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序号 专利名 申请号 申请日 公开(公告)号 公开(公告)日 发明人
161 Multiple transistor dynamic random access memory array architecture with simultaneous refresh of multiple memory cells during a read operation EP98303663.3 1998-05-11 EP0878804A2 1998-11-18 Artiere, Alain

A four transistor dynamic memory cell architecture and refresh technique which allows for cell refresh to occur during a read operation. The access and memory transistors of the individual memory cells are fabricated with a relative width-to-length ratio such that it is sufficient to merely activate the associated word line to perform the refresh operation. This is accomplished without activating the read sense amplifier resulting in lower power consumption and the retention of most recently read data. Multiple word lines may be activated concurrently utilizing the technique disclosed to further reduce the refresh rate overhead in a memory array and increase the overall memory array bandwidth.

162 HIGH-DENSITY SEMICONDUCTOR MEMORY DEVICE EP84305994 1984-08-31 EP0139428A3 1986-12-30 HORIGUCHI, FUMIO C/O PATENT DIVISION
163 BIPOLAR DYNAMIC MEMORY CELL EP78101635 1978-12-09 EP0003030A3 1979-08-22 EL-KAREH, BADIH; GERSBACH, EDWIN JOHN; HOUGHTON, JAMES RUSSELL
164 Halbleitereinrichtung DE19655033 1996-05-22 DE19655033B9 2012-06-14 OOISHI TSUKASA; KAWAGOE TOMOYA; HIDAKA HIDETO; ASAKURA MIKIO
Halbleitereinrichtung zum Durchführen eines vorgeschriebenen Betriebs synchron mit einem Taktsignal mit einem Oszillator (7) zum Erzeugen des Taktsignals, bei dem die Oszillationsfrequenz geändert werden kann, und einem Einstellmittel (10–13) zum Ändern und Einstellen der Oszillationsfrequenz des Oszillators (7), bei der der Oszillator (75) eine Mehrzahl von Invertern (73.1–73.K), die in einer Ringform verbunden sind, einen ersten Transistor (72.1–72.K), der entsprechend zu jedem der Inverter (73.1–73.K) vorgesehen ist und zwischen einem Versorgungsknoten des entsprechenden Inverters (73.1–73.K) und einer Potentialversorgungsleitung geschaltet ist und einen zweiten Transistor (74.1–74.K), der entsprechend zu jedem der Inverter (73.1–73.K) vorgesehen ist und zwischen einem Erdungsknoten des entsprechenden Inverters (73.1–73.K) und einer Erdungsleitung geschaltet ist, enthält und das Einstellmittel (10–13, 60) die Eingabespannung des ersten und des zweiten Transistors ändert und einstellt, wobei das Einstellmittel (10–13, 60) eine Konstantstromquelle (61) zum...
165 AT01962382 2001-08-14 AT484831T 2010-10-15 KEETH BRENT; SHIRLEY BRIAN; RYAN KEVIN; DENNISON CHARLES
A method and system for refreshing a dynamic random access memory ("DRAM") (40) includes a pair of memory arrays for each of a plurality of banks. The DRAM (40) includes the usual addressing and data path circuitry, as well as a refresh controller (70) that refreshes the arrays in a manner that hides refreshes sufficiently that the DRAM (40) can be used in place of an SRAM as a cache memory (236). Since only one of the arrays in each bank is refreshed at a time, the refresh controller (70) is able to allow data to be written to the array that is not being refreshed. The refresh controller (70) then causes the write data to be temporarily stored so that it can be written to the array of the refresh of the array has been completed. If neither array is being refreshed, the data are written to both arrays. Data are read from the arrays by first checking to determine if any of the arrays is being refreshed. If so, data are read from the array that is not being refreshed.
166 DE10214707 2002-04-03 DE10214707B4 2009-12-31 CHOI JOO-SUN
In accordance with an embodiment of the present invention, a semiconductor memory includes first and second banks of memory cells configured such that in a refresh cycle no operation is performed in one of the first and second banks while a content of each of a predesignated number of cells in the other one of the first and second banks is being refreshed. In one embodiment, in two consecutive refresh cycles a content of each of an equal number of cells in each of the first and second banks are refreshed, and during one of the two refresh cycles no operation is performed in the first bank, and during the other one of the two refresh cycles no operation is performed in the second bank.
