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    • 5. 发明授权
    • Timed multiplex sensing
    • 定时复用传感
    • US09196373B2
    • 2015-11-24
    • US14191130
    • 2014-02-26
    • SANDISK 3D LLC
    • Anurag NigamGopinath Balakrishnan
    • G11C13/00G11C16/26G11C16/04G11C11/56
    • G11C7/08G11C11/5614G11C11/5678G11C11/5685G11C13/0004G11C13/0007G11C13/0011G11C13/004G11C13/0069G11C16/0483G11C16/26G11C2211/563G11C2213/31G11C2213/32G11C2213/71G11C2213/75
    • Methods for determining memory cell states during a read operation using a detection scheme that reduces the area of detection circuitry for detecting the states of the memory cells by time multiplexing the use of portions of the detection circuitry are described. The read operation may include a precharge phase, a sensing phase, and a detection phase. In some embodiments, a first bit line and a second bit line may be precharged to a read voltage in parallel, and then sensing and/or detection of selected memory cells corresponding with the first bit line and the second bit line may be performed serially using the same detection circuitry by time multiplexing the use of the detection circuitry. In some cases, the time multiplexed detection circuitry may be used for detecting two or more states corresponding with two or more memory cells being sensed during a read operation.
    • 描述了使用检测方案来确定存储单元状态的方法,所述检测方案通过时间多路复用检测电路的部分来减少用于检测存储器单元的状态的检测电路的面积。 读取操作可以包括预充电阶段,感测阶段和检测阶段。 在一些实施例中,第一位线和第二位线可以并行地预充电到读取电压,然后可以串行地使用对应于第一位线和第二位线的所选存储单元的感测和/或检测 相同的检测电路通过对检测电路的使用进行时间复用。 在一些情况下,时间复用检测电路可以用于检测在读操作期间被感测到的两个或多个存储器单元相对应的两个或多个状态。
    • 6. 发明申请
    • TIMED MULTIPLEX SENSING
    • 定时多传感器
    • US20150243362A1
    • 2015-08-27
    • US14191130
    • 2014-02-26
    • SANDISK 3D LLC
    • Anurag NigamGopinath Balakrishnan
    • G11C16/26G11C16/04
    • G11C7/08G11C11/5614G11C11/5678G11C11/5685G11C13/0004G11C13/0007G11C13/0011G11C13/004G11C13/0069G11C16/0483G11C16/26G11C2211/563G11C2213/31G11C2213/32G11C2213/71G11C2213/75
    • Methods for determining memory cell states during a read operation using a detection scheme that reduces the area of detection circuitry for detecting the states of the memory cells by time multiplexing the use of portions of the detection circuitry are described. The read operation may include a precharge phase, a sensing phase, and a detection phase. In some embodiments, a first bit line and a second bit line may be precharged to a read voltage in parallel, and then sensing and/or detection of selected memory cells corresponding with the first bit line and the second bit line may be performed serially using the same detection circuitry by time multiplexing the use of the detection circuitry. In some cases, the time multiplexed detection circuitry may be used for detecting two or more states corresponding with two or more memory cells being sensed during a read operation.
    • 描述了使用检测方案来确定存储单元状态的方法,所述检测方案通过时间多路复用检测电路的部分来减少用于检测存储器单元的状态的检测电路的面积。 读取操作可以包括预充电阶段,感测阶段和检测阶段。 在一些实施例中,第一位线和第二位线可以并行地预充电到读取电压,然后可以串行地使用对应于第一位线和第二位线的所选存储单元的感测和/或检测 相同的检测电路通过对检测电路的使用进行时间复用。 在一些情况下,时间复用检测电路可以用于检测在读操作期间被感测到的两个或多个存储器单元相对应的两个或多个状态。