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1. 发明申请

US20180231794A1 A VIBRATION DAMPING CONNECTOR AND USE OF THE VIBRATION DAMPING CONNECTOR 审中-公开
公开(公告)号：US20180231794A1
公开(公告)日：2018-08-16
申请号：US15743116
申请日：2016-07-12
申请人： INL-International Iberian Nanotechnology Laboratory
发明人： Pieter De Beule , Adelaide Miranda , Marco Martins
IPC分类号： G02B27/64 , F16F15/08
CPC分类号： G02B27/646 , F16F15/08 , F16F2226/042 , F16F2230/0005 , F16F2234/04 , G01Q30/025 , G02B7/14 , G02B21/0088 , G02B21/362
摘要： The present invention refers to a vibration damping connector (100) for reducing vibrations between a vibration prone system and an optical imaging system, said vibration damping connector comprising a first part (1) adapted to be connected to said optical imaging system, a second part (2) adapted to be connected to said vibration prone system, and at least one first shock absorbing element (3), a portion of said first part (1) is arranged inside a portion of said second part (2) along a central axis (A) or a portion of said second part (2) is arranged inside a portion of said first part (1) along a central axis (A) and said at least one flexible shock absorbing element (3) is arranged between said first part (1) and said second part (2), said vibration damping connector (100) further comprises at least one fastening device (4) for fastening said first part (1) to said second part (2) and said fastening device (2) presses said first part(1) to said second part (2) via a second shock absorbing element (5). Furthermore, use of the vibration damping. connector, in an optical system is disclosed.

2. 发明申请

US20170199220A1 Systems and Devices for Non-Destructive Surface Chemical Analysis of Samples 有权
公开(公告)号：US20170199220A1
公开(公告)日：2017-07-13
申请号：US15428552
申请日：2017-02-09
申请人： AIST-NT, Inc.
发明人： Sergey A. Saunin , Andrey V. Krayev , Vladimir V. Zhishimontov , Vasily V. Gavrilyuk , Leonid N. Grigorov , Alexey V. Belyaev , Dmitry A. Evplov
IPC分类号： G01Q30/02 , G01Q20/00 , G01Q10/00
CPC分类号： G01Q30/02 , G01Q10/00 , G01Q20/00 , G01Q30/025 , G01Q60/06
摘要： Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (“TERS”), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.

3. 发明授权

US09588327B2 Nanoindenter multimodal microscope objective for mechanobiology 有权
标题翻译： Nanoindenter多模式显微镜物镜的机械生物学
公开(公告)号：US09588327B2
公开(公告)日：2017-03-07
申请号：US14537096
申请日：2014-11-10
申请人： The Board of Trustees of the University of Illinois
发明人： Kimani Toussaint , Placid Ferreira , Amy Wagoner Johnson , William Wilson
IPC分类号： G01L1/24 , G02B21/04 , G01Q30/02 , G01Q60/36
CPC分类号： G02B21/04 , G01Q30/025 , G01Q60/366
摘要： Methods and apparatus for characterizing a sample in situ as to both its mechanical and optical characteristics. The apparatus comprises a reflective microscope with a concave primary mirror and a convex secondary mirror sharing a common optical axis, and an actuator vignetted by the convex secondary mirror for applying a force to a nanoprobe in a direction having a component along the common optical axis. The apparatus may addition include a source for generating an illuminating beam, a detector, and a processor for forming an image based on a signal provided by the detector.
摘要翻译：用于将样品原位表征其机械和光学特性的方法和装置。该装置包括具有凹面主镜和共享共同光轴的凸面次级反射镜的反射显微镜，以及由凸面辅镜反射的致动器，用于沿具有沿共同光轴的分量的方向向纳米探针施加力。该装置还可以包括用于产生照明光束的源，检测器和用于基于由检测器提供的信号形成图像的处理器。

4. 发明授权

US09519005B2 Scanning mechanism and scanning probe microscope 有权
公开(公告)号：US09519005B2
公开(公告)日：2016-12-13
申请号：US14862538
申请日：2015-09-23
申请人： OLYMPUS CORPORATION
发明人： Nobuaki Sakai
IPC分类号： G01Q10/00 , G01Q20/02 , G01Q10/04 , G01Q30/02
CPC分类号： G01Q10/00 , G01Q10/04 , G01Q20/02 , G01Q30/025
摘要： A scanning mechanism includes a cantilever, an XY movable portion movable in X and Y directions parallel to an X-Y plane, an XY actuator to scan the XY movable portion in the X and Y directions, a Z actuator to scan the cantilever in a Z direction perpendicular to the X-Y plane, and a light condensing portion to cause light for detecting a displacement of the cantilever to enter the cantilever. The Z actuator and the light condensing portion are held by the XY movable portion and arranged side by side in projection to the X-Y plane.

