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    • 7. 发明授权
    • Alarm clock
    • 闹钟
    • US5666331A
    • 1997-09-09
    • US309197
    • 1994-09-20
    • Adam J. Kollin
    • Adam J. Kollin
    • G04G13/02G04G15/00G04B21/08
    • G04G13/02G04G15/006
    • An alarm clock controls the supply of electrical power to a first outlet mounted on the clock housing and receiving a plug-in external electrical device to periodically change the state of the electrical device in response to an alarm time signal. A second controllable outlet is also mounted on the housing for receiving a second plug-in external electrical device. Selectible steady or pulse power is provided to the second outlet. A receiver detects power line carrier signals on the incoming electrical power lines generated by a remote device in response to the occurrence of a sound producing event or other signal. The receiver causes the clock to supply power to either or both outlets depending on the position of a function switch in response to a detected power line carrier signal. An audible sound generator provides an audible alarm tone in response to an alarm signal. Frequency and volume controls selectively vary the frequency and volume of the audible alarm tone. A test button activates the outlets and audible sound generators to test proper operation and desired settings of the alarm clock.
    • 闹钟控制对安装在时钟外壳上的第一插座的电力供应,并接收插入式外部电气设备,以响应于报警时间信号来周期性地改变电气设备的状态。 第二可控出口也安装在壳体上用于接收第二插入式外部电气装置。 可选择稳定或脉冲功率提供给第二个出口。 接收机响应于发生声音产生事件或其他信号来检测由远程设备产生的输入电力线上的电力线载波信号。 根据检测到的电力线载波信号,接收机根据功能开关的位置使时钟向两个或两个出口提供电力。 声音发声器响应于报警信号提供声音报警音。 频率和音量控制选择性地改变声音报警音的频率和音量。 测试按钮激活出口和声音发声器,以测试正确的操作和所需的闹钟设置。
    • 8. 发明授权
    • Probe holder and probe mounting method for a scanning probe microscope
    • 用于扫描探针显微镜的探头支架和探头安装方法
    • US5569918A
    • 1996-10-29
    • US406296
    • 1995-03-17
    • Zhouhang Wang
    • Zhouhang Wang
    • G01Q30/02G01Q70/02G01Q70/10G01Q70/16G12B5/00H01J37/20H01J37/28
    • G01Q30/02B82Y35/00G01Q70/02Y10S977/873
    • A probe holder non-rotatingly mountable in a support bracket releasibly receives a scanning microscope probe. Guide rods extend outward from the probe holder on the scan head and engage bores formed in the other of the probe holder and the scan head during closure of the scan head with the probe holder to co-axially align the probe with a probe receiver in the scan head. Transversely extending arms on a spindle attached to a scan head slide along ramp surfaces in the scan head to a fixed stop to rotationally position the scan head. Complementary surfaces on the spindle and a stationarily affixed sleeve co-axially center the scan head with the scan head support structure and the probe holder. A method of co-axially and rotationally aligning a probe for exchange between a scan head and a probe holder is disclosed using the guide rods and guide bores, the spindle arms, ramp and stop surfaces and the complementary surfaces on the spindle and the stationary sleeve, and a non-rotatable probe holder mount. The alignment structure and method are also applied to a sample holder.
    • 可旋转地安装在支撑支架中的探针支架可释放地接收扫描显微镜探针。 引导杆从扫描头上的探头支架向外延伸,并且在扫描头与探针支架关闭期间接合形成在探针支架和扫描头中的另一个中的孔,以使探针与探针接收器在轴向对准 扫描头。 安装在扫描头上的主轴上的横向延伸的臂沿着扫描头中的斜面滑动到固定的停止点以旋转地定位扫描头。 主轴上的互补表面和固定固定的套筒将扫描头与扫描头支撑结构和探头支架同轴居中。 公开了使用导向杆和引导孔,主轴臂,斜面和止动表面以及主轴和固定套筒上的互补表面的同轴和旋转对准探针以在扫描头和探针保持架之间进行交换的方法 ,以及不可旋转的探针支架。 对准结构和方法也适用于样品架。