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    • 9. 发明授权
    • Optical characteristic measuring apparatus
    • 光学特性测量仪器
    • US08982345B2
    • 2015-03-17
    • US14003201
    • 2012-03-08
    • Etsuo KawateMiroslav Hain
    • Etsuo KawateMiroslav Hain
    • G01N21/49G01N21/47G01N21/59G02B19/00
    • G01N21/4738G01N21/474G01N21/59G01N2021/4714G01N2201/0637G02B19/0023G02B19/0085
    • In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1. By disposing, on a position of a focal point of the partial ellipsoidal mirror, a hemispherical detection optical system having a hemispherical lens or a rotational parabolic mirror, light scattered by an object, reflected by the partial ellipsoidal mirror, and focused on the point is photographed by for example a CCD camera 6 via a hemispherical lens and a taper fiber 5 so as to measure an optical characteristic of the object.
    • 在用于测量样品的光学特性的装置中,本发明的一个目的是提供一种能够测量半球形全反射率,半球形全透射率和光分布的装置,并且实现测量时间的减少和改进 精确定量分析了半球全反射率(透射率)。 在双椭圆光学系统中,两个椭圆面镜的一个焦点被定位为公共焦点并且三个焦点以直线对准的光学系统,双椭圆体光学系统由部分椭圆体 镜子2,例如四分之一椭圆镜和带状椭圆面镜1.通过在半椭球镜的焦点的位置上设置半球形检测光学系统,该半球形检测光学系统具有半球形透镜或旋转抛物面镜, 通过半球形透镜和锥形光纤5,通过例如CCD照相机6拍摄被物体散射的物体,被部分椭球镜反射并聚焦在该点上的光,以测量物体的光学特性。
    • 10. 发明申请
    • DEVICE FOR THE CONTACTLESS AND NONDESTRUCTIVE TESTING OF SURFACES
    • 表面接触和非结合试验装置
    • US20140252232A1
    • 2014-09-11
    • US14280999
    • 2014-05-19
    • WINTERTHUR INSTRUMENTS AG
    • Nils REINKEAndor BARISKA
    • G01N21/84
    • G01N21/84G01N21/55G01N25/72G02B19/0028G02B19/0085G02B19/009
    • A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1). Furthermore, an imaging device (10, 12) is provided on the detection axis (9) for creating an image of the testing area (7) on the measuring area of the detector (14) that is arranged between the radiation sources (1).
    • 用于通过测量其红外辐射来对表面进行非接触和非破坏性测试的装置具有一个或多个非相干电磁辐射源(1)和布置在检测轴(9)上的检测器(14),其中辐射源(1) 在与测试区域(7)相距一定距离处与检测轴线(9)径向距离设置。 在这种布置中,可以通过这些辐射源(1)产生脉冲或强度调制的激发辐射(2)并将其施加到在测试区域(7)中以检测轴线倾斜的待测试的表面(6) (9)在测试区域(7)。 由待测试表面(6)的测量区域(8)发射的检测辐射可以被馈送到检测器(14),其中检测器(14)被布置在检测轴(9)上,从而远离 测试区域(7)比辐射源(1)。 此外,在检测轴(9)上设置成像装置(10,12),用于在检测器(14)的测量区域上形成测试区域(7)的图像,该测量区域布置在辐射源(1) 。