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    • 7. 发明授权
    • Method and system for photolithographic fabrication with resolution far below the diffraction limit
    • 分辨率远低于衍射极限的光刻制造方法和系统
    • US08432533B2
    • 2013-04-30
    • US12652410
    • 2010-01-05
    • John T. FourkasErez H. GershgorenLinjie LiHana Hwang
    • John T. FourkasErez H. GershgorenLinjie LiHana Hwang
    • G03B27/72G03F7/00
    • G03B27/72G03F7/2022G03F7/2053G03F7/70375
    • A method and system for photolithography is provided. The system includes a photoresist comprising a photoinitiator and a prepolymer resin. The system further includes a first light source operable to generate at least a first beam of light which is focused on a first area of the photoresist. The first beam of light is configured to excite the photoinitiator. The system further includes a second light source operable to generate at least a second beam of light which is focused on a second area of the photoresist, the second beam of light configured to deactivate at least temporarily the photoinitiator excited by the first beam of light. The first area and second area overlap at least partially. A time difference of at least 10 ns exists between the photoinitiator being excited by the first beam of light and the photoinitiator initiating polymerization.
    • 提供了一种用于光刻的方法和系统。 该系统包括包含光引发剂和预聚物树脂的光致抗蚀剂。 该系统还包括第一光源,其可操作以产生聚焦在光致抗蚀剂的第一区域上的至少第一光束。 第一光束被配置为激发光引发剂。 该系统还包括第二光源,其可操作以产生聚焦在光致抗蚀剂的第二区域上的至少第二光束,第二光束被配置为至少暂时停用由第一光束激发的光引发剂。 第一区域和第二区域至少部分重叠。 在由第一光束激发的光引发剂和光引发剂引发聚合之间存在至少10ns的时间差。
    • 8. 发明授权
    • Device, method, and system for measuring image profiles produced by an optical lithography system
    • 用于测量由光学光刻系统产生的图像轮廓的装置,方法和系统
    • US08432530B2
    • 2013-04-30
    • US12177845
    • 2008-07-22
    • Yasuyuki Unno
    • Yasuyuki Unno
    • G03B27/42
    • G03B27/72G03F7/70566G03F7/70666G03F7/7085
    • Measuring an aerial image with an aerial image measuring device having a light detector and a light blocking layer for separating polarization components of light incident thereon. The light blocking layer has first and second apertures structured differently from each other, wherein the different structures transmit at least one of the polarization components differently. The detector provides separate samples for light transmitted through the first and second apertures. Separate image profiles for each polarization component of the aerial image are generated using the samples provided by the detector. Image recovery for each of the generated image profiles is performed to generate estimated image profiles for each polarization component of the aerial image that exclude the effects of transmission through the first and second apertures of the aerial image measuring device.
    • 用具有光检测器和遮光层的空间图像测量装置测量空间图像,用于分离入射在其上的光的偏振分量。 遮光层具有彼此不同的结构的第一和第二孔,其中不同的结构不同地透射至少一个偏振分量。 检测器为透过第一和第二孔的光提供分开的样品。 使用由检测器提供的样本来生成空间图像的每个偏振分量的分离图像。 执行每个所生成的图像轮廓的图像恢复,以生成空中图像的每个偏振分量的估计图像轮廓,排除通过空间图像测量装置的第一和第二孔的传输的影响。
    • 10. 发明授权
    • Illumination optical system, exposure apparatus using the same and device manufacturing method
    • 照明光学系统,使用相同的曝光装置和装置制造方法
    • US08149386B2
    • 2012-04-03
    • US12390315
    • 2009-02-20
    • Kazuhiko Kajiyama
    • Kazuhiko Kajiyama
    • G03B27/70
    • G03B27/72G03F7/70075
    • An illumination optical system includes a pair of fly-eye mirrors configured to receive light from a light source, a first condenser configured to condense light from the pair of fly-eye mirrors, a reflection type integrator configured to receive light from the first condenser, the reflection type integrator including a plurality of cylindrical reflective surfaces having parallel generating line directions, an aperture stop arranged perpendicular to the generating line direction, and a second condenser configured to superpose on an illuminated surface luminous fluxes from a plurality of cylindrical reflective surfaces of the reflection type integrator.
    • 一种照明光学系统,包括配置成从光源接收光的一对飞眼镜,被配置为使来自该一对飞眼镜的光聚光的第一聚光镜,被配置为接收来自第一冷凝器的光的反射型积分器, 所述反射型积分器包括具有平行的生成线方向的多个圆柱形反射表面,垂直于所述生成线方向布置的孔径光阑;以及第二聚光器,被配置为在照射表面上叠加来自所述发光线方向的多个圆柱形反射表面的光通量 反射型积分器。