167 DE602004015226 2004-10-29 DE602004015226D1 2008-09-04 KOBAYASHI HIROYUKI; KANDA TATSUYA
168 DE60033873 2000-01-07 DE60033873T2 2007-12-20 CHOI JONG-HYUN; SEO DONG-IL; NA JONG-SIK
A dynamic random access memory (DRAM) includes a plurality of row decoders (203) for selecting word lines of the memory cells of the memory banks (201), an address generator (209) for generating internal addresses (FRA) which sequentially vary during a self-refresh mode, a refresh bank designating circuit (207) for generating refresh bank designating signals (PRFH) for designating a memory bank (201) to be refreshed, and a bank selection decoder (213) for designating one or more memory banks (201) to be refreshed by the refresh bank designating signals (PREF) and supplying refresh addresses (DRA) to the row decoders (203) corresponding to the designated memory banks (201) according to the information of the internal addresses. The self-refresh operation is performed only with respect to selected memory banks or memory banks in which data is stored, thereby minimizing power consumption.
169 DE60314948 2003-02-26 DE60314948T2 2007-10-31 IKEDA HITOSHI
A semiconductor memory that shortens refresh operation time. A REF-ACT comparison circuit for addresses compares a refresh request signal srtz and an active request signal atdpz and immediately outputs a refresh address import signal ialz to a row-add latch circuit in the case of the refresh request signal srtz having been input prior to the active request signal atdpz. A REF-ACT comparison circuit for commands compares a delayed refresh request signal srtdz obtained by delaying the refresh request signal srtz and the active request signal atdpz, outputs a refresh execution request signal refpz in the case of the delayed refresh request signal srtdz having been input prior to the active request signal atdpz, and outputs an active execution request signal actpz in the case of the active request signal atdpz having been input prior to the delayed refresh request signal srtdz.
170 DE60314948 2003-02-26 DE60314948D1 2007-08-30 IKEDA HITOSHI
A semiconductor memory that shortens refresh operation time. A REF-ACT comparison circuit for addresses compares a refresh request signal srtz and an active request signal atdpz and immediately outputs a refresh address import signal ialz to a row-add latch circuit in the case of the refresh request signal srtz having been input prior to the active request signal atdpz. A REF-ACT comparison circuit for commands compares a delayed refresh request signal srtdz obtained by delaying the refresh request signal srtz and the active request signal atdpz, outputs a refresh execution request signal refpz in the case of the delayed refresh request signal srtdz having been input prior to the active request signal atdpz, and outputs an active execution request signal actpz in the case of the active request signal atdpz having been input prior to the delayed refresh request signal srtdz.
171 DE60213560 2002-11-18 DE60213560D1 2006-09-14 FUJIOKA SHINYA; OKUYAMA YOSHIAKI
A semiconductor memory comprising: a memory cell array having memory cells; a first burst control circuit for outputting a predetermined number of strobe signals corresponding to an access command for successively burst accessing said memory cell array; and a data input/output circuit for successively inputting/outputting data to be transferred to/from said memory cell array in synchronization with each of said strobe signals, wherein said first burst control circuit comprises: a level detecting circuit for detecting that one of command signals supplied as said access command turns to its active level; and an output control circuit for starting outputting said strobe signals after measuring a predetermined time from the detection of said level detecting circuit.
172 DE60303045 2003-08-26 DE60303045T2 2006-08-03 JAIN RAJ KUMAR
173 DE102004031451 2004-06-29 DE102004031451A1 2005-06-23 KIM KWAN-WEON
A semiconductor device for use in a semiconductor memory device for pumping a supplying voltage according to a data access mode and an auto-refresh mode, including: a voltage level detecting means for generating a voltage level detect signal by detecting a voltage level of the supplying voltage; an auto-refresh signal detecting means for generating an auto-refresh detect signal in response to an auto-refresh signal; and a voltage pumping means for pumping the supplying voltage in response to the voltage level detect signal at the data access mode or in response to the auto-refresh detect signal at the auto-refresh mode.
