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1. 发明授权

US11630124B2 Device and method for operating a bending beam in a closed control loop 有权
公开(公告)号：US11630124B2
公开(公告)日：2023-04-18
申请号：US17400349
申请日：2021-08-12
申请人： Carl Zeiss SMT GmbH
发明人： Christof Baur , Florian Demski
IPC分类号： G01Q30/04 , G01Q10/06
摘要： The present invention relates to a device for operating at least one bending beam in at least one closed control loop, wherein the device has: (a) at least one first interface designed to receive at least one controlled variable of the at least one control loop; (b) at least one programmable logic circuit designed to process a control error of the at least one control loop using a bit depth greater than the bit depth of the controlled variable; and (c) at least one second interface designed to provide a manipulated variable of the at least one control loop.

2. 发明申请

US20230003762A1 DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HETERO-GENITY AND PURITY QUANTIFICATION OF EXTRACELLULAR VESICLES 有权
公开(公告)号：US20230003762A1
公开(公告)日：2023-01-05
申请号：US17887532
申请日：2022-08-15
申请人： Lua Optomekatronik ARGE A.S.
发明人： Tayfun Tatar , Onur Samet Yildirim
IPC分类号： G01Q30/02 , G01N33/68 , G01Q30/04 , G01N21/65 , G06T7/00 , G06T7/60
摘要： An extracellular vesicle characterization and analysis device in terms of their size, phenotype, and cargo content is provided. A method performed with the device to quantify the heterogeneity of extracellular vesicle samples both in terms of size and cargo content and further quantify the purity of extracellular vesicles based on their phenotype and cargo content is further provided. The extracellular vesicle characterization and analysis device includes an atomic force microscope and confocal Raman spectrometer subsystems that will present the phenotypic characterization and cargo analysis of extracellular vesicles, respectively. By processing the topographic images obtained by atomic force microscopy with image processing methods and analyzing them, the dimensional heterogeneity of the extracellular vesicle samples can be quantified and information about their purity can be presented. The confocal Raman spectrometer applies the tip-enhanced Raman spectrum method, performs a heterogeneity quantification and provides data on the purity of the sample.

3. 发明授权

US11524102B2 System for tailoring dialysis treatment based on sensed potassium concentration, patient data, and population data 有权
公开(公告)号：US11524102B2
公开(公告)日：2022-12-13
申请号：US16521159
申请日：2019-07-24
申请人： Fresenius Medical Care Holdings, Inc.
发明人： Stephen Merchant , Roland Levin , Chris Chau , Shakil Aslam
IPC分类号： A61M1/16 , A61M1/34 , A61M1/36 , G01N27/333 , G06F3/14 , G01Q30/04 , G01N33/00 , G01N21/31 , G01J1/00 , G01N21/62 , G01N21/63 , G01N21/64 , G01N21/77 , A61B5/00 , A61B5/02 , G01N21/33 , A61B5/024 , A61B5/0205
摘要： A dialysis system is provided that includes a dialysis machine and a potassium sensing device that is configured to measure the concentration of potassium in the patient's blood, in spent dialysate resulting from treating the patient, or in both. The potassium sensing device can be configured to generate a sensed value of the concentration of potassium. A control and computing unit, including a processor and a memory, is configured to receive the sensed value, compare the value with one or more values stored in the memory, and generate a control signal based on the comparison. A potassium infusion circuit uses the control signal to infuse supplemental potassium solution into the treatment dialysate, a replacement fluid, or both. The memory can include stored patient-historical and population data.

4. 发明申请

US20220130033A1 AUTOMATED ATOMIC SCALE FABRICATION 有权
公开(公告)号：US20220130033A1
公开(公告)日：2022-04-28
申请号：US17429443
申请日：2020-02-14
申请人： Quantum Silicon Inc.
发明人： Mohammad Rashidi , Jeremiah Croshaw , Robert Wolkow
IPC分类号： G06T7/00 , G01Q30/04
摘要： A method for autonomously applying a dangling bond pattern to a substrate for atom scale device fabrication includes inputting the pattern, initiating a patterning process, scanning the substrate using a scanning probe microscope (SPM) to generate an SPM image of the substrate, feeding the SPM image into a trained convolution neural network (CNN), analyzing the SPM image using the CNN to identify substrate defects, determining a defect free substrate area for pattern application; and applying the pattern to the substrate in that area. An atom scale electronic component includes functional patches on a substrate and wires electrically connecting the functional patches. Training a CNN includes recording a Scanning Tunneling Microscope (STM) image of the substrate, extracting images of defects from the STM image, labeling pixel-wise the defect images, and feeding the extracted and labeled images of defects into a CNN to train the CNN for semantic segmentation.

