the plurality of row code parity symbols. Each of the plurality of column code parity symbols corresponds to one of at least two code rates. The plurality of column code parity symbols is stored on the storage unit.
    • 提供了用于存储可变速率产品代码的系统和方法。 多个行码奇偶校验符号被存储在存储单元上。 行码奇偶校验符号的每个符号与多个相等大小的信息部分中的不同的一个相关联。 计算多个列码奇偶校验符号。 基于(1)多个行码奇偶校验符号中的相应一个和(2)与多个行码奇偶校验符号中的相应一个相关联的信息的部分来计算多个列码奇偶校验符号中的每一个。 多个列码奇偶校验符号中的每一个对应于至少两个码率中的一个。 多个列码奇偶校验符号被存储在存储单元上。
    • 7. 发明授权
    • Flash memory read scrub and channel tracking
    • 闪存读取擦除和通道跟踪
    • US08914696B2
    • 2014-12-16
    • US13597489
    • 2012-08-29
    • Zhengang ChenEarl T. Cohen
    • Zhengang ChenEarl T. Cohen
    • G06F11/00G06F11/30G08C25/00H03M13/00H04L1/00
    • G06F11/106
    • An apparatus having a first circuit and a second circuit is disclosed. The first circuit may be configured to (i) read data from a region of a memory circuit during a read scrub of the region and (ii) generate a plurality of statistics based on (a) the data and (b) one or more bit flips performed during an error correction of the data. The memory circuit is generally configured to store the data in a nonvolatile condition. One or more reference voltages may be used to read the data. The second circuit may be configured to (i) update a plurality of parameters of the region based on the statistics and (ii) compute updated values of the reference voltages based on the parameters.
    • 公开了一种具有第一电路和第二电路的装置。 第一电路可以被配置为(i)在区域的读取擦除期间从存储器电路的区域读取数据,以及(ii)基于(a)数据生成多个统计信息,以及(b)一个或多个位 在数据的错误校正期间执行翻转。 存储器电路通常被配置为将数据存储在非易失性状态中。 可以使用一个或多个参考电压来读取数据。 第二电路可以被配置为(i)基于统计信息来更新区域的多个参数,以及(ii)基于参数计算参考电压的更新值。
    • 10. 发明申请
    • FLASH MEMORY READ SCRUB AND CHANNEL TRACKING
    • 闪存存储器读取SCRUB和通道跟踪
    • US20140068365A1
    • 2014-03-06
    • US13597489
    • 2012-08-29
    • Zhengang ChenEarl T. Cohen
    • Zhengang ChenEarl T. Cohen
    • G06F11/07
    • G06F11/106
    • An apparatus having a first circuit and a second circuit is disclosed. The first circuit may be configured to (i) read data from a region of a memory circuit during a read scrub of the region and (ii) generate a plurality of statistics based on (a) the data and (b) one or more bit flips performed during an error correction of the data. The memory circuit is generally configured to store the data in a nonvolatile condition. One or more reference voltages may be used to read the data. The second circuit may be configured to (i) update a plurality of parameters of the region based on the statistics and (ii) compute updated values of the reference voltages based on the parameters.
    • 公开了一种具有第一电路和第二电路的装置。 第一电路可以被配置为(i)在区域的读取擦除期间从存储器电路的区域读取数据,以及(ii)基于(a)数据生成多个统计信息,以及(b)一个或多个位 在数据的错误校正期间执行翻转。 存储器电路通常被配置为将数据存储在非易失性状态中。 可以使用一个或多个参考电压来读取数据。 第二电路可以被配置为(i)基于统计信息来更新区域的多个参数,以及(ii)基于参数计算参考电压的更新值。