5. 发明申请

US20150253355A1 NANOSCALE SCANNING SENSORS 审中-公开
标题翻译： NANOSCALE扫描传感器
公开(公告)号：US20150253355A1
公开(公告)日：2015-09-10
申请号：US14423123
申请日：2013-08-20
申请人： PRESIDENT AND FELLOWS OF HARVARD COLLEGE
发明人： Michael S. Grinolds , Sungkun Hong , Patrick Maletinsky , Amir Yacoby
IPC分类号： G01Q70/14 , G01N21/64 , G01Q60/54 , G01Q60/38
CPC分类号： G01Q70/14 , G01N21/645 , G01N24/10 , G01N2201/10 , G01Q30/025 , G01Q60/08 , G01Q60/38 , G01Q60/54 , G01R33/022 , G01R33/032 , G01R33/1284 , G01R33/323 , G01R33/60
摘要： A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.
摘要翻译：感测探针可以由金刚石材料形成，该金刚石材料包括配置成发射荧光的一个或多个自旋缺陷，并且距离感测探针的感测表面不超过50nm。感测探头可以包括由金刚石材料形成并被配置为将荧光光导向光输出耦合结构的输出端的光输出耦合结构。光学检测器可以检测从旋转缺陷发出的荧光，并且在光学引导通过其后从光学输出耦合结构的输出端射出。安装系统可以保持感测探头并且控制感测探头的感测表面与样本表面之间的距离，同时允许感测表面和样品表面之间的相对运动。

6. 发明授权

US08997260B2 Integrated microscope and related methods and devices 有权
标题翻译：综合显微镜及相关方法和装置
公开(公告)号：US08997260B2
公开(公告)日：2015-03-31
申请号：US14000895
申请日：2012-02-23
申请人： Ryan Murdick , Lukas Novotny
发明人： Ryan Murdick , Lukas Novotny
IPC分类号： G01Q60/18 , G01Q30/02 , B82Y35/00
CPC分类号： G01Q30/025 , B82Y35/00
摘要： An embodiment includes an integrated microscope including scanning probe microscopy (SPM) hardware integrated with optical microscopy hardware, and other embodiments include related methods and devices.
摘要翻译：一个实施例包括集成显微镜，其包括与光学显微硬件集成的扫描探针显微镜（SPM）硬件，并且其它实施例包括相关方法和装置。

7. 发明申请

US20150047080A1 COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICROSCOPE COMBINED, CONTROL DEVICE OF THE SAME, CONTROL METHOD AND CONTROL PROGRAM, AND STORAGE MEDIUM 审中-公开
标题翻译：具有扫描探针显微镜和光学显微镜组合的化合物显微镜，其控制装置，控制方法和控制程序以及存储介质
公开(公告)号：US20150047080A1
公开(公告)日：2015-02-12
申请号：US14522186
申请日：2014-10-23
申请人： OLYMPUS CORPORATION
发明人： Akira YAGI , Nobuaki SAKAI , Yoshitsugu UEKUSA , Shuichi ITO
IPC分类号： G01Q60/24
CPC分类号： G01Q60/24 , G01Q30/025 , G01Q30/04 , G02B21/0004 , G02B21/365
摘要： A compound microscope includes an optical microscope to acquire time-series successive optical observation images of an observation target, a scanning probe microscope to acquire time-series successive probe-derived observation images of the observation target, and a control device to simultaneously give a common control command to the optical microscope and the scanning probe microscope.
摘要翻译：复合显微镜包括光学显微镜，用于获取观察目标的时间序列连续的光学观察图像，扫描探针显微镜，以获取观察对象的时间序列连续的探测导出的观察图像;以及控制装置，以同时给出共同的控制命令到光学显微镜和扫描探针显微镜。