5. 发明授权

US11307220B2 Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) 有权
公开(公告)号：US11307220B2
公开(公告)日：2022-04-19
申请号：US17234185
申请日：2021-04-19
申请人： BRUKER NANO, INC.
发明人： Sergey Osechinskiy , Anthonius Ruiter , Bede Pittenger , Syed-Asif Syed-Amanulla
IPC分类号： G01Q60/38 , G01Q10/04 , G01Q20/04 , G01Q30/04 , B82Y35/00
摘要： An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

6. 发明申请

US20210333305A1 Method and System for Analyzing Spatial Resolution of Microwave Near-field Probe and Microwave Microscope Equipped with the System 有权
公开(公告)号：US20210333305A1
公开(公告)日：2021-10-28
申请号：US17227518
申请日：2021-04-12
申请人： Xidian University
发明人： Xiaolong Chen , Jia Sun , Kai Yang , Zhimin Liu
IPC分类号： G01Q60/22 , G01Q30/04
摘要： The present disclosure relates to the technical field of microwave test, and discloses a method and a system for analyzing the spatial resolution of a microwave near-field probe and a microwave microscope equipped with the system, wherein in the method for analyzing the spatial resolution of the microwave near-field probe, a three-dimensional equipotential surface in a sample is drawn by using an electric field formula calculated by a quasi-static theory; an equivalent model of a probe sample is established by using finite element analysis software, so as to change material characteristics in the area outside the three-dimensional equipotential surface; by observing the influence of changing materials on the potential distribution in the sample, a near-field action range of the probe is determined, and the spatial resolution of the microwave near-field scanning microscope is analyzed and calculated.

7. 发明申请

US20210231704A1 Battery Electrode Analysis Method 有权
公开(公告)号：US20210231704A1
公开(公告)日：2021-07-29
申请号：US15734784
申请日：2019-10-15
申请人： LG Chem, Ltd.
发明人： Byung Hee Choi , Byung Joon Chae , Jung Hoon Han , Ji Yeon Byeon
IPC分类号： G01Q30/04 , H01M4/13 , H01M10/42 , G01Q30/20 , G06T5/50 , G06T7/00
摘要： The present disclosure relates to a method for analyzing an electrode for a battery, which has the advantage of being capable of more easily distinguishing between the constituent materials of the electrode such as the electrode active material, the conductive material, and the pores, by using scanning spreading resistance microscopy.

8. 发明申请

US20210190818A1 Measuring Device for a Scanning Probe Microscope and Method for Scanning Probe Microscopic Examination of a Measurement Sample with a Scanning Probe Microscope 有权
公开(公告)号：US20210190818A1
公开(公告)日：2021-06-24
申请号：US16952579
申请日：2020-11-19
申请人： Bruker Nano GmbH
发明人： Wolfgang Dobler , Danilo Nitsche , Frederik Büchau-Vender
IPC分类号： G01Q10/06 , G01Q30/04
摘要： The invention relates to a measuring device for a scanning probe microscope that comprises the following: a sample receptacle which is configured to receive a measurement sample to be examined; a measuring probe which is arranged on a probe holder and has a probe tip with which the measurement sample can be measured; a displacement device which is configured to move the measuring probe and the sample receptacle relative to each other, in order to measure the measurement sample, such that the measuring probe, in order to measure the measurement sample, executes a raster movement relative to said measurement sample in at least one spatial direction; a control device which is connected to the displacement device and controls the relative movement between the measuring probe and the sample receptacle; and a sensor device that is configured to detect movement measurement signals for an actual movement of the measuring probe and/or of the sample receptacle that is executed during the relative movement between the measuring probe and the sample receptacle in order to measure the measurement sample, and to relay the movement measurement signals to the control device, the movement measurement signals indicating a first movement component in a first spatial direction that disrupts the raster movement and a second movement component in a second spatial direction that disrupts the raster movement, which second spatial direction extends transversely to the first spatial direction. The control device is configured to control the relative movement between the measuring probe and the sample receptacle in such a way that the displacement device is acted upon by the control device with compensating control signal components which cause a first countermovement which substantially compensates for the first disruptive movement component in the first spatial direction, and/or cause a second countermovement which substantially compensates for the second disruptive movement component in the second spatial direction. Furthermore, a scanning probe microscope comprising the measuring device and a method for scanning probe microscopic examination of a measurement sample by means of a scanning probe microscope are provided.

9. 发明申请

US20210080484A1 Methods And Systems For Scanning Probe Sample Property Measurement And Imaging 有权
公开(公告)号：US20210080484A1
公开(公告)日：2021-03-18
申请号：US17105475
申请日：2020-11-25
申请人： The Regents of the University of Colorado, a body corporate
发明人： Rafael Piestun , Simon Labouesse , Markus B. Raschke , Eric Muller , Samuel Johnson
IPC分类号： G01Q60/22 , G01Q60/06 , G01Q10/06 , G01Q30/04 , G01J3/44 , G01J3/45 , G01J3/10 , G01J3/02 , G01J3/28
摘要： Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.

10. 发明授权

US10712363B2 Scanning probe microscope 有权
公开(公告)号：US10712363B2
公开(公告)日：2020-07-14
申请号：US16257226
申请日：2019-01-25
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Masayuki Iwasa , Yoshiteru Shikakura , Shinya Kudo , Toshihiro Ueno
IPC分类号： G01Q20/02 , G01Q30/06 , G06T5/50 , G06T7/12 , G01Q60/36 , G01Q30/04
摘要： Provided is a scanning probe microscope with which measurement data and a distribution image of differential data of the measurement data can be displayed selectively or together, an edge enhancement image can be obtained, and user convenience is improved. A scanning probe microscope (200) includes: a distribution image calculator (40a) configured to calculate a one-dimensional or two-dimensional first distribution image (201) of measurement data, and a one-dimensional or two-dimensional second distribution image (202) of differential data of adjacent data elements of the measurement data; and a display controller (40b) configured to instruct the distribution image calculator to calculate at least one of the first distribution image or the second distribution image, and to display the calculated distribution image on a predetermined display.

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