174 DE19604764 1996-02-09 DE19604764B4 2004-07-08 NAGASE KOUICHI
A disturb mode control circuit designates a disturb mode for activating an internal cycle setting circuit in response to a predetermined state of an address signal at a terminal when a disturb mode designating signal applied from a control circuit is active. The activated internal cycle setting circuit continuously issues a clock signal having a predetermined period to the control circuit. In accordance with the mode detection signal applied from the disturb mode control circuit and the clock signal applied from the internal cycle setting circuit, the control circuit successively generates an internal address signal in synchronization with the clock signal applied from an internal address generating circuit for selecting the word line in a memory cell array.
175 DE10323458 2003-05-23 DE10323458A1 2004-04-15 KIMURA MASATOSHI
A DMA control circuit controls DMA transfer between a flash memory and a main memory. An S/P bus conversion circuit converts serial data output from the flash memory into parallel data and outputs the parallel data to the main memory. This eliminates the need for the CPU downloading file data from the flash memory to the main memory, allowing connection of a non-volatile memory with a large capacity, without reduction in the processing speed of the system.
176 DE19740223 1997-09-12 DE19740223C2 2003-11-13 ANDREWARTHA J MICHAEL
A method and system for preserving the state of memory while a memory subsystem is scan tested. In certain situations, it is desirable to scan test a memory subsystem. Scan testing is accomplished by causing the registers in a memory controller to form at least one ring. Then, register values are shifted through the ring and analyzed. Clocks within the memory controller must be stopped before scan testing can be conducted. Accordingly, the memory controller is unable to provide refresh requests to the memory during testing. Therefore, the memory controller places the memory in a self-refresh mode during scanning. While in the self-refresh mode, the memory automatically refreshes itself but does not respond to read or write requests. Once scanning is completed, the memory controller takes the memory out of self-refresh mode.
177 DE60005645 2000-04-20 DE60005645D1 2003-11-06 HIDAKA HIDETO
A power supply circuit (22c) generating a power supply voltage for refresh-related circuitry (14a) and a power supply circuit (22b) for column-related/peripheral control circuitry (14b) are controlled by a power supply control circuit (25) to be put in different power supply voltage supplying states in a self refresh mode. In the self refresh mode, only self refresh-related circuitry receives a power supply voltage to perform refresh operation. A reduced current consumption can be achieved in the self refresh mode while fast access operation is not deteriorated.
178 DE60003628 2000-04-20 DE60003628D1 2003-08-07 HIDAKA HIDETO
A power supply circuit (22c) generating a power supply voltage for refresh-related circuitry (14a) and a power supply circuit (22b) for column-related/peripheral control circuitry (14b) are controlled by a power supply control circuit (25) to be put in different power supply voltage supplying states in a self refresh mode. In the self refresh mode, only self refresh-related circuitry receives a power supply voltage to perform refresh operation. A reduced current consumption can be achieved in the self refresh mode while fast access operation is not deteriorated.
179 DE69621419 1996-06-27 DE69621419D1 2002-07-04 MOTE RANDALL
An improved method of accessing dynamic random access memory (DRAM) banks during refresh cycles contemplates sequentially accessing DRAM banks which do not share common filtering capacitors. In this manner, voltage drops caused by refresh accesses are not observed in consecutive clock cycles at the same filtering capacitors so that the filtering capacitors will have sufficient recovery time to restore the supply voltage to the original voltage level before another refresh hit occurs at the same capacitor. In this manner, significant voltage drops are alleviated at the voltage supply inputs to the DRAM banks.
180 DE69331940 1993-10-01 DE69331940D1 2002-06-20 PARK CHUROO; JANG HYUN-SOON; KIM CHULL-SOO; KIM MYUNG-HO; LEE SEUNG-HUN; LEE SI-YEOL; LEE HO-CHEOL; KIM TAE-JIN; CHOI YUN-HO