8. 发明授权

US08813261B2 Scanning probe microscope 有权
标题翻译：扫描探针显微镜
公开(公告)号：US08813261B2
公开(公告)日：2014-08-19
申请号：US13974634
申请日：2013-08-23
申请人： Hitachi High-Tech Science Corporation
发明人： Masato Iyoki , Naokatsu Nosaka , Hiroumi Momota , Junji Kuwahara
IPC分类号： G01Q30/18 , G01Q10/00 , G01Q30/02 , B82Y35/00
CPC分类号： G01Q10/00 , B82Y35/00 , G01Q30/025 , G01Q30/18
摘要： A scanning probe microscope including: a scanning probe microscope unit section including, a cantilever having a probe, a cantilever holder configured to fix the cantilever, a sample holder on which a sample is configured to be placed, a horizontal fine transfer mechanism configured to relatively scan a surface of the sample with the probe, a vertical fine transfer mechanism configured to control a distance between the probe and the sample surface, an optical microscope configured to observe the cantilever and the sample; a control device; an imaging device to which a viewing field, wider than that of the optical microscope and capable of observing the cantilever and the sample at the same time, can be set; and an image display device configured to display images observed by the optical microscope and the imaging device.
摘要翻译：一种扫描探针显微镜，包括：扫描探针显微镜单元部分，包括具有探针的悬臂，构造成固定所述悬臂的悬臂保持器，其上配置有待放置的样本的样本保持器，被配置为相对于所述样本的水平细转移机构用探针扫描样品的表面，配置成控制探针和样品表面之间的距离的垂直精细转移机构，配置成观察悬臂和样品的光学显微镜; 控制装置; 能够设置比光学显微镜宽的视场并且能够同时观察悬臂和样本的成像装置; 以及图像显示装置，被配置为显示由所述光学显微镜和所述成像装置观察到的图像。

9. 发明授权

US08443459B2 Fast-scanning SPM scanner and method of operating same 有权
标题翻译：快速扫描SPM扫描仪及其操作方法
公开(公告)号：US08443459B2
公开(公告)日：2013-05-14
申请号：US13435086
申请日：2012-03-30
申请人： Nghi Phan , Craig Cusworth , Craig Prater
发明人： Nghi Phan , Craig Cusworth , Craig Prater
IPC分类号： G01Q10/00 , G01Q20/02 , G01Q60/24
CPC分类号： G01Q10/02 , G01Q20/02 , G01Q30/025
摘要： A high-bandwidth SPM tip scanner includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam. Movable optics also are preferably provided to permit targeting of the sensing light beam on the SPM's probe and to permit the sensing light beam to track the probe during scanning. The targeting and tracking permit the impingement of a small sensing light beam spot on the probe under direct visual inspection of focused illumination beam of an optical microscope integrated into the SPM and, as a result, permits the use of a relatively small cantilever with a commensurately small resonant frequency. Images can be scanned on large samples having a largest dimension exceeding 7 mm with a resolution of less than 1 Angstrom and while scanning at rates exceeding 30 Hz.
摘要翻译：高带宽SPM尖端扫描器包括在扫描头内可垂直移动的物镜，以增加感测光束的聚焦深度。优选地提供可移动光学器件以允许在SPM的探针上瞄准感测光束，并允许感测光束在扫描期间跟踪探针。瞄准和跟踪允许在直接目视检查集成在SPM中的光学显微镜的聚焦照明光束上的探针上的小感测光束点的撞击，结果允许使用相对较小的悬臂小谐振频率。可以在尺寸超过7 mm的大样品上扫描图像，分辨率小于1埃，扫描速度超过30赫兹。

10. 发明申请

US20110173728A1 PROBE ALIGNMENT TOOL FOR THE SCANNING PROBE MICROSCOPE 有权
标题翻译：扫描探针显微镜探针对准工具
公开(公告)号：US20110173728A1
公开(公告)日：2011-07-14
申请号：US12998126
申请日：2008-09-18
申请人： Ali R. Afshari
发明人： Ali R. Afshari
IPC分类号： G01Q10/00
CPC分类号： G01Q40/00 , B82Y35/00 , G01Q30/025
摘要： A probe alignment tool (10) for scanning probe microscopes utilizes an attached relay optics to view the scanning probe microscope probe tip (40) and align its image in the center of the field of view of an optical microscope (36). Adjustments to optical microscope motorized stages (50) and (60) along with adjustments of scanning probe microscope stages (44), (46) and (58) allow determination of a path and distance from the center of the field of view to the probe tip (40). From such determination a target area to be examined by the scanning probe microscope may be positioned precisely and accurately under the probe tip (40). Replacement of a scanning probe microscope probe tip (40) in an atomic force microscope unit (42) may be accomplished without the loss of alignment measurements.
摘要翻译：用于扫描探针显微镜的探针对准工具（10）利用附接的中继光学器件来观察扫描探针显微镜探针尖端（40）并将其图像对准在光学显微镜（36）的视场的中心。光学显微镜电动级（50）和（60）的调整以及扫描探针显微镜级（44），（46）和（58）的调整允许确定从视场中心到探头的路径和距离尖端（40）。从这样的判断可以精确而准确地将扫描探针显微镜检查的目标区域定位在探针尖端（40）的下方。在原子力显微镜单元（42）中更换扫描探针显微镜探针尖端（40）可以在不损失对准测量的情况下实现。

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