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    • 5. 发明申请
    • PASSIVE DETECTORS FOR IMAGING SYSTEMS
    • 成像系统被动探测器
    • US20170023414A1
    • 2017-01-26
    • US15099440
    • 2016-04-14
    • DIGITAL DIRECT IR, INC.
    • Peter N. Kaufman
    • G01J5/40G01J5/34G01J5/06G01J5/20
    • G01J5/40G01J1/44G01J5/0225G01J5/023G01J5/046G01J5/06G01J5/0806G01J5/10G01J5/20G01J5/34G01J5/44G01J2005/0077G01J2005/065
    • Passive detector structures for imaging systems are provided, which are based on a coefficient of thermal expansion (CTE) framework. With such framework, a CTE-based passive detector structure includes a detector member that is configured to expand or contract in response to thermal heating resulting from photon exposure. The expanding/contracting CTE detector structure is configured to exert mechanical forces on resistor and/or capacitor circuit elements, which are part of an oscillator circuit, to vary the resistance and capacitance of such circuit elements and change a frequency or period of oscillation of an output signal of the oscillator circuit. The change in the frequency or period of oscillation of the output signal of the oscillator circuit is utilized to determine an amount of photon exposure of the CTE-based detector.
    • 提供了用于成像系统的被动检测器结构,其基于热膨胀系数(CTE)框架。 利用这种框架,基于CTE的被动检测器结构包括检测器构件,其被配置为响应于由光子暴露引起的热加热而膨胀或收缩。 扩展/收缩CTE检测器结构被配置为对作为振荡器电路的一部分的电阻器和/或电容器电路元件施加机械力,以改变这种电路元件的电阻和电容,并且改变振荡的频率或振荡周期 振荡电路的输出信号。 振荡器电路的输出信号的频率或振荡周期的变化用于确定基于CTE的检测器的光子曝光量。